TL431BIDBZR - NATIONAL SEMICONDUCTOR

SCANSTA111

SCANSTA111 Enhanced SCAN Bridge Multidrop Addressable IEEE 1149.1 (JTAG)

Port

Literature Number: SNLS060J

SCANSTA111

February 25, 2010

Enhanced SCAN Bridge

Multidrop Addressable IEEE 1149.1 (JTAG) Port

General Description

The SCANSTA111 extends the IEEE Std. 1149.1 test bus into

a multidrop test bus environment. The advantage of a mul-

tidrop approach over a single serial scan chain is improved

test throughput and the ability to remove a board from the

system and retain test access to the remaining modules. Each

SCANSTA111 supports up to 3 local IEEE 1149.1 scan rings

which can be accessed individually or combined serially. Ad-

dressing is accomplished by loading the instruction register

with a value matching that of the Slot inputs. Backplane and

inter-board testing can easily be accomplished by parking the

local TAP Controllers in one of the stable TAP Controller

states via a Park instruction. The 32-bit TCK counter enables

built in self test operations to be performed on one port while

other scan chains are simultaneously tested.

Features

■True IEEE 1149.1 hierarchical and multidrop addressable

capability

■The 7 slot inputs support up to 121 unique addresses, an

Interrogation Address, Broadcast Address, and 4 Multi-

cast Group Addresses (address 000000 is reserved)

■3 IEEE 1149.1-compatible configurable local scan ports

■Mode Register0 allows local TAPs to be bypassed,

selected for insertion into the scan chain individually, or

serially in groups of two or three

■Transparent Mode can be enabled with a single instruction

to conveniently buffer the backplane IEEE 1149.1 pins to

those on a single local scan port

■LSP ACTIVE outputs provide local port enable signals for

analog busses supporting IEEE 1149.4.

■General purpose local port Pass-through bits are useful

for delivering write pulses for FPGA programming or

monitoring device status.

■Known Power-up state

■TRST on all local scan ports

■32-bit TCK counter

■16-bit LFSR Signature Compactor

■Local TAPs can become TRI-STATE via the OE input to

allow an alternate test master to take control of the local

TAPs (LSP0-2 have a TRI-STATE notification output)

■3.0-3.6V VCC Supply Operation

■Power-off high impedance inputs and outputs

■Supports live insertion/withdrawal

Connection Diagrams

10124502

10124516

SCANSTA111 Enhanced SCAN Bridge Multidrop Addressable IEEE 1149.1 (JTAG) Port

TABLE 1. Glossary

LFSR Linear Feedback Shift Register. When enabled, will generate a 16-bit signature of sampled serial test data.

LSP Local Scan Port. A four signal port that drives a local (i.e. non-backplane) scan chain. (e.g., TCK0, TMS0,

TDO0, TDI0).

Local Local is used to describe IEEE Std. 1149.1 compliant scan rings and the SCANSTA111 Test Access Port that

drives them. The term local was adopted from the system test architecture that the 'STA111 will most commonly

be used in; namely, a system test backplane with a 'STA111 on each card driving up to 3 local scan rings per

card. (Each card can contain multiple 'STA111s, with 3 local scan ports per 'STA111.)

Park/Unpark/Unparked Parked, unpark, and unparked, are used to describe the state of the LSP controller and the state of the local

TAP controllers (the local TAP controllers refers to the TAP controllers of the scan components that make up

a local scan ring). Park is also used to describe the action of parking a LSP (transitioning into one of the Parked

LSP controller states). It is important to understand that when a LSP controller is in one of the parked states,

TMSn is held constant, thereby holding or parking the local TAP controllers in a given state.

TAP Test Access Port as defined by IEEE Std. 1149.1.

Selected/Unselected Selected and Unselected refers to the state of the 'STA111 Selection Controller. A selected 'STA111 has been

properly addressed and is ready to receive Level 2 protocol. Unselected 'STA111s monitor the system test

backplane, but do not accept Level 2 protocol (except for the GOTOWAIT instruction). The data registers and

LSPs of unselected 'STA111s are not accessible from the system test master.

Active Scan Chain The Active Scan Chain refers to the scan chain configuration as seen by the test master at a given moment.

When a 'STA111 is selected with all of its LSPs parked, the active scan chain is the current scan register only.

When a LSP is unparked, the active scan chain becomes: TDIB → the current 'STA111 register → the local

scan ring registers → a PAD bit → TDOB. Refer to Table 7 for Unparked configurations of the LSP network.

Level 1 Protocol Level 1 is the protocol used to address a 'STA111.

Level 2 Protocol Level 2 is the protocol that is used once a 'STA111 is selected. Level 2 protocol is IEEE Std. 1149.1 compliant

when an individual 'STA111 is selected.

PAD A one bit register that is placed at the end of each local scan port scan-chain. The PAD bit eliminates the prop

delay that would be added by the 'STA111 LSPN logic between TDIn and TDO(n+1) or TDOB by buffering and

synchronizing the LSP TDI inputs to the falling edge of TCKB, thus allowing data to be scanned at higher

frequencies without violating setup and hold times.

LSB Least Significant Bit, the right-most position in a register (bit 0).

MSB Most Significant Bit, the left-most position in a register.

www.national.com 2

SCANSTA111

Architecture

Figure 1 shows the basic architecture of the 'STA111. The

device's major functional blocks are illustrated here. The TAP

Controller, a 16-state state machine, is the central control for

the device. The instruction register and various test data reg-

isters can be scanned to exercise the various functions of the

'STA111 (these registers behave as defined in IEEE Std.

1149.1). The 'STA111 selection controller provides the func-

tionality that allows the 1149.1 protocol to be used in a multi-

drop environment. It primarily compares the address input to

the slot identification and enables the 'STA111 for subsequent

scan operations. The Local Scan Port Network (LSPN) con-

tains multiplexing logic used to select different port configu-

rations. The LSPN control block contains the Local Scan Port

Controllers (LSPC) for each Local Scan Port (LSP0, LSP1 ...

LSPn). This control block receives input from the 'STA111 in-

struction register, mode registers, and the TAP controller.

Each local port contains all four boundary scan signals need-

ed to interface with the local TAPs plus the optional Test

Reset signal (TRST).

10124503

FIGURE 1. SCANSTA111 Block Diagram

3 www.national.com

SCANSTA111

TABLE 2. Pin Descriptions

Pin Name

Description

No.

Pins I/O

VCC 3 N/A Power

GND 3 N/A Ground

TMSB1 I BACKPLANE TEST MODE SELECT: Controls sequencing through the TAP Controller of the

'STA111. Also controls sequencing of the TAPs which are on the local scan chains. This input

has a 25KΩ pull-up resistor and no ESD clamp diode (ESD is controlled with an alternate method).

When the device is power-off (VDD floating), this input appears to be a capacitive load to ground

(Note 1). When VDD = 0V (i.e.; not floating but tied to VSS) this input appears to be a capacitive

load with the pull-up to ground.

TDIB1 I BACKPLANE TEST DATA INPUT: All backplane scan data is supplied to the 'STA111 through

this input pin. This input has a 25KΩ pull-up resistor and no ESD clamp diode (ESD is controlled

with an alternate method). When the device is power-off (VDD floating), this input appears to be

a capacitive load to ground (Note 1). When VDD = 0V (i.e.; not floating but tied to VSS) this input

appears to be a capacitive load with the pull-up to ground.

TDOB1 O BACKPLANE TEST DATA OUTPUT: This output drives test data from the 'STA111 and the local

TAPs, back toward the scan master controller. This output has 24mA of drive current. When the

device is power-off (VDD = 0V or floating), this output appears to be a capacitive load (Note 1).

TCKB1 I TEST CLOCK INPUT FROM THE BACKPLANE: This is the master clock signal that controls all

scan operations of the 'STA111 and of the local scan ports. This input has no pull-up resistor and

no ESD clamp diode (ESD is controlled with an alternate method). When the device is power-off

(VDD floating), this input appears to be a capacitive load to ground (Note 1). When VDD = 0V (i.e.;

not floating but tied to VSS) this input appears to be a capacitive load to ground.

TRSTB1 I TEST RESET: An asynchronous reset signal (active low) which initializes the 'STA111 logic. This

input has a 25KΩ pull-up resistor and no ESD clamp diode (ESD is controlled with an alternate

method). When the device is power-off (VDD floating), this input appears to be a capacitive load

to ground (Note 1). When VDD = 0V (i.e.; not floating but tied to VSS) this input appears to be a

capacitive load with the pull-up to ground.

TRIST(B,0-2) 4 O TRI-STATE NOTIFICATION OUTPUT: This signal is asserted high when the associated TDO is

TRI-STATEd. Associated means TRISTB is for TDOB, TRIST1 is for TDO1, etc. This output has

12mA of drive current.

AB1 I BACKPLANE PASS-THROUGH INPUT: A general purpose input which is driven to the Yn of a

single selected LSP. (Not available when multiple LSPs are selected). This input has an internal

pull-up resistor.

YB1 O BACKPLANE PASS-THROUGH OUTPUT: A general purpose output which is driven from the

An of a single selected LSP. (Not available when multiple LSPs are selected). This output has

24mA of drive current.

S(0-6) 7 I SLOT IDENTIFICATION: The configuration of these pins is used to identify (assign a unique

address to) each 'STA111 on the system backplane .

OE 1 I OUTPUT ENABLE for the Local Scan Ports, active low. When high, this active-low control signal

TRI-STATEs all local scan ports on the 'STA111, to enable an alternate resource to access one

or more of the three local scan chains.

TDO(0-2) 3 O TEST DATA OUTPUTS: Individual output for each of the local scan ports . These outputs have

24mA of drive current.

TDI(0-2) 3 I TEST DATA INPUTS: Individual scan data input for each of the local scan ports .

TMS(0-2) 3 O TEST MODE SELECT OUTPUTS: Individual output for each of the local scan ports. TMSn does

not provide a pull-up resistor (which is assumed to be present on a connected TMS input, per the

IEEE 1149.1 requirement) . These outputs have 24mA of drive current.

TCK(0-2) 3 O LOCAL TEST CLOCK OUTPUTS: Individual output for each of the local scan ports. These are

buffered versions of TCKB . These outputs have 24mA of drive current.

TRST(0-2) 3 O LOCAL TEST RESETS: A gated version of TRSTB . These outputs have 24mA of drive current.

www.national.com 4

SCANSTA111

Pin Name

Description

No.

Pins I/O

A(0-1) 2 I LOCAL PASS-THROUGH INPUTS: General purpose inputs which can be driven to the backplane

pin YB. (Only on LSP0 and LSP1. Only available when a single LSP is selected) . These inputs

have an internal pull-up resistor.

Y(0-1) 2 O LOCAL PASS-THROUGH OUTPUT: General purpose outputs which can be driven from the

backplane pin AB. (Only on LSP0 and LSP1. Only available when a single LSP is selected) . These

outputs have 24mA of drive current.

LSP_ACTIVE(0-2) 3 O LOCAL ANALOG TEST BUS ENABLE: These analog pins serve as enable signals for analog

busses supporting the IEEE 1149.4 Mixed-Signal Test Bus standard , or for backplane physical

layer changes (i.e.; TTL to LVDS). These outputs have 12mA of drive current.

