INCH-POUND MIL-M-38510/1F 16 March 2005 SUPERSEDING MIL-M-38510/1E 1 June 1982 MILITARY SPECIFICATION MICROCIRCUITS, DIGITAL, TTL, NAND GATES, MONOLITHIC SILICON This specification is approved for use by all Departments and Agencies of the Department of Defense. The requirements for acquiring the product herein shall consist of this specification sheet and MIL-PRF 38535 1. SCOPE 1.1 Scope. This specification covers the detail requirements for monolithic silicon, TTL, positive NAND logic gating microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, (see 6.3). 1.2 Part or Identifying Number (PIN). The PIN is in accordance with MIL-PRF-38535, and as specified herein. 1.2.1 Device types. The device types are as follows: Device type 01 02 03 04 05 06 07 08 09 Circuit Single, 8-input positive NAND gate Dual, 4-input positive NAND gate Triple, 3-input positive NAND gate Quadruple, 2-input positive NAND gate Hex, 1-input inverter gate Triple, 3-input positive NAND gate (open collector output) Quadruple, 2-input positive NAND gate (open collector output) Hex, 1-input inverter gate (open collector output) Same as device type 07, except different pin connections 1.2.2 Device class. The device class is the product assurance level as defined in MIL-PRF-38535. 1.2.3 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style A B C D GDFP5-F14 or CDFP6-F14 GDFP4-F14 GDIP1-T14 or CDIP2-T14 GDFP1-F14 or CDFP2-F14 14 14 14 14 Flat Flat Dual-in-line Flat Comments, suggestions, or questions on this document should be addressed to: Commander, Defense Supply Center Columbus, ATTN: DSCC-VAS, P.O. Box 3990, Columbus, OH 43218-3990, or emailed to bipolar@dla.mil . Since contact information can change, you may want to verify the currency of this address information using the ASSIST Online database at http://assist.daps.dla.mil . AMSC N/A FSC 5962 MIL-M-38510/1F 1.3 Absolute maximum ratings. Supply voltage range .............................................................................. -0.5 V to +7.0 V Input voltage range ................................................................................. -1.5 V at -12 mA to +5.5 V Storage temperature range .................................................................... -65 to +150C Maximum power dissipation per gate (PD) 1/.......................................... 40 mW Lead temperature (soldering, 10 seconds) ............................................. 300C Thermal resistance, junction to case (JC) ............................................. (See MIL-STD-1835) Junction temperature (TJ) 2/ ................................................................... 175C 1.4 Recommended operating conditions. Supply voltage........................................................................................ +4.5 V minimum to +5.5 V maximum Minimum high level input voltage .......................................................... +2.0 V Maximum low level input voltage (VIL) ................................................... +0.8 V Normalized fanout (each output) 3/ ........................................................ 10 maximum Case operating temperature range ......................................................... -55 to +125C _______ 1/ Must withstand the added PD due to short-circuit test (e.g., IOS). 2/ Maximum junction temperature shall not be exceeded except for allowable short duration burn-in screening conditions in accordance with MIL-PRF-38535. 3/ Device will fanout in both high and low levels to the specified number of inputs of the same device type as that being tested. 2 MIL-M-38510/1F 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This section does not include documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this specification, whether or not they are listed. 2.2 Government documents. 