TRIST(0-2) 3 O LOCAL TRI-STATE NOTIFICATION OUTPUTS: This signal is high when the local scan ports are

TRI-STATEd . These pins are used for backplane physical layer changes (i.e.; TTL to LVDS).

These outputs have 12mA of drive current.

TEST ENABLE 1 I TEST ENABLE INPUT: This pin is used for factory test and should be tied to VCC for normal

operation.

Note 1: Refer to the IBIS model on our website for I/O characteristics.

Application Overview

ADDRESSING SCHEME - The SCANSTA111 architecture

extends the functionality of the IEEE 1149.1 Standard by sup-

plementing that protocol with an addressing scheme which

allows a test controller to communicate with specific

'STA111s within a network of 'STA111s. That network can

include both multi-drop and hierarchical connectivity. In ef-

fect, the 'STA111 architecture allows a test controller to dy-

namically select specific portions of such a network for

participation in scan operations. This allows a complex sys-

tem to be partitioned into smaller blocks for testing purposes.

The 'STA111 provides two levels of test-network partitioning

capability. First, a test controller can select individual

'STA111s, specific sets of 'STA111s (multi-cast groups), or all

'STA111s (broadcast). This 'STA111-selection process is

supported by a Level-1 communication protocol. Second,

within each selected 'STA111, a test controller can select one

or more of the chip's three local scan-ports. That is, individual

local ports can be selected for inclusion in the (single) scan-

chain which a 'STA111 presents to the test controller. This

mechanism allows a controller to select specific terminal

scan-chains within the overall scan network. The port-selec-

tion process is supported by a Level-2 protocol.

HIERARCHICAL SUPPORT - Multiple SCANSTA111's can

be used to assemble a hierarchical boundary-scan tree. In

such a configuration, the system tester can configure the local

ports of a set of 'STA111s so as to connect a specific set of

local scan-chains to the active scan chain. Using this capa-

bility, the tester can selectively communicate with specific

portions of a target system. The tester's scan port is connect-

ed to the backplane scan port of a root layer of 'STA111s,

each of which can be selected using multi-drop addressing.

A second tier of 'STA111s can be connected to this root layer,

by connecting a local port (LSP) of a root-layer 'STA111 to

the backplane port of a second-tier 'STA111. This process

can be continued to construct a multi-level scan hierarchy.

'STA111 local ports which are not cascaded into higher-level

'STA111s can be thought of as the terminal leaves of a scan

tree. The test master can select one or more target leaves by

selecting and configuring the local ports of an appropriate set

of 'STA111s in the test tree.

Check with your ATPG tool vendor to ensure support of this

feature.

State Machines

The 'STA111 is IEEE 1149.1-compatible, in that it supports

all required 1149.1 operations. In addition, it supports a higher

level of protocol, (Level 1), that extends the IEEE 1149.1 Std.

to a multi-drop environment.

In multi-drop scan systems, a scan tester can select individual

'STA111s for participation in upcoming scan operations.

STA111 selection is accomplished by simultaneously scan-

ning a device address out to multiple 'STA111s. Through an

on-chip address matching process, only those 'STA111s

whose statically-assigned address matches the scanned-out

address become selected to receive further instructions from

the scan tester. SCANSTA111 selection is done using a Lev-

el-1 protocol, while follow-on instructions are sent to selected

'STA111s by using a Level-2 protocol.

5 www.national.com

SCANSTA111

10124505

FIGURE 2. SCANSTA111 State Machines

The 'STA111 contains three distinct but coupled state-ma-

chines (see Figure 2). The first of these is the TAP-control

state-machine, which is used to drive the 'STA111's scan

ports in conformance with the 1149.1 Standard. The second

is the 'STA111-selection state-machine (Figure 3). The third

state-machine actually consists of three identical but inde-

pendent state-machines (see Figure 4), one per 'STA111

local scan port. Each of these scan port selection state-ma-

chines allows individual local ports to be inserted into and

removed from the 'STA111s overall scan chain.

The 'STA111 selection state-machine performs the address

matching which gives the 'STA111 its multi-drop capability.

That logic supports single-'STA111 access, multi-cast, and

broadcast. The 'STA111-selection state-machine implements

the chip's Level-1 protocol.

10124506

FIGURE 3. State Machine for SCANSTA111 Selection Controller

www.national.com 6

SCANSTA111

10124507

FIGURE 4. Local SCANSTA111 Port Configuration State Machine

The 'STA111's scan port-configuration state-machine is used

to control the insertion of local scan ports into the overall scan

chain, or the isolation of local ports from the chain. From the

perspective of a system's (single) scan controller, each

'STA111 presents only one scan chain to the master. The

'STA111 architecture allows one or more of the 'STA111's lo-

cal ports to be included in the active scan chain.

Each local port can be parked in one of four stable states

(Parked-TLR, Parked-RTI, Parked-Pause-DR or Parked-

Pause-IR), either individually or simultaneously with other

local ports. Parking a chain removes that local chain from the

active scan chain. Conversely, a parked chain can be un-

parked, causing the corresponding local port to be inserted

into the active scan chain.

As shown in Figure 4, the 'STA111's three scan port-config-

uration state-machines allow each of the part's local ports to

occupy a different state at any given time. For example, some

ports may be parked, perhaps in different states, while other

ports participate in scan operations. The state-diagram shows

that some state transitions depend on the current state of the

TAP-control state-machine. As an example, a local port which

is presently in the Parked-RTI state does not become un-

parked (i.e., enter the Unparked state) until the 'STA111

receives an UNPARK instruction and the 'STA111's TAP

state-machine enters the Run-Test/Idle state.

Similarly, certain transitions of the scan port-configuration

state-machine can force the 'STA111's LSP-control state-ma-

chine into specific states. For example, when a local port is in

the Unparked state, the 'STA111 receives the PARKRTI in-

struction and the TAP is transitioned through Run-Test/Idle

state, the Local Port controller enters the Parked-RTI state in

which TMSn will be held low until the port is later unparked.

Once the Park-RTI instruction has been updated into the in-

struction register the TAP MUST be transitioned through the

Run-Test/Idle state. While TMSn is held low, all devices on

that local scan chain remain in their current TAP State (the

RTI TAP controller state in this example).

The 'STA111's scan port-configuration state-machine imple-

ments part of the 'STA111's Level-2 protocol. In addition, the

'STA111 provides a number of Level-2 instructions for func-

tions other than local scan port configuration. These instruc-

tions provide access to and control of various registers within

the 'STA111. This set of instructions includes:

BYPASS CNTRSEL

EXTEST LFSRON

SAMPLE/PRELOAD LFSROFF

IDCODE CNTRON

MODESEL CNTROFF

MCGRSEL GOTOWAIT

LFSRSEL

Figure 5 illustrates how the 'STA111's state-machines inter-

act. The 'STA111-selection state-machine enables or dis-

ables operation of the chip's three port-selection state-

machines. In 'STA111s which are selected via Level-1

protocol (either as individual 'STA111s or as members of

broadcast or multi-cast groups), Level-2 protocol commands

can be used to park or unpark local scan ports. Note that most

transitions of the port-configuration state-machines are gated

by particular states of the 'STA111's TAP-control state-ma-

chine, as shown in Figure 4 or Figure 5.

7 www.national.com

SCANSTA111

10124508

FIGURE 5. Relationship Between SCANSTA111 State Machines

Following a hardware reset, the TAP controller state-machine

is in the Test-Logic-Reset (TLR) state; the 'STA111-selection

state-machine is in the Wait-For-Address state; and each of

the three port-selection state-machines is in the Parked-

TLR state. The 'STA111 is then ready to receive Level-1

protocol, followed by Level-2 protocol.

Tester/SCANSTA111 Interface

An IEEE 1149.1 system tester sends instructions to a

'STA111 via that 'STA111's backplane scan-port. Following

test logic reset, the 'STA111's selection state-machine is in

the Wait-For-Address state. When the 'STA111's TAP con-

troller is sequenced to the Shift-IR state, data shifted in

through the TDIB input is shifted into the 'STA111's instruction

data is not shifted out of the instruction register and out

through the 'STA111's TDOB output, as it is during normal

scan operations. Instead, as each new bit enters the instruc-

tion register's most-significant bit, data shifted out from the

least-significant bit is discarded.

When the instruction register is updated with the address da-

ta, the 'STA111's address-recognition logic compares the

seven least-significant bits of the instruction register with the

7-bit assigned address which is statically present on the S

(0-6) inputs. Simultaneously, the scanned-in address is com-

pared with the reserved Broadcast and Multi-cast addresses.

If an address match is detected, the 'STA111-selection state-

machine enters one of the two selected states. If the scanned

address does not match a valid single-slot address or one of

the reserved broadcast/multi-cast addresses, the 'STA111-

selection state-machine enters the Unselected state.

Note that the SLOT inputs should not be set to a value cor-

responding to a multi-cast group, or to the broadcast address.

Also note that the single 'STA111 selection process must be

performed for all 'STA111s which are subsequently to be ad-

dressed in multi-cast mode. This is required because each

such device's Multicast Group Register (MCGR) must be pro-

grammed with a multi-cast group number, and the MCGR is

not accessible to the test controller until that 'STA111 has first

entered the Selected-Single-'STA111 state.

Once a 'STA111 has been selected, Level-2 protocol is used

to issue commands and to access the chip's various registers.

www.national.com 8

SCANSTA111

The SCANSTA111 includes a number of registers which are

used for 'STA111 selection and configuration, scan data ma-

nipulation, and scan-support operations. These registers can

be grouped as shown in Table 3.

The specific fields and functions of each of these registers are

detailed in the section of this document titled Data Register

Descriptions.

Note that when any of these registers is selected for insertion

into the 'STA111's scan-chain, scan data enters through that

of the register is fed to the scan input of the next-downstream

device in the scan-chain.

TABLE 3. Register Descriptions

Instruction Register INSTRUCTION 'STA111 addressing and instruction-decode IEEE Std. 1149.1 required

Boundary-Scan Register BOUNDARY IEEE Std. 1149.1 required register

Bypass Register BYPASS IEEE Std. 1149.1 required register

Device Identification Register IDCODE IEEE Std. 1149.1 optional register

Multi-Cast Group Register MCGR 'STA111-group address assignment

Mode Register0MODE 'STA111 local-port configuration and control bits

Mode Register1N/A 'STA111 local-port configuration and control bits (Note 2, Note 3)

Mode Register2MODE2 'STA111 Shared GPIO configuration bits

Linear-Feedback Shift Register LFSR 'STA111 scan-data compaction (signature generation)

TCK Counter Register CNTR Local-port TCK clock-gating (for BIST)

Dedicated GPIO Register(0-n) N/A 'STA111 Dedicated GPIO control bits (Note 3)

Shared GPIO Register(0-n) SGPIOn 'STA111 Shared GPIO control bits

Note 2: One dedicated and one shared GPIO register exists for each LSP that supports dedicated and/or shared GPIO (maximum of eight shared and eight

dedicated GPIO registers).

Note 3: HDL version only

9 www.national.com

SCANSTA111

Level 1 Protocol (Addressing Modes)

TABLE 4. SCANSTA111 Address Modes

Address Type Hex Address Binary Address TDOB State

Direct Address 00 to 39, 00000000 to 00111010 Normal IEEE Std. 1149.1

40 to 7F. 01000000 to 01111111

(80 to FF (Note 4)) (10000000 to 11111111(Note 4))

Interrogation Address 3A 00111010 Force strong 0' or weak 1' as ones-complement

address is shifted out.

Broadcast Address 3B 00111011 Always TRI-STATED

Multi-Cast Group 0 3C 00111100 Always TRI-STATED

Multi-Cast Group 1 3D 00111101 Always TRI-STATED

Multi-Cast Group 2 3E 00111110 Always TRI-STATED

Multi-Cast Group 3 3F 00111111 Always TRI-STATED

Note 4: Hex addresses 80' to FF' are only available when using the eighth address bit in the HDL version of the SCANSTA111. The Silicon part has seven address

lines and will treat the most-significant address bit as a don't care.

The SCANSTA111 supports single and multiple modes of ad-

dressing a 'STA111. The single mode selects one 'STA111

and is called Direct Addressing. More than one 'STA111 de-

vice can be selected via the Broadcast and Multi-Cast Ad-

dressing modes.

DIRECT ADDRESSING: The 'STA111 enters the Wait-For-

Address state when:

1. its TAP Controller enters the Test-Logic-Reset state, or

2. its instruction register is updated with the GOTOWAIT

instruction (while either selected or unselected).

Each 'STA111 within a scan network must be statically con-

figured with a unique address via its S(0-6) inputs. While the

'STA111 controller is in the Wait-For-Address state, data

shifted into bits 6 through 0 of the instruction register is com-

pared with the address present on the S(0-6) inputs in the

Update-IR state. If the seven (7) LSBs of the instruction reg-

ister match the address on the S(0-6) inputs, (see Figure 6) the

'STA111 becomes selected, and is ready to receive Level 2

Protocol (i.e., further instructions). When the 'STA111 is se-

lected, its device identification register is inserted into the

active scan chain.

All 'STA111s whose S(0-6) address does not match the in-

struction register address become unselected. An unselected

'STA111 will remain unselected until either its TAP Controller

enters the Test-Logic-Reset state, or its instruction register is

updated with the GOTOWAIT instruction.

BROADCAST ADDRESSING:

The Broadcast Address allows a tester to simultaneously se-

lect all 'STA111s in a test network. This mode is useful in

testing systems which contain multiple identical boards. To

avoid bus contention between scan-path output drivers on

different boards, each 'STA111's TDOB buffer is always TRI-

STATEd while in Broadcast mode. In this configuration, the

on-chip Linear Feedback Shift Register (LFSR) can be used

to accumulate a test result signature for each board that can

be read back later by direct-addressing each board's

'STA111.

MULTICAST ADDRESSING:

As a way to make the broadcast mechanism more selective,

the 'STA111 provides a Multi-cast addressing mode. A

'STA111's multi-cast group register (MCGR) can be pro-

grammed to assign that 'STA111 to one of four (4) Multi-Cast

groups. When 'STA111s in the Wait-For-Address state are

updated with a Multi-Cast address, all 'STA111s whose MC-

GR matches the Multi-Cast group will become selected. As in

Broadcast mode, TDOB is always TRI-STATEd while in Multi-

cast mode.

10124509

FIGURE 6. Direct Addressing: Device Address Loaded into Instruction Register

www.national.com 10

SCANSTA111

10124510

FIGURE 7. Broadcast Addressing: Address Loaded into Instruction Register

10124511

FIGURE 8. Multi-Cast Addressing: Address Loaded into Instruction Register

11 www.national.com

SCANSTA111

Level 2 Protocol

Once the SCANSTA111 has been successfully addressed

and selected, its internal registers may be accessed via Lev-

el-2 Protocol. Level-2 Protocol is compliant to IEEE Std.

1149.1 TAP protocol with one exception: if the 'STA111 is se-

lected via the Broadcast or Multi-Cast address, TDOB is al-

ways TRI-STATED. (The TDOB buffer must be implemented

this way to prevent bus contention.) Upon being selected,

(i.e., the 'STA111 Selection controller transitions from the

Wait-For-Address state to one of the Selected states), each

of the local scan ports (LSP0 , LSP1 , LSP2) remains parked

in one of the following four TAP Controller states: Test-Logic-

Reset, Run-Test/Idle, Pause-DR, or Pause-IR and the active

scan chain consists of: TDIB through the instruction register

(or the IDCODE register) and out through TDOB.

TDIB → Instruction Register → TDOB

The UNPARK instruction (described later) is used to insert

one or more local scan ports into the active scan chain. Table

7 describes which local ports are inserted into the chain, and

in what order.

LEVEL 2 INSTRUCTION TYPES There are two types of in-

structions (reference Table 5):

1. Instructions that insert a 'STA111 register into the active

scan chain so that the register can be captured or

updated (BYPASS, SAMPLE/PRELOAD, EXTEST, ID-

CODE, MODESEL, MCGRSEL, LFSR-SEL,

CNTRSEL).

2. Instructions that configure local ports or control the

operation of the linear feedback shift register and counter

registers (UNPARK, PARKTRL, PARKRTI, PARK-

PAUSE, GOTOWAIT, SOFTRESET, LFSRON,

LFSROFF, CNTRON, CNTROFF). These instructions,

along with any other yet undefined Op-Codes, will cause

the device identification register to be inserted into the

active scan chain.

www.national.com 12

SCANSTA111

TABLE 5. Level 2 Protocol and Op-Codes

Instructions Hex Op-Code Binary Op-Code Data Register

BYPASS FF 1111 1111 Bypass Register

EXTEST 00 0000 0000 Boundary-Scan Register

SAMPLE/PRELOAD 81 1000 0001 Boundary-Scan Register

IDCODE AA 1010 1010 Device Identification Register

UNPARK E7 1110 0111 Device Identification Register

PARKTLR C5 1100 0101 Device Identification Register

PARKRTI 84 1000 0100 Device Identification Register

PARKPAUSE C6 1100 0110 Device Identification Register

GOTOWAIT (Note 5) C3 1100 0011 Device Identification Register

MODESEL 8E 1000 1110 Mode Register0

MODESEL182 1000 0010 Mode Register1

MODESEL283 1000 0011 Mode Register2

MODESEL385 1000 0101 Mode Register3

MCGRSEL 03 0000 0011 Multi-Cast Group Register

SOFTRESET 88 1000 1000 Device Identification Register

LFSRSEL C9 1100 1001 Linear Feedback Shift Register

LFSRON 0C 0000 1100 Device Identification Register

LFSROFF 8D 1000 1101 Device Identification Register

CNTRSEL CE 1100 1110 32-Bit TCK Counter Register

CNTRON 0F 0000 1111 Device Identification Register

CNTROFF 90 1001 0000 Device Identification Register

DEFAULT_BYPASS (Note 6) 07 0000 0111 Set Bypass_reg as default data register

TRANSPARENT0 A0 1010 0000 Transparent Enable Register0

TRANSPARENT1 A1 1010 0001 Transparent Enable Register1

TRANSPARENT2 A2 1010 0010 Transparent Enable Register2

TRANSPARENT3 A3 1010 0011 Transparent Enable Register3

TRANSPARENT4 A4 1010 0100 Transparent Enable Register4

TRANSPARENT5 A5 1010 0101 Transparent Enable Register5

TRANSPARENT6 A6 1010 0110 Transparent Enable Register6

TRANSPARENT7 A7 1010 0111 Transparent Enable Register7

DGPIO0B0 1011 0000 Dedicated GPIO Register0

DGPIO1B1 1011 0001 Dedicated GPIO Register1

DGPIO2B2 1011 0010 Dedicated GPIO Register2

DGPIO3B3 1011 0011 Dedicated GPIO Register3

13 www.national.com

SCANSTA111

Instructions Hex Op-Code Binary Op-Code Data Register

DGPIO4B4 1011 0100 Dedicated GPIO Register4

DGPIO5B5 1011 0101 Dedicated GPIO Register5

DGPIO6B6 1011 0110 Dedicated GPIO Register6

DGPIO7B7 1011 0111 Dedicated GPIO Register7

SGPIO0B8 1011 1000 Shared GPIO Register0

SGPIO1B9 1011 1001 Shared GPIO Register1

SGPIO2BA 1011 1010 Shared GPIO Register2

SGPIO3BB 1011 1011 Shared GPIO Register3

SGPIO4BC 1011 1100 Shared GPIO Register4

SGPIO5BD 1011 1101 Shared GPIO Register5

SGPIO6BE 1011 1110 Shared GPIO Register6

SGPIO7BF 1011 1111 Shared GPIO Register7

Other Undefined TBD TBD Device Identification Register

Note 5: All other instructions act on selected 'STA111s only.

Note 6: Commands added to HDL version of 'STA111.

LEVEL 2 INSTRUCTON DESCRIPTIONS:

BYPASS: The BYPASS instruction selects the bypass regis-

ter for insertion into the active scan chain when the 'STA111

is selected.

EXTEST: The EXTEST instruction selects the boundary-scan

scan register consists of seven sample only shift cells con-

nected to the S(0-6) and OE inputs. On the 'STA111, the

EXTEST instruction performs the same function as the SAM-

PLE/PRELOAD instruction, since there aren't any scannable

outputs on the device.

SAMPLE/PRELOAD: The SAMPLE/PRELOAD instruction

selects the boundary-scan register for insertion into the active

scan chain. The boundary-scan register consists of seven

sample only shift cells connected to the S(0-6) and OE inputs.

IDCODE: The IDCODE instruction selects the device identi-

fication register for insertion into the active scan chain. When

IDCODE is the current active instruction the device identifi-

cation 0FC0F01F Hex is captured upon exiting the Capture-

DR state.

UNPARK: This instruction unparks the Local Scan Port Net-

work and inserts it into the active scan chain as configured by

Mode Register0 (and Mode Register1 in the HDL) (see Table

7). Unparked LSPs are sequenced synchronously with the

'STA111's TAP controller. When a LSP has been parked in

the Test-Logic-Reset or Run-Test/Idle state, it will not become

unparked until the 'STA111's TAP Controller enters the Run-

Test/Idle state following the UNPARK instruction. An LSP

which has been parked in Test-Logic-Reset will be parked in

Run-Test/Idle upon update of an UNPARK instruction. If an

LSP has been parked in one of the stable pause states

(Pause-DR or Pause-IR), it will not become unparked until the

'STA111's TAP Controller enters the respective pause state.

(See Figure 9, Figure 10, Figure 11, and Figure 12).

PARKTLR: This instruction causes all unparked LSPs to be

parked in the Test-Logic-Reset TAP controller state and re-

moves the LSP network from the active scan chain. The LSP

controllers keep the LSPs parked in the Test-Logic-Reset

state by forcing their respective TMSn output with a constant

logic 1 while the LSP controller is in the Parked-TLR state (see

Figure 4).

PARKRTI: This instruction causes all unparked LSPs to be

parked in the Run-Test/Idle state. The update of the PARKR-

TI instruction MUST immediately be followed by a TMSB=0

(to enter the RTI state) in order to assure stability. When a

LSPn is active (unparked), its TMSn signals follow TMSB and

the LSPn controller state transitions are synchronized with the

TAP Controller state transitions of the 'STA111. When the in-

struction register is updated with the PARKRTI instruction,

TMSn will be forced to a constant logic 0, causing the un-

parked local TAP Controllers to be parked in the Run-Test/

Idle state. When an LSPn is parked, it is removed from the

active scan chain.