2.2.1 Specifications and Standards. The following specifications and standards form a part of this specification to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38535 - Integrated Circuits (Microcircuits) Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 MIL-STD-1835 - Test Method Standard for Microelectronics. Interface Standard Electronic Component Case Outlines (Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or http://assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3 Order of precedence. In the event of a conflict between the text of this specification and the references cited herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before contract award (see 4.3 and 6.4). 3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein. 3.3.1 Terminal connections and logic diagrams. The terminal connections and logic diagrams shall be as specified on figure 1. 3.3.2 Truth tables and logic equations. The truth tables and logic equations shall be as specified on figure 2. 3.3.3 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available to the qualifying activity and the preparing activity upon request. 3.3.4 Case outlines. The case outlines shall be as specified in 1.2.3. 3.4 Lead material and finish. The lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6). 3.5 Electrical performance characteristics. The electrical performance characteristics are as specified in table I, and apply over the full recommended case operating temperature range, unless otherwise specified. 3 MIL-M-38510/1F TABLE I. Electrical performance characteristics. Test Symbol Conditions Device -55C TC +125C High level output VOH voltage Limits Unit types Min Max VCC = 4.5 V, VIN = 0.8 V, 01, 02, 2.4 --- V IOH = -400 A 1/ 03, 04, All 0.4 V All -1.5 V VCC = 4.5 V, VIN = 0.8 V, 06, 07 250 A VOH = 5.5 V 08, 09 05 Low level output VOL voltage VCC = 4.5 V, IOL = 16 mA, VIN = 2.0 V for all inputs of gate under test Input clamp voltage VI C 1/ VCC = 4.5 V, IIN = -12 mA TC = 25C Maximum collector ICEX cut-off current High level input IIH1 VCC = 5.5 V, VIN = 2.4 V 2/ All 40 A IIH2 VCC = 5.5 V, VIN = 5.5 V 2/ All 100 A IIL VCC = 5.5 V, VIN = 0.4 V 1/ All -0.7 -1.6 mA 01, 02, -20 -55 mA All 1.65 mA All 5.0 mA 3 24 ns 3 29 ns 3 27 ns 3 35 ns current High level input current Low level input current Short circuit output I OS VCC = 5.5 V 2/ 3/ current 03, 04, 05 High level supply I CCH VCC = 5.5 V, VIN = 0 V 2/ I CCL VCC = 5.5 V, VIN = 5.5 V tPHL CL = 50 pF, 01, 02, RL = 390 03, 04, current per gate Low level supply 1/ current per gate Propagation delay time, high-to-low level 05 06, 07, 08, 09 Propagation delay time, low-to-high level tPLH CL = 50 pF, 01, 02, RL = 390 03, 04, 05 06, 07, 08, 09 1/ 2/ 3/ All unspecified inputs at 5.5 volts. All unspecified inputs grounded. Not more than one output should be shorted at a time. 4 MIL-M-38510/1F 3.6 Electrical test requirements. The electrical test requirements for each device class shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table III. TABLE II. Electrical test requirements. Subgroups (see table III) MIL-PRF-38535 test requirements Class S devices 1 Class B devices 1 1*, 2, 3, 9 10, 11 1, 2, 3, 9, 10, 11 1, 2, 3, 9, 10, 11 1, 2, 3, 9, 10, 11 N/A 1*, 2, 3, 9 Interim electrical parameters Final electrical test parameters Group A test requirements Group B electrical test parameters when using the method 5005 QCI option Group C end-point electrical parameters Additional electrical parameters for group C periodic inspections Group D end-point electrical parameters 1, 2, 3 1, 2, 3, 9 N/A 1, 2, 3 10, 11 1, 2, 3 *PDA applies to subgroup 1. 3.7 Marking. Marking shall be in accordance with MIL-PRF-38535. 3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 1 (see MIL-PRF-38535, appendix A). 