PARKPAUSE: The PARKPAUSE instruction has dual func-

tionality. It can be used to park unparked LSPs or to unpark

parked LSPs. The instruction places all unparked LSPs in one

of the TAP Controller pause states. A local port does not be-

come parked until the 'STA111's TAP Controller is sequenced

through Exit1-DR/IR into the Update-DR/IR state. When the

'STA111 TAP Controller is in the Exit1-DR or Exit1-IR state

and TMSB is high, the LSP controller forces a constant logic

0 onto TMSL thereby parking the port in the Pause-DR or

Pause-IR state respectively (see Figure 4). Another instruc-

tion can then be loaded to reconfigure the local ports or to

deselect the 'STA111 (i.e., MODESEL, GOTOWAIT, etc.).

If the PARKPAUSE instruction is given to a whose LSPs are

parked in Pause-IR or Pause-DR, the parked LSPs will be-

come unparked when the 'STA111's TAP controller is se-

quenced into the respective Pause state.

The PARKPAUSE instruction was implemented with this dual

functionality to enable backplane testing (interconnect testing

between boards) with simultaneous Updates and Captures.

Simultaneous Update and Capture of several boards can be

performed by parking LSPs of the different boards in the

Pause-DR TAP controller state, after shifting the data to be

updated into the boundary registers of the components on

each board. The broadcast address is used to select all

'STA111s connected to the backplane. The PARKPAUSE in-

struction is scanned into the selected 'STA111s and the

'STA111 TAP controllers are sequenced to the Pause-DR

state where the LSPs of all 'STA111s become unparked. The

local TAP controllers are then sequenced through the Up-

date-DR, Select-DR, Capture-DR, Exit1-DR, and parked in

the Pause-DR state, as the 'STA111 TAP controller is se-

quenced into the Update-DR state. When a LSP is parked, it

is removed from the active scan chain.

www.national.com 14

SCANSTA111

GOTOWAIT: This instruction is used to return all 'STA111s

to the Wait-For-Address state. All unparked LSPs will be

parked in the Test-Logic-Reset TAP controller state (see Fig-

ure 5).

MODESEL: The MODESEL instruction inserts Mode Regis-

ter0 into the active scan chain. Mode Register0 determines the

LSPN configuration for a device with up to five (5) LSPs (only

three in Silicon). Bit 7 of Mode Register0 is a read-only counter

status flag.

MODESELn: The MODESELn instruction inserts Mode Reg-

istern (n = 1 to 3) into the active scan chain. Mode Register1

determines the LSPN configuration for LSP 5, 6 and 7 (if they

exist), and Mode Register2 determines the Shared GPIO con-

figuration.

MCGRSEL: This instruction inserts the multi-cast group reg-

ister (MCGR) into the active scan chain. The MCGR is used

to group 'STA111s into multi-cast groups for parallel TAP se-

quencing (i.e., to simultaneously perform identical scan op-

erations).

SOFTRESET: This instruction causes all 3 Port configuration

controllers (see Figure 4) to enter the Parked-TLR state,

which forces TMSn high; this parks each local port in the Test-

Logic-Reset state within 5 TCKB cycles.

LFSRSEL: This instruction inserts the linear feedback shift

pacted signature to be shifted out of the LFSR during the Shift-

DR state. (The signature is assumed to have been computed

during earlier LFSRON shift operations.) This instruction dis-

ables the LFSR register's feedback circuitry, turning the LFSR

into a standard 16-bit shift register. This allows a signature to

be shifted out of the register, or a seed value to be shifted into

it.

LFSRON: Once this instruction is executed, the linear feed-

back shift register samples data from the active scan path

(including all unparked TDIn) during the Shift-DR state. Data

from the scan path is shifted into the linear feedback shift

to be compressed into a 16-bit signature that can subse-

quently be shifted out using the LFSRSEL instruction. The

linear feedback shift register is not placed in the scan chain

during this mode. Instead, the register samples the active

scan-chain data as it flows from the LSPN to TDOB.

LFSROFF: This instruction terminates linear feedback shift

ceiving this instruction.

CNTRSEL: This instruction inserts the 32-bit TCK counter

shift register into the active scan chain. This allows the user

to program the number of n TCK cycles to send to the parked

local ports once the CNTRON instruction is issued (e.g., for

BIST operations). Note that to ensure completion of count-

down, the 'STA111 should receive at least n TCKB pulses.

CNTRON: This instruction enables the TCK counter. The

counter begins counting down on the first rising edge of

TCKB following the Update-IR TAP controller state and is

decremented on each rising edge of TCKB thereafter. When

the TCK counter reaches terminal count, 00000000 Hex,

TCKn of all parked LSP's is held low. This function overrides

Mode Register0 TCK control bit (bit-3).

If the CNTRON instruction is issued when the TCK counter is

00000000 (terminal count) the local TCKs of parked LSPs will

be gated. The counter will begin counting on the rising edge

of TCKB when the TCK counter is loaded with a non-zero val-

ue following a CNTRSEL instruction (see BIST Support in

Special Features section for an example).

CNTROFF: This instruction disables the TCK counter, and

TCKn control is returned to Mode Register0 (bit 3).

DEFAULT_BYPASS: This instruction selects the Bypass

do not explicitly require a data register. The default after RE-

SET is the Device ID register.

10124512

FIGURE 9. Local Scan Port Synchronization from Parked-TLR State

15 www.national.com

SCANSTA111

10124513

FIGURE 10. Local Scan Port Synchronization from Parked-RTI State

INSTRUCTION REGISTER: The instruction shift register is

an 8-bit register that is in series with the scan chain whenever

the TAP Controller of the SCANSTA111 is in the Shift-IR

state. Upon exiting the Capture-IR state, the value

XXXXXX01 is captured into the instruction register, where

XXXXXX represents the value on the S(0-6) inputs. When the

'STA111 controller is in the Wait-For-Address state, the in-

struction register is used for 'STA111 selection via address

matching. In addressing individual 'STA111s, the chip's ad-

dressing logic performs a comparison between a statically-

configured (hard-wired) value on that 'STA111's slot inputs,

and an address which is scanned into the chip's instruction

through 3A Hex) are reserved for addressing individual

'STA111s. Address 3B Hex is for Broadcast mode.

During multi-cast (group) addressing, a scanned-in address

is compared against the (previously scanned-in) contents of

a 'STA111's Multi-Cast Group register. Binary address codes

111110 through 111111 (3A through 3F Hex) are reserved for

multi-cast addressing, and should not be assigned as

'STA111 slot-input values.

BOUNDARY-SCAN REGISTER: The boundary-scan regis-

ter is a sample only shift register containing cells from the S

(0-6) and OE inputs. The register allows testing of circuitry ex-

ternal to the 'STA111. It permits the signals flowing between

the system pins to be sampled and examined without inter-

fering with the operation of the on-chip system logic.

The scan chain is arranged as follows:

TDIB→ OE→ S6→ S5→ S4→ S3→ S2→ S1→ S0→ TDOB

BYPASS REGISTER: The bypass register is a 1-bit register

that operates as specified in IEEE Std. 1149.1 once the

'STA111 has been selected. The register provides a minimum

length serial path for the movement of test data between

TDIB and the LSPN. This path can be selected when no other

test data register needs to be accessed during a board-level

test operation. Use of the bypass register shortens the serial

access-path to test data registers located in other compo-

nents on a board-level test data path.

MULTI-CAST GROUP REGISTER: Multi-cast is a method of

simultaneously communicating with more than one selected

'STA111. The multi-cast group register (MCGR) is a 2-bit reg-

ister used to determine which multi-cast group a particular

'STA111 is assigned to. Four addresses are reserved for mul-

ti-cast addressing. When a 'STA111 is in the Wait-For-Ad-

dress state and receives a multi-cast address, and if that

'STA111's MCGR contains a matching value for that multi-

cast address, the 'STA111 becomes selected and is ready to

receive Level 2 Protocol (i.e., further instructions).

The MCGR is initialized to 00 upon entering the Test-Logic-

Reset state.

TABLE 6. Multi-Cast Group Register Addressing

MCGR Bits 1,0 Hex Address Binary Address

00 3C 00111100

01 3D 00111101

10 3E 00111110

11 3F 00111111

The following actions are used to perform multi-cast address-

ing:

1. Assign all target 'STA111s to a multi-cast group by writing

each individual target 'STA111's MCGR with the same

multi-cast group code (see Table 6). This configuration

step must be done by individually addressing each target

'STA111, using that chip's assigned slot value.

2. Scan out the multi-cast group address through the TDIB

input of all 'STA111s. Note that this occurs in parallel,

resulting in the selection of only those 'STA111s whose

MCGR was previously programmed with the matching

multi-cast group code.

MODE REGISTER0: Mode Register0 is an 8-bit data register

used primarily to configure the Local Scan Port Network.

Mode Register0 is initialized to 00000001 binary upon enter-

ing the Test-Logic-Reset state. Bits 0, 1, 2, and 4 are used for

scan chain configuration as described in Table 7. When the

UNPARK instruction is executed, the scan chain configura-

tion is as shown in Table 7 below. When all LSPs are parked,

the scan chain configuration is TDIB → 'STA111-register →

TDOB. Bit 3 is used for TCKn configuration, see Table 8.

www.national.com 16

SCANSTA111

TABLE 7. Mode Register Control of LSPN

Mode Register(s) Scan Chain Configuration (if unparked)

MR0: X000X000 TDIB → Register → TDOB

MR0: X000X001 TDIB → Register → LSP0 → PAD → TDOB

MR0: X000X010 TDIB → Register → LSP1 → PAD → TDOB

MR0: X000X011 TDIB → Register → LSP0 → PAD → LSP1 → PAD → TDOB

MR0: X000X100 TDIB → Register → LSP2 → PAD → TDOB

MR0: X000X101 TDIB → Register → LSP0 → PAD → LSP2 → PAD → TDOB

MR0: X000X110 TDIB → Register → LSP1 → PAD → LSP2 → PAD → TDOB

MR0: X000X111 TDIB → Register → LSP0 → PAD → LSP1 → PAD → LSP2 → PAD → TDOB

MR0: X010X000 TDIB → Register → LSP3 → PAD → TDOB

MR0: X010X001 TDIB → Register → LSP0 → PAD → LSP3 → PAD → TDOB

MR0: X010X010 TDIB → Register → LSP1 → PAD → LSP3 → PAD → TDOB

MR0: X010X011 TDIB → Register → LSP0 → PAD → LSP1 → PAD → LSP5 → PAD → TDOB

MR0: X010X100 TDIB → Register → LSP2 → PAD → LSP3 → PAD → TDOB

... ...

MR0: X110X111 TDIB → Register → LSP0 → PAD → LSP1 → PAD → LSP2 → PAD → LSP3 → PAD → LSP4 → PAD → TDOB

MR0: X000X000

MR1: XXXXX001

(Note 7)

TDIB → Register → LSP5 → PAD → TDOB

MR0: X000X001

MR1: XXXXX001

(Note 7)

TDIB → Register → LSP0 → PAD → LSP5 → PAD → TDOB

MR0: X000X010

MR1: XXXXX001

(Note 7)

TDIB → Register → LSP1 → PAD → LSP5 → PAD → TDOB

... ...

MR0: X110X111

MR1: XXXXX001

(Note 7)

TDIB → Register → LSP0 → PAD →→ LSP1 → PAD → LSP2 → PAD → LSP3 → PAD → LSP4 → PAD → LSP5

→ PAD → TDOB

MR0: X000X000

MR1: XXXXX010

(Note 7)

TDIB → Register → LSP6 → PAD → TDOB

... ...

MR0: X110X111

MR1: XXXXX111

(Note 7)

TDIB → Register → LSP0 → PAD → LSP1 → PAD → LSP2 → PAD → LSP3 → PAD → LSP4 → PAD → LSP5 →

PAD → LSP6 → PAD → LSP7 → PAD → TDOB

MR0: XXX1XXXX

MR1: XXXXXXXX

(Note 7)

TDIB → Register → TDOB (Loopback)

Note 7: Mode Register1 is only available in the HDL version (up to eight LSPs). The Silicon version has three LSPs and uses Mode Register0 for LSP selection.

Note 8: In a device with 8 LSPs there are 28 possible LSPN configurations: No LSPs, each individual LSP, combinations of 2 to 7 LSPs, and all 8 LSPs.

TABLE 8. Test Clock Configuration

Bit 3 LSP n TCK n

1 Parked Stopped

0 Parked Free-running

1 Unparked Free-running

0 Unparked Free-running

X Parked-TLR Stopped after 512 clock pulses

Bit 3 is normally set to logic 0 so that TCKn is free-running

when the local scan ports are parked in the Parked-RTI,

Parked-Pause-DR or Parked-Pause-IR state. When the local

ports are parked, bit 3 can be programmed with logic 1, forcing

all of the LSP TCKn's to stop. This feature can be used in

power sensitive applications to reduce the power consumed

by the test circuitry in parts of the system that are not under

test. When in the Parked-TLR state, TCKn is gated (stopped)

after 512 clock pulses have been received on TCKB indepen-

dent of the bit 3 value.

17 www.national.com

SCANSTA111

Bit 7 is a status bit for the TCK counter. Bit 7 is only set (logic

1) when the TCK counter is on and has reached terminal

count (zero). It is cleared (logic 0) when the counter is loaded

following a CNTRSEL instruction. The power-on value for bit

7 is 0.

Bits 5 and 6 are optional in the HDL to support five LSPs with

a single Mode Register0 . A second Mode Register1 may be

added to allow support of up to eight LSPs.

TABLE 9. Mode Register0

BIT 7 6 5 4 3 2 1 0

Description TCK Counter Status LSP4LSP3TDIB to TDOB Loopback TCK Free Running Disable LSP2LSP1LSP0

Used in Silicon Y N N Y Y Y Y Y

Default Value 0 0 0 0 0 0 0 1

TABLE 10. Mode Register1

BIT 7 6 5 4 3 2 1 0

Description Reserved Reserved Reserved Reserved Reserved LSP7LSP6LSP5

Used in Silicon N N N N N N N N

Default Value 0 0 0 0 0 0 0 0

TABLE 11. Mode Register2

BIT 7 6 5 4 3 2 1 0

Description LSP7/GPIO7LSP6/GPIO6LSP5/GPIO5LSP4/GPIO4LSP3/GPIO3LSP2/GPIO2LSP1/GPIO1LSP0/GPIO0

Used in Silicon N N N N N Y Y Y

Default Value 0 0 0 0 0 0 0 0

DEVICE IDENTIFICATION REGISTER: The device identifi-

cation register (IDREG) is a 32-bit register compliant with

IEEE Std. 1149.1. When the IDCODE instruction is active, the

identification register is loaded with the Hex value upon leav-

ing the Capture-DR state (on the rising edge of the TCKB).

Refer to the currently available BSDL file on our website for

the most accurate Device ID.

LINEAR FEEDBACK SHIFT REGISTER: The 'STA111 con-

tains a signature compactor which supports test result eval-

uation in a multi-chain environment. The signature compactor

consists of a 16-bit linear-feedback shift register (LFSR)

which can monitor local-port scan data as it is shifted up-

stream from the 'STA111's local-port network. Once the LFSR

is enabled, the LFSR's state changes in a reproducible way

as each local-port data bit is shifted in from the local-port net-

work. When all local-port data has been scanned in, the LFSR

contains a 16-bit signature value which can be compared

against a signature computed for the expected results vector.

The LFSR uses the following feedback polynomial:

F(x) = X16 + X12 + X3 + X + 1

This signature compactor is used to compress serial data

shifted in from the local scan chain, into a 16-bit signature.

This signature can then be shifted out for comparison with an

expected value. This allows users to test long scan chains in

parallel, via Broadcast or Multi-Cast addressing modes, and

check only the 16-bit signatures from each module. The LFSR

is initialized with a value of 0000 Hex upon reset.

32-BIT TCK COUNTER REGISTER: The 32-bit TCK counter

be run on a parked LSP while another 'STA111 port is being

tested. The CNTRSEL instruction can be used to load a

count-down value into the counter register via the active scan

chain. When the counter is enabled (via the CNTRON in-

struction), and the LSP is parked, the local TCKs will stop and

be held low when terminal count is reached.

The TCK counter is initialized with a value of 00000000 Hex

upon reset.

TABLE 12. Dedicated GPIO Registern (HDL only)

BIT 7 6 5 4 3 2 1 0

Description Input Input Input Input Output Output Output Output

TABLE 13. Shared GPIO Registern

BIT 7 6 5 4 3 2 1 0

Description Reserved Reserved Reserved Reserved Reserved Input (TDI) Output (TDO) Output (TMS)

Used in Silicon N N N N N Y Y Y

Default Value 0 0 0 0 0 0 0 0

www.national.com 18

SCANSTA111

Special Features

TRANSPARENT MODE

While this mode is activated, the selected LSP n ports will

follow the backplane ports. TRSTn is a buffered version of

TRSTB, TCKn is a buffered version of TCKB, TMSn is a

buffered version of TMSB, TDOn is a buffered version of

TDIB and TDOB is a buffered version of TDIn. TRISTB and

TRISTn are asserted when the state machine is in either the

Shift-DR or Shift-IR states. The unselected LSPs are placed

in the PARKTLR state, and their clocks are gated after 512

TCKB clock cycles.

Transparent Mode is controlled by 8 new instructions,

TRANSPARENT0 through TRANSPARENT7. Transparent

Mode overrides any other active mode. When one of the

transparent mode instruction is shifted into the instruction

state, TRSTn will go high, and TMSn will go low. This will force

the targets connected to the LSPn ports to go into the RTI

state. Then as the 'STA111 state machine goes into the RTI

state, all of the LSPn signals will follow the back-plane signals.

This is identical to the method that is typically used to unpark

an LSP. The 'STA111 will remain in this mode until a TRSTB

is asserted or a power cycle forces a reset. Once in the Trans-

parent Mode, the 'STA111 will not be able to be reset by a 5

TMS high reset.

The sequence of operations to use Transparent Mode on an

LSP are as follows (example uses LSP0 ):

1. IR-Scan the 'STA111 address into the instruction register

(address a 'STA111).

2. IR-Scan the TRANSPARENT0 instruction to enable

Transparent Mode on LSP0. Transparent Mode is

enabled when the TAP enters the RTI state at the end of

this shift operation (TRST0, TDO0, TMS0 and TCK0

become buffered versions of TRSTB, TDIB, TMSB and

TCKB and TDOB becomes a buffered version of TDI0).

NOTE: Transparent Mode will persist until the 'STA111 is re-

set using TRSTB . The GOTOWAIT and SOFTRESET in-

structions will not work in this mode.

BIST SUPPORT

The sequence of instructions to run BIST testing on a parked

SCANSTA111 port is as follows:

1. Pre-load the Boundary register of the device under test

if needed.

2. Issue the CNTRSEL instruction and initialize (load) the

TCK counter to 00000000 Hex. Note that the TCK

counter is initialized to 00000000 Hex upon Test-Logic-

Reset, so this step may not be necessary.

3. Issue the CNTRON instruction to the 'STA111, to enable

the TCK counter.

4. Shift the PARKRTI instruction into the 'STA111

instruction register and BIST instruction into the

instruction register of the device under test. With the

counter on (at terminal count) and the LSP parked, the

local TCK is gated.

5. Issue the CNTRSEL instruction to the 'STA111.

6. Load the TCK counter (Shift the 32-bit value representing

the number of TCKn cycles needed to execute the BIST

operation into the TCK counter register). The Self test will

begin on the rising edge of TCKB following the Update-

DR TAP controller state.

7. Bit 7 of Mode Register0 can be scanned to check the

status of the TCK counter, (MODESEL instruction

followed by a Shift-DR). Bit 7 logic 0 means the counter

has not reached terminal count, logic 1 means that the

counter has reached terminal count and the BIST

operation has completed.

8. Execute the CNTROFF instruction.

9. Unpark the LSP and scan out the result of the BIST

operation

RESET

Reset operations can be performed at three levels. The high-

est level resets all 'STA111 registers and all of the local scan

chains of selected and unselected 'STA111s. This Level 1 re-

set is performed whenever the 'STA111 TAP Controller enters

the Test-Logic-Reset state. Test-Logic-Reset can be entered

synchronously by forcing TMSB high for at least five (5)

TCKB pulses, or asynchronously by asserting the TRSTB pin.

A Level 1 reset forces all 'STA111s into the Wait-For-Ad-

dress state, parks all local scan chains in the Test-Logic-

Reset state, and initializes all 'STA111 registers.

The SOFTRESET instruction is provided to perform a Level

2 reset of all LSP's of selected 'STA111s. SOFTRESET

forces all TMSn signals high, placing the corresponding local

TAP Controllers in the Test-Logic-Reset state within five (5)

TCKB cycles.

The third level of reset is the resetting of individual local ports.

An individual LSP can be reset by parking the port in the Test-

Logic-Reset state via the PARKTLR instruction. To reset an

individual LSP that is parked in one of the other parked states,

the LSP must first be unparked via the UNPARK instruction.

PORT SYNCHRONIZATION

When a LSP is not being accessed, it is placed in one of the

four TAP Controller states: Test-Logic-Reset, Run-Test/Idle,

Pause-DR, or Pause-IR. The 'STA111 is able to park a local

chain by controlling the local Test Mode Select outputs (TMS

(0-2)) (see Figure 4). TMSn is forced high for parking in the

Test-Logic-Reset state, and forced low for parking in Run-

Test/Idle, Pause-IR, or Pause-DR states. Local chain access

is achieved by issuing the UNPARK instruction. The LSPs do

not become unparked until the 'STA111 TAP Controller is se-

quenced through a specified synchronization state. Synchro-

nization occurs in the Run-Test/Idle state for LSPs parked in

Test-Logic-Reset or Run-Test/Idle; and in the Pause-DR or

Pause-IR state for ports parked in Pause-DR or Pause-IR,

respectively.

Figure 11 and Figure 12 show the waveforms for synchro-

nization of a local chain that was parked in the Test-Logic-

Reset state. Once the UNPARK instruction is received in the

instruction register, the LSPC forces TMSn low on the falling

edge of TCKB .

19 www.national.com

SCANSTA111

10124514

FIGURE 11. Local Scan Port Synchronization on Second Pass

10124515

FIGURE 12. Synchronization of the Three Local Scan Ports

This moves the local chain TAP Controllers to the synchro-

nization state (Run-Test/Idle), where they stay until synchro-

nization occurs. If the next state of the 'STA111 TAP

Controller is Run-Test/Idle, TMSn is connected to TMSB and

the local TAP Controllers are synchronized to the 'STA111

TAP Controller as shown in Figure 12. If the next state after

Update-IR were Select-DR, TMSn would remain low and syn-

chronization would not occur until the 'STA111 TAP Controller

entered the Run-Test/Idle state, as shown in Figure 11.