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38535 and shall be conducted on all devices prior to qualification and conformance inspection. The following additional criteria shall apply: a. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical parameters test prior to burn-in is optional at the discretion of the manufacturer. c. Additional screening for space level product shall be as specified in MIL-PRF-38535, Appendix B. 5 MIL-M-38510/1F 4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535. 4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4). 4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7, and 8 shall be omitted. 4.4.2 Group B inspection. Group B inspection shall be in accordance with table II MIL-PRF-38535. 4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883. 4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End-point electrical parameters shall be as specified in table II herein. 4.5 Methods of inspection. Methods of inspection shall be as specified and as follows: 4.5.1 Voltage and current. All voltages given are referenced to the microcircuit ground terminal. Currents given are conventional and positive when flowing into the referenced terminal. 6 MIL-M-38510/1F FIGURE 1. Terminal connections and logic diagrams. 7 MIL-M-38510/1F FIGURE 1. Terminal connections and logic diagrams - Continued. 8 MIL-M-38510/1F FIGURE 1. Terminal connections and logic diagrams - Continued. 9 MIL-M-38510/1F A H B H Device type 01 Truth table Input C D E F G H H H H H H H All other combinations of H and L at the inputs give H output. Output Y L Positive logic Y = ABCDEFGH A L H L H L H L H Device types 03 and 06 Truth table Input Output B C Y L L H L L H H L H H L H L H H L H H H H H H H L Positive logic Y = ABC A L H L H L H L H L H L H L H L H Device type 02 Truth table Input B C D L L L L L L H L L H L L L H L L H L H H L H H L L L H L L H H L H H L H L H H L H H H H H H H H Device types 04, 07, and 09 Truth table each gate Input Output A B Y L L H H L H L H H H H L Output Y H H H H H H H H H H H H H H H L Positive logic Y = AB Device types 05 and 08 Truth table each gate Input Input A Y L H H L Positive logic Y = ABCD Positive logic Y = A FIGURE 2. Truth tables and logic equations. 10 MIL-M-38510/1F NOTES: 1. CL = 50 pF minimum, including scope probe, wiring and stray capacitance, without package in test fixture. 2. Voltage measurements are to be made with respect to network ground terminal. 3. All diode are 1N3064 or equivalent. 4. RL = 390 ohm 5%. FIGURE 3. Test circuit and switching waveforms. 11 TABLE III. Group A inspection for device type 01. Terminal conditions (pins not designated may be high 2.0 V, low 0.8 V or open) Symbol 12 8 6 F 2.0 V 5.5 V " " " " 0.8 V 5.5 V " GND GND " " " " 2.4 V GND " GND " " " " 5.5 V GND " 5.5 V " " " " 0.4 V 5.5 V " 5.5 V GND 9 11 G 2.0 V 5.5 V " " " " " 0.8 V 5.5 V GND GND " " " " " 2.4 V GND GND " " " " " 5.5 V GND 5.5 V " " " " " 0.4 V 5.5 V 5.5 V GND 10 12 H 2.0 V 5.5 V " " " " " " 0.8 V GND GND " " " " " " 2.4 V GND " " " " " " 5.5 V 5.5 V " " " " " " 0.4 V 5.5 V GND 12 8 Y 16mA -.4mA " " " " " " " GND -12 mA 11 7 GND GND GND " " " " " " " GND GND " " " " " " " GND " " " " " " " GND " " " " " " " GND GND GND " " " " " " " 2.4 V " 2.4 V " GND " GND " OUT " OUT " -12 mA -12 mA 2.4 V " 2.4 V " 2.4 V " 2.4 V " 13 9 NC 14 10 NC Measured terminal Y Y Y Y Y Y Y Y Y Y A B C D E F G H A B C D E F G H A B C D E F G H VCC VCC A B C D E F G H A to Y A to Y A to Y A to Y Limits Min Max 0.4 2.4 " " " " " " " -20 -55 40 " " " " " " " 100 " " " " " " " -0.7 -1.6 " " " " " " " " " " " " " " 5.0 1.65 -1.5 " " " " " " " 3 3 3 3 20 25 24 27 Unit V V " " " " " " " mA A " " " " " " " A " " " " " " " mA " " " " " " " mA mA V " " " " " " " ns ns ns ns MIL-M-38510/1F MIL-STD- Cases A, B, D 1 2 3 4 5 6 7 883 Case C 13 1 2 14 3 4 5 method Test no. NC A B VCC C D E 1 VOL 3007 1 2.0 V 2.0 V 4.5 V 2.0 