Each local port has its own Local Scan Port Controller. This

is necessary because the LSPN can be configured in any one

of eight (8) possible combinations. Either one, some, or all of

the local ports can be accessed simultaneously. Configuring

the LSPN is accomplished with Mode Register0, in conjunc-

tion with the UNPARK instruction.

The LSPN can be unparked in one of seven different config-

urations (Si device), as specified by bits 0-2 of Mode Regis-

ter0 . Using multiple ports presents not only the task of

synchronizing the 'STA111 TAP Controller with the TAP Con-

trollers of an individual local port, but also of synchronizing

the individual local ports to one another.

When multiple local ports are selected for access, it is possi-

ble that two ports are parked in different states. This could

occur when previous operations accessed the two ports sep-

arately and parked them in the two different states. The LSP

Controllers handle this situation gracefully. Figure 12 shows

the UNPARK instruction being used to access LSP0, LSP1,

and LSP2 in series (Mode Register0 = XXX0X111 binary).

LSP0 and LSP1 become active as the 'STA111 controller is

sequenced through the Run-Test/Idle state. LSP2 remains

parked in the Pause-DR state until the 'STA111 TAP Con-

troller is sequenced through the Pause-DR state. At that point,

all three local ports are synchronized for access via the active

scan chain.

PARAMETERIZED DESIGN (HDL)

In order to support a large number of applications, the

'STA111 HDL is parameterized as described:

•Number of Local Scan Ports (LSPs): The 'STA111 HDL

is able to simulate/synthesize a device that contains from

1 to 8 LSPs. LSP0 through LSP4 are controlled via Mode

Register0 and LSP5 through LSP7 are controlled via Mode

Register1. The silicon version of the 'STA111 is

synthesized with three LSPs, LSP0 through LSP2.

•Number of Address Pins: The 'STA111 has a selectable

number of address bits (S0 - Sn, where n can range from

5 to 7). Addresses 3A through 3F hex are reserved for

address interrogation, broadcast and multi-cast

addressing. The silicon version of the 'STA111 is

synthesized with seven address pins.

•Pass-Through Pins: Each of the LSPs (0-n) may

selectively have or not have Pass-through pins. Pass-

through pins are described in more detail below. The

silicon version of the 'STA111 is synthesized with Pass-

through pins on LSP0 and LSP1.

www.national.com 20

SCANSTA111

•Number/Type of GPIO bits: The 'STA111 has both

dedicated and shared GPIO (General Purpose I/O). Each

dedicated group of GPIO bits supports from 0 to 4

dedicated inputs and 0 to 4 dedicated outputs. There are

provisions for specifying the default (power-up) value.

TMS(0-n), TDO(0-n) and TDI(0-n) are also dual purpose pins

functioning as LSP or GPIO. TMSn and TDOn are outputs,

TDIn is an input in the GPIO mode. The silicon version of

the 'STA111 is synthesized with shared GPIO on all three

available LSPs. The silicon version of the 'STA111 does

not support dedicated GPIO.

Throughout this datasheet, notations exist to clarify the dif-

ferences between features available on the Silicon version

and the HDL version.

KNOWN POWER-UP STATE

The 'STA111 has a known power-up condition. This is the

same state that the device is in after a TRST reset. This hap-

pens at power-up without the presence of a TCKB.

Reset can also occur via a 5 TMS high reset or a SOFTRE-

SET command.

POWER-OFF HIGH IMPEDANCE INPUTS AND OUTPUTS

The 'STA111 backplane test port features power-off high

impedance inputs and outputs.

The TDIB, TMSB, and TRSTB inputs have a 25KΩ pull-up re-

sistor and no ESD clamp diode (ESD is controlled with an

alternate method). When the device is power-off (VDD float-

ing), these inputs appear to be a capacitive load to ground.

When VDD = 0V (i.e.; not floating but tied to VSS) these inputs

appear to be capacitive with the pull-up to ground.

The TCKB input has no pull-up resistor and no ESD clamp

diode (ESD is controlled with an alternate method). When the

device is power-off (VDD floating), the input appears to be a

capacitive load to ground. When VDD = 0V (i.e.; not floating

but tied to VSS) the input appears to be a capacitive load to

ground.

When the device is power-off (VDD = 0V or floating), the

TDOB output appears to be a capacitive load.

Refer to the device IBIS model on our website for more details

about the I/O characteristics at http://www.national.com/ap-

pinfo/scan/ibis.html.

TRST

TRSTB: Assertion of TRSTB will return the device back to its

known power-up state.

TRSTn: TRSTn is an output on the LSP side of the 'STA111.

While the LSP state-machine (level 2 protocol) is in the

Parked-TLR state the TRSTn pin will be driven low. In all other

states the TRSTn pin will be driven high.

PHYSICAL LAYER CHANGES

TRIST for TDOB and TDOn are signals for enabling an exter-

nal buffer circuit between the 'STA111 and the backplane/

LSP. This would allow, for example, a CMOS-to-LVDS con-

verter to drive an LVDS JTAG backplane test bus. These

signals are always driving. A separate TRIST is provided for

each LSP to report a TRI-STATE on TDO when the LSP is

not in a shift state.

SVF DRIVEN, SELF-CHECKING TEST BENCH

The 'STA111 consists of 3 types of pins, dot1 backplane pins,

dot1 LSP pins and support pins. The command interpreter of

the test bench is able to translate a limited set of SVF com-

mands to the dot1 backplane pins. The SVF shift commands

contain both the stimulus (TDIB) and expected response

(TDOB).

The interpreter is able to parse the following commands:

ENDDR, ENDIR, RUNTEST, SDR, SIR, STATE, TRST.

PASS-THROUGH PINS

Each LSP may selectively have two pass-through pins. The

pair of pass-through pins consist of an input (An) and an out-

put (Yn). The LSP pass-through output (Yn) drives the level

being received by the backplane pass-through input (AB).

Conversely, the level on the LSP pass-through input (An)

drives the backplane pass-through output (YB).

The Pass-through pins are available only when a single LSP

is selected. For each LSP these pins will be enabled when the

level 2 protocol state-machine is not in the Parked-TLR state.

When not enabled they are TRI-STATED.

LSP GATING

While the LSP state-machine (level 2 protocol) is in the

Parked-TLR state, the four LSP signals shall be controlled as

shown in Table 14 below. Upon entry into the Parked-TLR

state (power-up, reset, PARKTLR or GOTOWAIT) a counter

in the LSP state-machine allows 512 TCKB clock pulses to

occur on TCKn before gating. Once gated, TCKn will drive a

logic 0.

Letting 512 TCKB pulses pass through to TCKn allows a five

high TMS reset to occur on over 100 levels of hierarchy before

the 'STA111 gates TCKn (for power saving in a free-running

clock system).

TABLE 14. Gated LSP Drive States

LSP

Connection

Drive State

TDOnPull-up resistor to provide a weak HIGH

TMSnPull-up resistor to provide a weak HIGH

TDInPull-up resistor to provide a weak HIGH

TCKnTCKB for 512 pulses, then gated LOW

The 'STA111 does not require that any clock pulses are re-

ceived on TCKB while in the Parked-TLR state.

Setting Bit 3 of Mode Register0 to 1 gates TCKn when in the

Parked-RTI, Parked-Pause-DR and Parked-Pause-IR states.

Default is free-running (bit 3 = 0). The value stored in bit 3 of

Mode Register0 does not effect the requirement of 512 clock

pulses before gating TCKn in the Parked-TLR state. (See

section on Mode Register0).

IEEE 1149.4 SUPPORT

The 'STA111 provides support for a switched analog bus.

Each LSP has an unparked-TLR notification pin (LSP_AC-

TIVE(0-2)) which is low (0) when the LSP is in Parked-TLR and

high (1) otherwise. This signal can be used to enable/disable

analog switches external to the 'STA111.

GPIO CONNECTIONS

General Purpose I/O (GPIO) pins are registered inputs and

outputs that are parameterized in the HDL. The two types of

GPIOs than can be used in the 'STA111 are described in the

next two sections. The silicon version of the 'STA111 supports

shared GPIO on all three available LSPs. The silicon version

of the 'STA111 does not support dedicated GPIO.

DEDICATED: Each LSP supports up to four (4) dedicated in-

puts and up to four (4) dedicated outputs. These are separate,

dedicated GPIO signals controlled by dedicated GPIO regis-

ters (one register per LSP). The GPIO outputs are updated

21 www.national.com

SCANSTA111

during the UPDATE-DR state and the GPIO input values are

written to the corresponding GPIO register during the CAP-

TURE-DR state. Dedicated GPIO operation is not supported

in the silicon version of the 'STA111.

LSP SHARED: In the shared mode of operation, the dot1 LSP

pins TDIn, TDOn and TMSn pins become GPIO pins. TMSn

and TDOn are outputs, TDIn is an input in the GPIO mode.

The sequence of operations to use shared GPIOs on an LSP

are as follows (example uses LSP0):

1. IR-Scan the 'STA111 address into the instruction register

(address a 'STA111).

2. IR-Scan the MODESEL3 instruction into the instruction

configuration register) as the data register.

3. DR-Scan 00000001 into Mode Register3 to enable

GPIOs on LSP0. The GPIOs will be enabled when the

TAP enters the RTI state at the end of this shift operation

(TDO0 and TMS0 will be forced to logic 0 as defined by

the default value in the Shared GPIO Register0).

4. IR-Scan the SGPIO0 instruction into the instruction

5. DR-Scan 00000011 into the Shared GPIO Register0 to

set TDO0 and TMS0 to a logic 1 (when TAP enters

Update-DR). During this operation, when the TAP enters

Capture-DR, the present value on the TDI0 pin and the

values of TDO0 and TMS0 (as set by Shared GPIO

Register0) will be captured into bits 2, 1 and 0 of the shift

present on TDI0 when TAP enters Capture-DR).

6. Step 5 can be repeated to generate waveforms on

TDO0 and TMS0. If step 5 was repeated with 00000000

as data, TDO0 and TMS0 would be set to a logic 0 (when

TAP state = Update-DR) and 00000X11 would be

scanned out (X = value present on TDI0 when TAP enters

Capture-DR).

7. IR-Scan the GOTOWAIT or SOFTRESET instruction, or

generate a TRSTB reset to disable the GPIOs.

ADDRESS INTERROGATION

The 'STA111 has four states that it can go to from the Wait-

For-Address state: Unselected, Singularly-selected, Multi/

Broadcast-selected, and Address-interrogation (see Figure

13).

After a reset (or GOTOWAIT command) has been issued, the

'STA111 TAP is sequenced to the Capture-IR state where

XXXXXX01 is loaded into the shift register. Upon entering the

Shift-IR state, the instruction register is filled with the address

interrogation value (3A hex) which is loaded into the address

On the next loop through Capture-IR the shift register is load-

ed with the ones-complement of the slot address. In the Shift-

IR state the address interrogation value is loaded into the

instruction register. The value presented on TDOB will be a

wired-and address of all of the 'STA111s on the bus. As this

value is being shifted out, each 'STA111 will monitor its

TDOB to see if it is receiving the same value it is driving. If the

device shifts all bits of its ones-complement address and nev-

er gets a compare error it will tri-state TDOB and go to the

Wait-For-Reset state. Alternately, if the device sees a com-

pare error while it is shifting its ones-complement address it

will stop shifting its address and tri-state TDOB until the next

shift operation; during the next Shift-IR operation it will again

try to present its address (if the previous instruction was 3A

hex) while monitoring TDOB.