V 2.0 V 2.0 V VOH 3006 2 0.8 V 5.5 V 4.5 V 5.5 V 5.5 V 5.5 V Tc = 25C 3 5.5 V 0.8 V " " " " 4 " 5.5 V " 0.8 V " " 5 " " " 5.5 V 0.8 V " 6 " " " " 5.5 V 0.8 V 7 " " " " " 5.5 V 8 " " " " " " 9 " " " " " " IOS 3011 10 GND GND 5.5 V GND GND GND IIH1 3010 11 2.4 V GND 5.5 V GND GND GND 12 GND 2.4 V " " " " 13 " GND " 2.4 V " " 14 " " " GND 2.4 V " 15 " " " " GND 2.4 V 16 " " " " " GND 17 " " " " " " 18 " " " " " " IIH2 3010 19 5.5 V GND 5.5 V GND GND GND 20 GND 5.5 V " " " " 21 " GND " 5.5 V " " 22 " " " GND 5.5 V " 23 " " " " GND 5.5 V 24 " " " " " GND 25 " " " " " " 26 " " " " " " IIL 3009 27 0.4 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 28 5.5 V 0.4 V " " " " 29 " 5.5 V " 0.4 V " " 30 " " " 5.5 V 0.4 V " 31 " " " " 5.5 V 0.4 V 32 " " " " " 5.5 V 33 " " " " " " 34 " " " " " " ICCL 3005 35 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V ICCH 3005 36 GND GND 5.5 V GND GND GND VI C 37 -12 mA 4.5 V 38 -12 mA " 39 " -12 mA 40 " -12 mA 41 " -12 mA 42 " 43 " 44 " 2 Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125C and VI C tests are omitted. 3 Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55C and VI C tests are omitted. 9 tPHL 3003 45 IN 2.4 V 5.0 V 2.4 V 2.4 V 2.4 V tPLH (Fig. 3) 46 " " " " " " Tc = 25C 10 tPHL 3003 47 IN 2.4 V 5.0 V 2.4 V 2.4 V 2.4 V tPLH (Fig. 3) 48 " " " " " " Tc = 125C 11 Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55C. Subgroup TABLE III. Group A inspection for device type 02. Terminal conditions (pins not designated may be high 2.0 V, low 0.8 V or open) Symbol 13 8 12 2C 5.5 V 2.0 V 5.5 V " " " " " 0.8 V 5.5 V 9 13 2D 5.5 V 2.0 V 5.5 V " " " " " " 0.8 V GND GND " " " " " 2.4 V GND GND " " " " " 5.5 V GND 5.5 V " " " " " 0.4 V 5.5 V 5.5 V GND GND GND " " " " " " 2.4 V GND " " " " " " 5.5 V 5.5 V " " " " " " 0.4 V 5.5 V GND 10 8 2Y 16 mA -.4 mA " " " -12 mA 2.4 V 12 2 1B 2.0 V 5.5 V 5.5 V 0.8 V 5.5 V " " " " " GND 13 4 1C 2.0 V 5.5 V 5.5 V " 0.8 V 5.5 V " " " " GND 14 5 1D 2.0 V 5.5 V 5.5 V " " 0.8 V 5.5 V " " " GND GND " " " " " " " GND " " " " " " " GND " " " " " " " GND GND GND " " " " " " " GND 2.4 V GND " " " " " GND 5.5 V GND " " " " " 5.5 V 0.4 V 5.5 V " " " " " 5.5 V GND GND " 2.4 V GND " " " " GND " 5.5 V GND " " " " 5.5 V " 0.4 V 5.5 V " " " " 5.5 V GND GND " " 2.4 V GND " " " GND " " 5.5 V GND " " " 5.5 V " " 0.4 V 5.5 V " " " 5.5 V GND GND -12 mA 2.4 V 11 7 GND GND " GND " " " " " " " GND OUT 2.4 V 2.4 V OUT 2.4 V 2.4 V OUT 2.4 V 2.4 V OUT GND " GND " GND " GND " -12 mA -12 mA -12 mA 2.4 V 2.4 V 2.4 V 2.4 V 2.4 V 2.4 V 2.4 V 2.4 V 2.4 V 2.4 V 2.4 V 2.4 V Measured terminal 1Y 2Y 1Y 1Y 1Y 1Y 2Y 2Y 2Y 2Y 1Y 2Y 1A 1B 1C 1D 2A 2B 2C 2D 1A 1B 1C 1D 2A 2B 2C 2D 1A 1B 1C 1D 2A 2B 2C 2D VCC VCC 1A 1B 1C 1D 2A 2B 2C 2D 1A to 1Y 2A to 2Y 1A to 1Y 2A to 2Y 1A to 1Y 2A to 2Y 1A to 1Y 2A to 2Y Limits Min Max 0.4 " 2.4 " " " " " " " -20 -55 " " 40 " " " " " " " 100 " " " " " " " -0.7 -1.6 " " " " " " " " " " " " " " 10 3.3 -1.5 " " " " " " " 3 " 3 " 3 " 3 " 20 " 25 " 24 " 27 " Unit V " V " " " " " " " mA " A " " " " " " " A " " " " " " " mA " " " " " " " mA mA V " " " " " " " ns " ns " ns " ns " MIL-M-38510/1F MIL-STD- Cases A, B, D 1 2 3 4 5 6 7 883 Case C 1 6 3 14 11 9 10 method Test no. 1A 1Y NC VCC NC 2A 2B 1 VOL 3007 1 2.0 V 16 mA 4.5 V 5.5 V 5.5 V 2 5.5 V " 2.0 V 2.0 V Tc = 25C VOH 3006 3 0.8 V -.4 mA 4.5 V 5.5 V 5.5 V 4 5.5 V " " " " 5 " " " " " 6 " " " " " 7 " " 0.8 V " 8 " " 5.5 V 0.8 V 9 " " " 5.5 V 10 " " " " IOS 3011 11 GND GND 5.5 V 12 " GND GND IIH1 3010 13 2.4 V 5.5 V GND GND 14 GND " " " 15 " " " " 16 " " " " 17 " " 2.4 V " 18 " " GND 2.4 V 19 " " " GND 20 " " " " IIH2 3010 21 5.5 V 5.5 V GND GND 22 GND " " " 23 " " " " 24 " " " " 25 " " 5.5 V " 26 " " GND 5.5 V 27 " " " GND 28 " " " " IIL 3009 29 0.4 V 5.5 V 5.5 V 5.5 V 30 5.5 V " " " 31 " " " " 32 " " " " 33 " " 0.4 V " 34 " " 5.5 V 0.4 V 35 " " " 5.5 V 36 " " " " ICCL 3005 37 5.5 V 5.5 V 5.5 V 5.5 V ICCH 3005 38 GND 5.5 V GND GND VI C 39 -12 mA 4.5 V 40 " 41 " 42 " 43 " -12 mA 44 " -12 mA 45 " 46 " 2 Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125C and VI C tests are omitted. 3 Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55C and VI C tests are omitted. 9 tPHL 3003 47 IN OUT 5.0 V tPHL (Fig. 3) 48 " IN 2.4 V Tc = 25C tPLH 3003 49 IN OUT 5.0 V tPLH (Fig. 3) 50 " IN 2.4 V 10 tPHL 3003 51 IN OUT 5.0 V tPHL (Fig. 3) 52 " IN 2.4 V Tc = 125C tPLH 3003 53 IN OUT 5.0 V tPLH (Fig. 3) 54 " IN 2.4 V 11 Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55C. Subgroup TABLE III. Group A inspection for device type 03. Terminal conditions (pins not designated may be high 2.0 V, low 0.8 V or open) Symbol 8 5 2C 5.5 V 2.0 V 5.5 V 5.5 V " " " " 0.8 V 5.5 V " " 14 9 9 3A 5.5 V " 2.0 V 5.5 V " " " " " 0.8 V 5.5 V " 10 10 3B 5.5 V " 2.0 V 5.5 V " " " " " " 0.8 V 5.5 V GND GND " " " " " 2.4 V GND " GND " " " " " 5.5 V GND " 5.5 V " " " " " 0.4 V 5.5 V " GND 5.5 V GND GND " " " " " " 2.4 V GND GND " " " " " " 5.5 V GND 5.5 V " " " " " " 0.4 V 5.5 V GND 5.5 V GND GND " " " " 2.4 V GND " " GND " " " " 5.5 V GND " " 5.5 V " " " " 0.4 V 5.5 V " " GND 5.5 V -12 mA -12 mA -12 mA 11 7 GND GND " " GND " " " " " " " " GND " " GND " " " " " " " " GND " " " " " " " " GND " " " " " " " " GND GND GND " " " " " " " " 12 11 3C 5.5 V " 2.0 V 5.5 V " " " " " " " 0.8 V GND GND " " " " " " " 2.4 V GND " " " " " " " 5.5 V 5.5 V " " " " " " " 0.4 V GND 5.5 V 13 8 3Y 16 mA -.4 mA " " 14 13 1C 2.0 V 5.5 V " 5.5 V " 0.8 V 5.5 V " " " " " GND GND GND " 2.4 V GND " " " " " GND " 5.5 V GND " " " " " 5.5 V " 0.4 V 5.5 V " " " " " GND 5.5 V -12 mA -12 mA Measured terminal 1Y 2Y 3Y 1Y 1Y 1Y 2Y 2Y 2Y 3Y 3Y 3Y 1Y 2Y 3Y 1A 1B 1C 2A 2B 2C 3A 3B 3C 1A 1B 1C 2A 2B 2C 3A 3B 3C 1A 1B 1C 2A 2B 2C 3A 3B 3C VCC VCC 1A 1B 1C 2A 2B 2C 3A 3B 3C Limits Min Max 0.4 " " 2.4 " " " " " " " " -20 -55 " " " " 40 " " " " " " " " 100 " " " " " " " " -0.7 -1.6 " " " " " " " " " " " " " " " " 4.95 15 -1.5 " " " " " " " " Unit V " " V " " " " " " " " mA " " A " " " " " " " " A " " " " " " " " mA " " " " " " " " mA mA V " " " " " " " " MIL-M-38510/1F MIL-STD- Cases A, B, D 1 2 3 4 5 6 7 883 Case C 1 2 12 14 6 3 4 method Test no. 1A 1B 1Y VCC 2Y 2A 2B 1 VOL 3007 1 2.0 V 2.0 V 16 mA 4.5 V 5.5 V 5.5 V 2 5.5 V 5.5 V " 16 mA 2.0 V 2.0 V Tc = 25C 3 " " " 5.5 V 5.5 V VOH 3006 4 0.8 V 5.5 V -.4 mA 4.5 V 5.5 V 5.5 V 5 5.5 V 0.8 V " " " " 6 " 5.5 V " " " " 7 " " " -.4 mA 0.8 V " 8 " " " " 5.5 V 0.8 V 9 " " " " " 5.5 V 10 " " " " " 11 " " " " " 12 " " " " " IOS 3011 13 GND GND GND 5.5 V 14 " GND GND GND 15 " IIH1 3010 16 2.4 V GND 5.5 V GND GND 17 GND 2.4 V " " " 18 " GND " " " 19 " " " 2.4 V " 20 " " " GND 2.4 V 21 " " " " GND 22 " " " " " 23 " " " " " 24 " " " " " IIH2 3010 25 5.5 V GND 5.5 V GND GND 26 GND 5.5 V " " " 27 " GND " " " 28 " " " 5.5 V " 29 " " " GND 5.5 V 30 " " " " GND 31 " " " " " 32 " " " " " 33 " " " " " IIL 3009 34 0.4 V 5.5 V " 5.5 V 5.5 V 35 5.5 V 0.4 V " " " 36 " 5.5 V " " " 37 " " " 0.4 V " 38 " " " 5.5 V 0.4 V 39 " " " " 5.5 V 40 " " " " " 41 " " " " " 42 " " " " " ICCH 3005 43 GND GND 5.5 V GND GND ICCL 3005 44 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V VI C 45 -12 mA 4.5 V 46 -12mA " 47 " 48 " -12 mA 49 " -12 mA 50 " 51 " 52 " 53 " 2 Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125C and VI C tests are omitted. 