Shifting 3A hex into the instruction registers of the 'STA111s

will continue until all 'STA111s have presented their address.

At this time all devices will be waiting to be reset, and if a 3A

is shifted into the 'STA111 instruction registers the address

read by the tester will be all weak 1s due to all TDOB's being

tri-stated. Reading all ones will signal the tester that address

interrogation is complete. Since all ones signifies the end of

Address-Interrogation, no device can have an address of all

zeros (ones-complement).

If at any time, during the address interrogation mode, any

other instruction besides 3A hex is shifted into the instruction

Also, the 'STA111's state machine will go to the Wait-For-Ad-

dress state.

This address interrogation scheme presumes that TDOB is

capable of driving a weak 1 and that an 'STA111 driving a 0

will overdrive an 'STA111 driving a weak 1.

The following is an example of the Address-Interrogation

function. Assume there are three 'STA111s (U1, U2 and U3)

on a dot1 backplane with slot addresses 010100, 100000 and

000001 respectively (assuming 6 address pins).

1. The 'STA111s are reset and the interrogation address/

op-code (3A hex) is shifted into the instruction registers.

2. At the end of the instruction shift (Update-IR) the 'STA111

address registers are loaded with 3A hex.

3. The TAPs are sequenced to Capture-IR and the shift

registers latch the ones-complement slot addresses

(U1=101011, U2=011111 and U3=111110).

4. The TAPs are sequenced to Shift-IR and the LSB of the

interrogation address is presented on the TDIB's.

Concurrently, the LSBs of the ones-complement slot

addresses are presented on the respective TDOB's.

5. The weak 1 being driven on U1 and U2 is overdriven by

the 0 from U3. U1 and U2 enter the Wait-For-Next-

Interrogation state.

6. The shift operation continues and U3 finishes shifting its

ones-complement address (111110) out on TDOB. U3

enters the Wait-For-Reset state when the TAP enters

Update-IR.

7. The TAPs are again sequenced to Capture-IR and U1

and U2 shift registers latch the ones-complement

addresses (U1=101011, U2=011111).

8. The TAPs are sequenced to Shift-IR and the LSB of the

interrogation address is presented on the TDIB's.

Concurrently, the LSBs of the ones-complement

addresses are presented on the respective TDOB's.

9. Since both U1 and U2 are driving a weak 1 the shift

continues.

10. Again U1 and U2 drive weak 1 and the shift continues.

11. U2s weak 1 is overdriven by U1s 0 and U2 enters the

Wait-For-Next-Interrogation state.

12. The shift operation continues and U1 finishes shifting its

ones-complement address (101011) out on TDOB. U1

enters theWait-For-Reset state.

13. The instruction shift operation is repeated and U2 shifts

its ones-complement address (011111) out on TDOB. U2

enters the Wait-For-Reset state.

14. The instruction shift operation is repeated, however, all

devices have been interrogated and are waiting for a

reset. The master device will receive all ones. This

implies that there can not be an STA111 with address 0!

www.national.com 22

SCANSTA111

10124504

FIGURE 13. Address Interrogation State Machine

23 www.national.com

SCANSTA111

Absolute Maximum Ratings (Note 9)

Supply Voltage (VCC)−0.3V to +4.0V

DC Input Diode Current (IIK)

VI = −0.5V −20 mA

DC Input Voltage (VI)−0.5V to +3.9V

DC Output Diode Current (IOK)

VO = −0.5V −20 mA

DC Output Voltage (VO)−0.3V to +3.9V

DC Output Source/Sink Current (IO)±50 mA

DC VCC or Ground Current ±50 mA

per Output Pin

DC Latchup Source or Sink Current ±300 mA

Junction Temperature (Plastic) +150°C

Storage Temperature −65°C to +150°C

Lead Temperature (Solder, 4sec)

49L BGA 235°C

48L TSSOP 260°C

Max Pkg Power Capacity @ 25°C

49L BGA 1.47 W

48L TSSOP 1.47 W

Thermal Resistance (θJA)

49L BGA 85°C/W

48L TSSOP 85°C/W

Package Derating 11.8 mW/°C above

25°C

ESD Last Passing Voltage (Min)

I/O 2000V

Inputs 1000V

Recommended Operating

Conditions

Supply Voltage (VCC)

'STA111 3.0V to 3.6V

Input Voltage (VI) 0V to VCC

Output Voltage (VO) 0V to VCC

Operating Temperature (TA)

Industrial −40°C to +85°C

Note 9: Absolute maximum ratings are those values beyond which damage

to the device may occur. The databook specifications should be met, without

exception, to ensure that the system design is reliable over its power supply,

temperature, and output/input loading variables. National does not

recommend operation of SCAN STA products outside of recommended

operation conditions.

DC Electrical Characteristics

Over recommended operating supply voltage and temperature ranges unless otherwise specified

Symbol Parameter Conditions Min Max Units

VIH Minimum High Input Voltage VOUT = 0.1V or VCC −0.1V 2.1 V

VIL Maximum Low Input Voltage VOUT = 0.1V or 0.8 V

VCC −0.1V

VOH Minimum High Output Voltage IOUT = −100 μAVCC - 0.2v V

(TDOB, TCK(0-2), TMS(0-2), TDO(0-2), Y(0-1)) VIN (TDIB, TMSB, TCKB) =

VIH

VOH Minimum High Output Voltage IOUT = −24 mA, VIN on 2.2 V

(TDOB, TCK(0-2), TMS(0-2), TDO(0-2), Y(0-1), YB, TRST

(0-2))

S(0-6) and TDl(0-2) = VIH,

VILAll Outputs Loaded

VOH Minimum High Output Voltage IOUT = −100μAVCC - 0.2v V

(TRISTB, TRIST(0-2), YB)

VOH Minimum High Output Voltage IOUT = −12mA. 2.4 V

(TRISTB, TRIST(0-2), LSP_ACTIVE(0-2)) All Outputs Loaded

VOL Maximum Low Output Voltage IOUT = +100 μA, VIN 0.2 V

(TDOB, TCK(0-2), TMS(0-2), TDO(0-2), Y(0-1)) (TDIB, TMSB, TCKB) = VIL

VOL Maximum Low Output Voltage IOUT = +24 mA, VIN on 0.55 V

(TDOB, TCK(0-2), TMS(0-2), TDO(0-2), Y(0-1), YB, TRST

(0-2))

S(0–6) and TDI(0-2) = V IH,

VIL, All Outputs Loaded

VOL Maximum Low Output Voltage IOUT = +100 μA 0.2 V

(TRISTB, TRIST(0-2), YB)

www.national.com 24

SCANSTA111

Symbol Parameter Conditions Min Max Units

VOL Maximum Low Output Voltage IOUT = +12 mA 0.4 V

(TRISTB, TRIST(0-2), LSP_ACTIVE(0-2)) All Outputs Loaded

IIN Maximum Input Leakage Current VIN = VCC or GND ±5.0 μA

(TCKB, S(0-6))

ICCT Maximum ICC/Input VIN = VCC − 0.6V 250 µA

ICC Maximum Quiescent Supply Current TDIB, TMSB, TRSTB, TDI

(0-2) = VCC or GND 1.65 mA

ICCD Maximum Dynamic Supply Current 130 mA

IOFF Power Off Leakage Current VCC = GND, VIN = 3.6V ±5.0 µA

TDOB, TCK(0-2), TMS(0-2), TDO(0-2), TRST(0-2)

IILR TDI(0-2), TDIB, OE, TRSTB, A(0-1), AB, TMSBVIN = GND -45 -180 µA

IIH TDI(0-2), TDIB, OE, TRSTB, A(0-1), AB, TMSBVIN = VCC +5.0 µA

IOZ Maximum TRI-STATE Leakage Current VIN (OE) = VIH, VIN

(TRSTB) = VIL, VO = VCC,

GND

±5.0 μA

AC Electrical Characteristics

Over recommended operating supply voltage and temperature ranges unless otherwise specified.

Symbol Parameter Conditions Typ Max Units

tPHL1, Propagation Delay 8.0 12.0 ns

tPLH1 TCKB to TCK(0-2)

tPHL2, Propagation Delay 11.5 16.0 ns

tPLH2 TCKB to TDO(0-2)

tPLH3 Propagation Delay 13.5 19.0 ns

TRSTB to TMS(0-2)

tPHL4 Propagation Delay 13.0 19.0 ns

TRSTB to TRST(0-2)

tPHL5, Propagation Delay 10.5 15.0 ns

tPLH5 TCKB to TDOB

tPHL6, Propagation Delay 5.0 9.0 ns

tPLH6 AB to Y(0-1)

tPHL7, Propagation Delay 6.5 10.0 ns

tPLH7 A(0-1) to YB

tPHL8, Propagation Delay 13.0 19.0 ns

tPLH8 TCKB to LSP_ACTIVE(0-2)

tPZL9, Enable Time 12.0 17.0 ns

tPZH9 TCKB to TDO(0-2)

tPLZ10, Disable Time 11.5 16.0 ns

tPHZ10 TCKB to TDO(0-2)

tPHL11, Propagation Delay 11.5 17.0 ns

tPLH11 TCKB to TRIST(0-2)

tPZL12, Enable Time 12.5 17.0 ns

tPZH12 TCKB to TDOB

tPLZ13, Disable Time 12.5 17.0 ns

tPHZ13 TCKB to TDOB

tPHL14, Propagation Delay 12.5 18.0 ns

tPLH14 TCKB to TRISTB

25 www.national.com

SCANSTA111

Symbol Parameter Conditions Typ Max Units

tPHL15, Propagation Delay 7.0 11.0 ns

tPLH15 TMSB to TMS(0-2)

tPHL16, Propagation Delay 7.0 11.0 ns

tPLH16 TDIB to TDO(0-2)

tPZL17, Enable Time 7.5 11.0 ns

tPZH17 OE to TMS(0-2)

tPLZ17, Disable Time 5.0 10.0 ns

tPHZ17 OE to TMS(0-2)

tPZL18, Enable Time 8.0 11.0 ns

tPZH18 OE to TRST(0-2)

tPLZ18, Disable Time 6.5 10.0 ns

tPHZ18 OE to TRST(0-2)

tPZL19, Enable Time 8.5 12.0 ns

tPZH19 OE to TDO(0-2)

tPLZ19, Disable Time 7.5 12.0 ns

tPHZ19 OE to TDO(0-2)

tPHL20, Propagation Delay 8.0 13.0 ns

tPLH20 OE to TRIST(0-2)

tPZL21, Enable Time 7.5 11.0 ns

tPZH21 OE to TCK(0-2)

tPLZ21, Disable Time 6.5 10.0 ns

tPHZ21 OE to TCK(0-2)

AC Electrical Characteristics

Over recommended operating supply voltage and temperature ranges unless otherwise specified.