3 Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55C and VI C tests are omitted. Subgroup TABLE III. Group A inspection for device type 03 - Continued. Terminal conditions (pins not designated may be high 2.0 V, low 0.8 V or open) MIL-STD- Cases A, B, D 1 2 3 4 883 Case C 1 2 12 14 method Test no. 1A 1B 1Y VCC 9 tPHL 3003 54 IN 2.4 V OUT 5.0 V (Fig. 3) 55 " Tc = 25C 56 " tPLH 3003 57 IN 2.4 V OUT 5.0 V (Fig. 3) 58 " 59 " 10 tPHL 3003 60 IN 2.4 V OUT 5.0 V (Fig. 3) 61 " Tc = 125C 62 " tPLH 3003 63 IN 2.4 V OUT 5.0 V (Fig. 3) 64 " 65 " 11 Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55C. Subgroup Symbol 5 6 2Y 6 3 2A 7 4 2B 8 5 2C OUT IN 2.4 V 2.4 V OUT IN 2.4 V 2.4 V OUT IN 2.4 V 2.4 V OUT IN 2.4 V 9 9 3A 10 10 3B IN 2.4 V IN 2.4 V IN 2.4 V IN 2.4 V 2.4 V 11 7 GND GND " " GND " " GND " " GND " " 12 11 3C 13 8 3Y 2.4 V OUT 14 13 1C 2.4 V 2.4 V 2.4 V OUT 2.4 V OUT 2.4 V OUT 2.4 V 2.4 V Measured terminal 1A to 1Y 2A to 2Y 3A to 3Y 1A to 1Y 2A to 2Y 3A to 3Y 1A to 1Y 2A to 2Y 3A to 3Y 1A to 1Y 2A to 2Y 3A to 3Y Limits Min Max 3 20 " " " " 3 25 " " " " 3 24 " " " " 3 27 " " " " Unit ns " " ns " " ns " " ns " " MIL-M-38510/1F 15 TABLE III. Group A inspection for device type 04. Terminal conditions (pins not designated may be high 2.0 V, low 0.8 V or open) Symbol 8 8 3Y 16 mA -.4 mA " GND 16 9 9 3A 5.5 V " 2.0 V 5.5 V 5.5 V " " " 0.8 V 5.5 V " " 10 10 3B 5.5 V " 2.0 V 5.5 V 5.5 V " " " " 0.8 V 5.5 V " GND GND GND " " " 2.4 V GND " " GND " " " 5.5 V GND " " 5.5 V " " " 0.4 V 5.5 V " " GND 5.5 V GND " " " " 2.4 V GND " GND " " " " 5.5 V GND " 5.5 V " " " " 0.4 V 5.5 V " GND 5.5 V -12 mA -12 mA 11 7 GND GND " " " GND " " " " " " " GND " " " GND " " " " " " " GND " " " " " " " GND " " " " " " " GND GND GND " " " " " " " 12 12 4A 5.5 V " " 2.0 V 5.5 V " " " " " 0.8 V 5.5 V 13 13 4B 5.5 V " " 2.0 V 5.5 V " " " " " " 0.8 V GND GND " " " " " 2.4 V GND GND " " " " " 5.5 V GND 5.5 V " " " " " 0.4 V 5.5 V GND 5.5 V GND GND " " " " " " 2.4 V GND " " " " " " 5.5 V 5.5 V " " " " " " 0.4 V GND 5.5 V -12 mA -12 mA 14 11 4Y 16 mA -.4 mA " GND Measured terminal 1Y 2Y 3Y 4Y 1Y 1Y 2Y 2Y 3Y 3Y 4Y 4Y 1Y 2Y 3Y 4Y 1A 1B 2A 2B 3A 3B 4A 4B 1A 1B 2A 2B 3A 3B 4A 4B 1A 1B 2A 2B 3A 3B 4A 4B VCC VCC 1A 1B 2A 2B 3A 3B 4A 4B Limits Min Max 0.4 " " " 2.4 " " " " " " " -20 -55 " " " " " " 40 " " " " " " " 100 " " " " " " " -0.7 -1.6 " " " " " " " " " " " " " " 6.6 20 -1.5 " " " " " " " Unit V " " " V " " " " " " " mA " " " A " " " " " " " A " " " " " " " mA " " " " " " " mA mA V " " " " " " " MIL-M-38510/1F MIL-STD- Cases A, B, D 1 2 3 4 5 6 7 883 Case C 1 2 3 14 6 4 5 method Test no. 1A 1B 1Y VCC 2Y 2A 2B 1 VOL 3007 1 2.0 V 2.0 V 16 mA 4.5 V 5.5 V 5.5 V 2 5.5 V 5.5 V " 16 mA 2.0 V 2.0 V Tc = 25C 3 " " " 5.5 V 5.5 V 4 " " " " " VOH 3006 5 0.8 V 5.5 V -.4 mA 4.5 V 5.5 V 5.5 V 6 5.5 V 0.8 V " " " " 7 " 5.5 V " -.4 mA 0.8 V " 8 " " " " 5.5 V 0.8 V 9 " " " " 5.5 V 10 " " " " " 11 " " " " " 12 " " " " " IOS 3011 13 GND GND GND 5.5 V 14 " GND GND GND 15 " 16 " IIH1 3010 17 2.4 V GND 5.5 V GND GND 18 GND 2.4 V " " " 19 " GND " 2.4 V " 20 " " " GND 2.4 V 21 " " " " GND 22 " " " " " 23 " " " " " 24 " " " " " IIH2 3010 25 5.5 V GND 5.5 V GND GND 26 GND 5.5 V " " " 27 " GND " 5.5 V " 28 " " " GND 5.5 V 29 " " " " GND 30 " " " " " 31 " " " " " 32 " " " " " IIL 3009 33 0.4 V 5.5 V 5.5 V 5.5 V 5.5 V 34 5.5 V 0.4 V " " " 35 " 5.5 V " 0.4 V " 36 " " " 5.5 V 0.4 V 37 " " " " 5.5 V 38 " " " " " 39 " " " " " 40 " " " " " ICCH 3005 41 GND GND 5.5 V GND GND ICCL 3005 42 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V VI C 43 -12 mA 4.5 V 44 -12mA " 45 " -12 mA 46 " -12 mA 47 " 48 " 49 " 50 " 2 Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125C and VI C tests are omitted. 3 Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55C and VI C tests are omitted. Subgroup TABLE III. Group A inspection for device type 04 - Continued. Terminal conditions (pins not designated may be high 2.0 V, low 0.8 V or open) MIL-STD- Cases A, B, D 1 2 3 4 883 Case C 1 2 12 14 method Test no. 1A 1B 1Y VCC 9 tPHL 3003 51 IN 2.4 V OUT 5.0 V (Fig. 3) 52 " Tc = 25C 53 " 54 " tPLH 3003 55 IN 2.4 V OUT 5.0 V (Fig. 3) 56 " 57 " 58 " 10 tPHL 3003 59 IN 2.4 V OUT 5.0 V (Fig. 3) 60 " Tc = 125C 61 " 62 " tPLH 3003 63 IN 2.4 V OUT 5.0 V (Fig. 3) 64 " 65 " 66 " 11 Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55C. Subgroup Symbol 5 6 2Y 6 3 2A 7 4 2B OUT IN 2.4 V OUT IN 8 5 3Y 9 9 3A 10 10 3B OUT IN 2.4 V 2.4 V OUT OUT IN IN 2.4 V 2.4 V OUT OUT IN IN 2.4 V 2.4 V OUT IN 2.4 V 11 7 GND GND " " " GND " " " GND " " " GND " " " 12 11 4A 13 8 4B 14 13 4Y IN 2.4 V OUT IN 2.4 V OUT IN 2.4 V OUT IN 2.4 V OUT Measured terminal 1A to 1Y 2A to 2Y 3A to 3Y 4A to 4Y 1A to 1Y 2A to 2Y 3A to 3Y 4A to 4Y 1A to 1Y 2A to 2Y 3A to 3Y 4A to 4Y 1A to 1Y 2A to 2Y 3A to 3Y 4A to 4Y Limits Min Max 3 20 " " " " " " 3 25 " " " " " " 3 24 " " " " " " 3 27 " " " " " " Unit ns " " " ns " " " ns " " " ns " " " MIL-M-38510/1F 17 TABLE III. Group A inspection for device type 05. Terminal conditions (pins not designated may be high 2.0 V, low 0.8 V or open) Symbol 8 8 4Y 16mA -.4 mA 9 11 5A 5.5 V " " " 2.0 V 5.5 V 5.5 V " " " 0.8 V 5.5 V 10 10 5Y 16mA -.4 mA GND GND 18 GND " " " 2.4 V GND GND " " " 5.5 V GND 5.5 V " " " 0.4 V 5.5 V 5.5 V GND -12 mA GND 11 7 GND GND " " " " " GND " " " " " GND " " " " " GND " " " " " GND " " " " " GND " " " " " GND GND GND " " " " " 12 12 6Y 16mA -.4 mA 13 13 6Y 5.5 V " " " " 2.0 V 5.5 V " " " " 0.8 V 14 2 6A 16mA -.4mA GND GND GND GND " " " " 2.4 V GND " " " " 5.5 V 5.5 V " " " " 0.4 V 5.5 V GND -12 mA Measured terminal 1Y 2Y 3Y 4Y 5Y 6Y 1Y 2Y 3Y 4Y 5Y 6Y 1Y 2Y 3Y 4Y 5Y 6Y 1A 2A 3A 4A 5A 6A 1A 2A 3A 4A 5A 6A 1A 2A 3A 4A 5A 6A VCC VCC 1A 2A 3A 4A 5A 6A Limits Min Max 0.4 " " " " " 2.4 " " " " " -20 -55 " " " " " " " " " " 40 " " " " " 100 " " " " " -0.7 -1.6 " " " " " " " " " " 30 9.9 -1.5 " " " " " Unit V " " " " " V " " " " " mA " " " " " A " " " " " A " " " " " mA " " " " " mA mA V " " " " " MIL-M-38510/1F MIL-STD- Cases A, B, D 1 2 3 4 5 6 7 883 Case C 11 4 3 14 5 6 9 method Test no. 1A 2Y 2A VCC 3A 3Y 4A 1 VOL 3007 1 2.0 V 5.5 V 4.5 V 5.5 V 5.5 V 2 5.5 V 16 mA 2.0 V " " " Tc = 25C 3 " 5.5 V " 2.0 V 16mA " 4 " " " 5.5 V 2.0 V 5 " " " " 5.5 V 6 " " " " " VOH 3006 7 0.8 V 5.5 V 4.5 V 5.5 V 5.5 V 8 5.5 V -.4 mA 0.8 V " " " 9 " 5.5 V " 0.8 V -.4 mA " 10 " " " 5.5 V 0.8 V 11 " " " " 5.5 V 12 " " " " " IOS 3011 13 GND 5.5 V 14 GND GND " 15 " GND GND 16 " GND 17 " 18 " IIH1 3010 19 2.4 V GND 5.5 V GND GND 20 GND 2.4 V " " " 21 " GND " 2.4 V " 22 " " " GND 2.4 23 " " " " GND 24 " " " " " IIH2 3010 25 5.5 V GND 5.5 V GND GND 26 GND 5.5 V " " " 27 " GND " 5.5 V " 28 " " " GND 5.5 V 29 " " " " GND 30 " " " " " IIL 3009 31 0.4 V 5.5 V 5.5 V 5.5 V 5.5 V 32 5.5 V 0.4 V " " " 33 " 5.5 V " 0.4 V " 34 " " " 5.5 V 0.4 V 35 " " " " 5.5 V 36 " " " " " ICCL 3005 37 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V ICCH 3005 38 GND GND 5.5 V GND GND VI C 39 -12 mA 4.5 V 40 -12 mA " 41 " -12 mA 42 " -12 mA 43 " 44 " 2 Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125C and VI C tests are omitted. 3 Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55C and VI C tests are omitted. Subgroup TABLE III. Group A inspection for device type 05 - Continued. Terminal conditions (pins not designated may be high 2.0 V, low 0.8 V or open) MIL-STD- Cases A, B, D 1 2 3 4 883 Case C 1 2 12 14 method Test no. 1A 1B 1Y VCC 9 tPHL 3003 45 IN 5.0 V (Fig. 3) 46 OUT IN " Tc = 25C 47 " 48 " 49 " 50 " tPLH 3003 51 IN 5.0 V (Fig. 3) 52 OUT IN " 53 " 54 " 55 " 56 " 10 tPHL 3003 57 IN 5.0 V (Fig. 3) 58 OUT IN " Tc = 125C 59 " 60 " 61 " 62 " tPLH 3003 63 IN 5.0 V (Fig. 3) 64 OUT IN " 65 " 66 " 67 " 68 " 11 Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55C. Subgroup Symbol 5 6 2Y 6 3 2A IN OUT 7 4 2B IN 8 5 3Y 9 9 3A OUT IN IN OUT IN OUT OUT IN OUT IN IN OUT OUT IN IN 10 10 3B OUT OUT IN OUT IN OUT 11 7 GND GND " " " " " GND " " " " " GND " " " " " GND " " " " " 12 11 4A OUT 13 8 4B 14 13 4Y OUT IN OUT OUT IN OUT OUT IN OUT OUT IN Measured terminal 1A to 1Y 2A to 2Y 3A to 3Y 4A to 4Y 5A to 5Y 6A to 6Y 1A to 1Y 2A to 2Y 3A to 3Y 4A to 4Y 5A to 5Y 6A to 6Y 1A