Symbol Parameter Conditions Min Units

tSSetup Time 2.0 ns

TMSB to TCKB↑

tHHold Time 1.0 ns

TMSB to TCKB↑

tSSetup Time 2.0 ns

TDIB to TCKB↑

tHHold Time 1.0 ns

TDIB to TCKB↑

tSSetup Time 1.5 ns

TDI(0-2) to TCKB↑

tHHold Time 1.5 ns

TDI(0-2) to TCKB↑

tWClock Pulse Width 10.0 ns

TCKB (H or L)

tWL Reset Pulse Width 2.5 ns

TRSTB (L)

tREC Recovery Time 2.0 ns

TCKB↑ from TRSTB

FMAX Maximum Clock Frequency 25.0 MHz

www.national.com 26

SCANSTA111

AC Loading and Waveforms

10124520

FIGURE 14. AC Test Circuit (CL includes probe and jig capacitance)

VICL

6.0V 50pF

AC Waveforms

10124536

FIGURE 15. Waveforms for an Unparked STA111 in the Shift-DR (IR) TAP Controller State

27 www.national.com

SCANSTA111

10124538

FIGURE 16. Reset Waveforms

10124539

FIGURE 17. Output Enable Waveforms

10124521

Waveform for Inverting and Non-inverting Functions

10124522

TRI-STATE Output High Enable and Disable Times for Logic

10124523

Propagation Delay, Pulse Width and tREC Waveforms

10124524

TRI-STATE Output Low Enable and Disable Times for Logic

FIGURE 18. Timing Waveforms

(Input Characteristics; f = 1MHz, tr = tf = 2.5ns)

www.national.com 28

SCANSTA111

Symbol VCC

2.7 - 3.6V

VIN(H) 2.7V

Vmi 1.5V

Vmo 1.5V

VxVOL + 0.3V

VyVOH - 0.3V

Capacitance & I/O Characteristics

Refer to National's website for IBIS models at http://www.national.com/scan

Revision History

February, 2010 – Revisions to clarify shared GPIO operation

in the silicon version. No specification changes or changes to

operation.

29 www.national.com

SCANSTA111

Physical Dimensions inches (millimeters) unless otherwise noted

48-Pin TSSOP

NS Package Number MTD48

Ordering Code SCANSTA111MT

49-Pin BGA

NS Package Number SLC49a

Ordering Code SCANSTA111SM

www.national.com 30

SCANSTA111

Notes

31 www.national.com

SCANSTA111

Notes

SCANSTA111 Enhanced SCAN Bridge Multidrop Addressable IEEE 1149.1 (JTAG) Port

For more National Semiconductor product information and proven design tools, visit the following Web sites at:

www.national.com

Products Design Support

Amplifiers www.national.com/amplifiers WEBENCH® Tools www.national.com/webench

Audio www.national.com/audio App Notes www.national.com/appnotes

Clock and Timing www.national.com/timing Reference Designs www.national.com/refdesigns

Data Converters www.national.com/adc Samples www.national.com/samples

Interface www.national.com/interface Eval Boards www.national.com/evalboards

LVDS www.national.com/lvds Packaging www.national.com/packaging

Power Management www.national.com/power Green Compliance www.national.com/quality/green

Switching Regulators www.national.com/switchers Distributors www.national.com/contacts

LDOs www.national.com/ldo Quality and Reliability www.national.com/quality

LED Lighting www.national.com/led Feedback/Support www.national.com/feedback

Voltage References www.national.com/vref Design Made Easy www.national.com/easy

PowerWise® Solutions www.national.com/powerwise Applications & Markets www.national.com/solutions

Serial Digital Interface (SDI) www.national.com/sdi Mil/Aero www.national.com/milaero

Temperature Sensors www.national.com/tempsensors SolarMagic™ www.national.com/solarmagic

PLL/VCO www.national.com/wireless PowerWise® Design

University

www.national.com/training

THE CONTENTS OF THIS DOCUMENT ARE PROVIDED IN CONNECTION WITH NATIONAL SEMICONDUCTOR CORPORATION

(“NATIONAL”) PRODUCTS. NATIONAL MAKES NO REPRESENTATIONS OR WARRANTIES WITH RESPECT TO THE ACCURACY

OR COMPLETENESS OF THE CONTENTS OF THIS PUBLICATION AND RESERVES THE RIGHT TO MAKE CHANGES TO

SPECIFICATIONS AND PRODUCT DESCRIPTIONS AT ANY TIME WITHOUT NOTICE. NO LICENSE, WHETHER EXPRESS,

IMPLIED, ARISING BY ESTOPPEL OR OTHERWISE, TO ANY INTELLECTUAL PROPERTY RIGHTS IS GRANTED BY THIS

DOCUMENT.

TESTING AND OTHER QUALITY CONTROLS ARE USED TO THE EXTENT NATIONAL DEEMS NECESSARY TO SUPPORT

NATIONAL’S PRODUCT WARRANTY. EXCEPT WHERE MANDATED BY GOVERNMENT REQUIREMENTS, TESTING OF ALL

PARAMETERS OF EACH PRODUCT IS NOT NECESSARILY PERFORMED. NATIONAL ASSUMES NO LIABILITY FOR

APPLICATIONS ASSISTANCE OR BUYER PRODUCT DESIGN. BUYERS ARE RESPONSIBLE FOR THEIR PRODUCTS AND

APPLICATIONS USING NATIONAL COMPONENTS. PRIOR TO USING OR DISTRIBUTING ANY PRODUCTS THAT INCLUDE

NATIONAL COMPONENTS, BUYERS SHOULD PROVIDE ADEQUATE DESIGN, TESTING AND OPERATING SAFEGUARDS.

EXCEPT AS PROVIDED IN NATIONAL’S TERMS AND CONDITIONS OF SALE FOR SUCH PRODUCTS, NATIONAL ASSUMES NO

LIABILITY WHATSOEVER, AND NATIONAL DISCLAIMS ANY EXPRESS OR IMPLIED WARRANTY RELATING TO THE SALE

AND/OR USE OF NATIONAL PRODUCTS INCLUDING LIABILITY OR WARRANTIES RELATING TO FITNESS FOR A PARTICULAR

PURPOSE, MERCHANTABILITY, OR INFRINGEMENT OF ANY PATENT, COPYRIGHT OR OTHER INTELLECTUAL PROPERTY

RIGHT.

LIFE SUPPORT POLICY

NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR

SYSTEMS WITHOUT THE EXPRESS PRIOR WRITTEN APPROVAL OF THE CHIEF EXECUTIVE OFFICER AND GENERAL

COUNSEL OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein:

Life support devices or systems are devices which (a) are intended for surgical implant into the body, or (b) support or sustain life and

whose failure to perform when properly used in accordance with instructions for use provided in the labeling can be reasonably expected

to result in a significant injury to the user. A critical component is any component in a life support device or system whose failure to perform

can be reasonably expected to cause the failure of the life support device or system or to affect its safety or effectiveness.

National Semiconductor and the National Semiconductor logo are registered trademarks of National Semiconductor Corporation. All other

brand or product names may be trademarks or registered trademarks of their respective holders.

For the most current product information visit us at www.national.com

National Semiconductor

Americas Technical

Support Center

Email: support@nsc.com

Tel: 1-800-272-9959

National Semiconductor Europe

Technical Support Center

Email: europe.support@nsc.com

National Semiconductor Asia

Pacific Technical Support Center

Email: ap.support@nsc.com

National Semiconductor Japan

Technical Support Center

Email: jpn.feedback@nsc.com

www.national.com

IMPORTANT NOTICE

Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, modifications, enhancements, improvements,

and other changes to its products and services at any time and to discontinue any product or service without notice. Customers should

obtain the latest relevant information before placing orders and should verify that such information is current and complete. All products are

sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment.

TI warrants performance of its hardware products to the specifications applicable at the time of sale in accordance with TI’s standard

warranty. Testing and other quality control techniques are used to the extent TI deems necessary to support this warranty. Except where

mandated by government requirements, testing of all parameters of each product is not necessarily performed.

TI assumes no liability for applications assistance or customer product design. Customers are responsible for their products and

applications using TI components. To minimize the risks associated with customer products and applications, customers should provide

adequate design and operating safeguards.

TI does not warrant or represent that any license, either express or implied, is granted under any TI patent right, copyright, mask work right,

or other TI intellectual property right relating to any combination, machine, or process in which TI products or services are used. Information

published by TI regarding third-party products or services does not constitute a license from TI to use such products or services or a

warranty or endorsement thereof. Use of such information may require a license from a third party under the patents or other intellectual

property of the third party, or a license from TI under the patents or other intellectual property of TI.

Reproduction of TI information in TI data books or data sheets is permissible only if reproduction is without alteration and is accompanied

by all associated warranties, conditions, limitations, and notices. Reproduction of this information with alteration is an unfair and deceptive

business practice. TI is not responsible or liable for such altered documentation. Information of third parties may be subject to additional

restrictions.

Resale of TI products or services with statements different from or beyond the parameters stated by TI for that product or service voids all

express and any implied warranties for the associated TI product or service and is an unfair and deceptive business practice. TI is not

responsible or liable for any such statements.

TI products are not authorized for use in safety-critical applications (such as life support) where a failure of the TI product would reasonably

be expected to cause severe personal injury or death, unless officers of the parties have executed an agreement specifically governing

such use. Buyers represent that they have all necessary expertise in the safety and regulatory ramifications of their applications, and

acknowledge and agree that they are solely responsible for all legal, regulatory and safety-related requirements concerning their products

and any use of TI products in such safety-critical applications, notwithstanding any applications-related information or support that may be

provided by TI. Further, Buyers must fully indemnify TI and its representatives against any damages arising out of the use of TI products in

such safety-critical applications.

TI products are neither designed nor intended for use in military/aerospace applications or environments unless the TI products are

specifically designated by TI as military-grade or "enhanced plastic."Only products designated by TI as military-grade meet military

specifications. Buyers acknowledge and agree that any such use of TI products which TI has not designated as military-grade is solely at

the Buyer's risk, and that they are solely responsible for compliance with all legal and regulatory requirements in connection with such use.

TI products are neither designed nor intended for use in automotive applications or environments unless the specific TI products are

designated by TI as compliant with ISO/TS 16949 requirements. Buyers acknowledge and agree that, if they use any non-designated

products in automotive applications, TI will not be responsible for any failure to meet such requirements.

Following are URLs where you can obtain information on other Texas Instruments products and application solutions:

Products Applications

Audio www.ti.com/audio Communications and Telecom www.ti.com/communications

Amplifiers amplifier.ti.com Computers and Peripherals www.ti.com/computers

Data Converters dataconverter.ti.com Consumer Electronics www.ti.com/consumer-apps

DLP®Products www.dlp.com Energy and Lighting www.ti.com/energy

DSP dsp.ti.com Industrial www.ti.com/industrial

Clocks and Timers www.ti.com/clocks Medical www.ti.com/medical

Interface interface.ti.com Security www.ti.com/security

Logic logic.ti.com Space, Avionics and Defense www.ti.com/space-avionics-defense

Power Mgmt power.ti.com Transportation and Automotive www.ti.com/automotive

Microcontrollers microcontroller.ti.com Video and Imaging www.ti.com/video

RFID www.ti-rfid.com

OMAP Mobile Processors www.ti.com/omap

Wireless Connectivity www.ti.com/wirelessconnectivity

TI E2E Community Home Page e2e.ti.com

Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265