to 1Y 2A to 2Y 3A to 3Y 4A to 4Y 5A to 5Y 6A to 6Y 1A to 1Y 2A to 2Y 3A to 3Y 4A to 4Y 5A to 5Y 6A to 6Y Limits Min Max 3 20 " " " " " " " " " " 3 25 " " " " " " " " " " 3 24 " " " " " " " " " " 3 27 " " " " " " " " " " Unit ns " " " " " ns " " " " " ns " " " " " ns " " " " " MIL-M-38510/1F 19 TABLE III. Group A inspection for device type 06. Terminal conditions (pins not designated may be high 2.0 V, low 0.8 V or open) Symbol 5 2C 5.5 V 2.0 V 5.5 V 5.5 V " " " " 0.8 V 5.5 V " " 9 3A 5.5 V " 2.0 V 5.5 V " " " " " 0.8 V 5.5 V " 10 3B 5.5 V " 2.0 V 5.5 V " " " " " " 0.8 V 5.5 V -12 mA -12 mA -12 mA 20 GND " " " " 2.4 V GND " " GND " " " " 5.5 V GND " " 5.5 V " " " " 0.4 V 5.5 V " " 5.5 V GND GND " " " " " 2.4 V GND " GND " " " " " 5.5 V GND " 5.5 V " " " " " 0.4 V 5.5 V " 5.5 V GND GND " " " " " " 2.4 V GND GND " " " " " " 5.5 V GND 5.5 V " " " " " " 0.4 V 5.5 V 5.5 V GND 7 GND GND " " GND " " " " " " " " GND " " " " " " " " GND " " " " " " " " GND " " " " " " " " GND " " " " " " " " GND GND 11 3C 5.5 V " 2.0 V 5.5 V " " " " " " " 0.8 V 8 3Y 16 mA 5.5 V " " 13 1C 2.0 V 5.5 V " 5.5 V " 0.8 V 5.5 V " " " " " -12 mA -12 mA GND " " " " " " " 2.4 V GND " " " " " " " 5.5 V 5.5 V " " " " " " " 0.4 V 5.5 V GND GND " 2.4 V GND " " " " " GND " 5.5 V GND " " " " " 5.5 V " 0.4 V 5.5 V " " " " " 5.5 V GND Measured terminal 1Y 2Y 3Y 1Y 1Y 1Y 2Y 2Y 2Y 3Y 3Y 3Y 1A 1B 1C 2A 2B 2C 3A 3B 3C 1A 1B 1C 2A 2B 2C 3A 3B 3C 1A 1B 1C 2A 2B 2C 3A 3B 3C 1A 1B 1C 2A 2B 2C 3A 3B 3C VCC VCC Limits Min Max 0.4 " " 250 " " " " " " " " -1.5 " " " " " " " " 40 " " " " " " " " 100 " " " " " " " " -0.7 -1.6 " " " " " " " " " " " " " " " " 15 4.95 Unit V " " A " " " " " " " " V " " " " " " " " A " " " " " " " " A " " " " " " " " mA " " " " " " " " mA mA MIL-M-38510/1F MIL-STD- Cases A, B, 883 C, and D 1 2 12 14 6 3 4 method Test no. 1A 1B 1Y VCC 2Y 2A 2B 1 VOL 3007 1 2.0 V 2.0 V 16 mA 4.5 V 5.5 V 5.5 V 2 5.5 V 5.5 V " 16 mA 2.0 V 2.0 V Tc = 25C 3 " " " 5.5 V 5.5 V ICEX 4 0.8 V 5.5 V 5.5 V 4.5 V 5.5 V 5.5 V 5 5.5 V 0.8 V " " " " 6 " 5.5 V " " " " 7 " " " 5.5 V 0.8 V " 8 " " " " 5.5 V 0.8 V 9 " " " " " 5.5 V 10 " " " " " 11 " " " " " 12 " " " " " VI C 13 -12 mA 4.5 V 14 -12 mA " 15 " 16 " -12 mA 17 " -12 mA 18 " 19 " 20 " 21 " IIH1 3010 22 2.4 V GND 5.5 V GND GND 23 GND 2.4 V " " " 24 " GND " " " 20 " " " 2.4 V " 26 " " " GND 2.4 V 27 " " " " GND 28 " " " " " 29 " " " " " 30 " " " " " IIH2 3010 31 5.5 V GND 5.5 V GND GND 32 GND 5.5 V " " " 33 " GND " " " 34 " " " 5.5 V " 35 " " " GND 5.5 V 36 " " " " GND 37 " " " " " 38 " " " " " 39 " " " " " II L 3009 40 0.4 V 5.5 V 5.5 V 5.5 V 5.5 V 41 5.5 V 0.4 V " " " 42 " 5.5 V " " " 43 " " " 0.4 V " 44 " " " 5.5 V 0.4 V 45 " " " " 5.5 V 46 " " " " " 47 " " " " " 48 " " " " " ICCL 3005 49 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V ICCH 3005 50 GND GND 5.5 V GND GND 2 Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125C and VI C tests are omitted. 3 Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55C and VI C tests are omitted. Subgroup TABLE III. Group A inspection for device type 06 - Continued. Terminal conditions (pins not designated may be high 2.0 V, low 0.8 V or open) MIL-STD- Cases A, B, 883 C, and D 1 2 12 14 method Test no. 1A 1B 1Y VCC 9 tPHL 3003 51 IN 2.4 V OUT 5.0 V (Fig. 3) 52 " Tc = 25C 53 " tPLH 3003 54 IN 2.4 V OUT 5.0 V (Fig. 3) 55 " 56 " 10 tPHL 3003 57 IN 2.4 V OUT 5.0 V (Fig. 3) 58 " Tc = 125C 59 " tPLH 3003 60 IN 2.4 V OUT 5.0 V (Fig. 3) 61 " 62 " 11 Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55C. Subgroup Symbol 6 2Y 3 2A 4 2B 5 2C OUT IN 2.4 V 2.4 V OUT IN 2.4 V 2.4 V OUT IN 2.4 V 2.4 V OUT IN 2.4 V 9 3A 10 3B IN 2.4 V IN 2.4 V IN 2.4 V IN 2.4 V 2.4 V 7 GND GND " " GND " " GND " " GND " " 11 3C 8 3Y 2.4 V OUT 13 1C 2.4 V 2.4 V 2.4 V OUT 2.4 V OUT 2.4 V OUT 2.4 V 2.4 V Measured terminal 1A to 1Y 2A to 2Y 3A to 3Y 1A to 1Y 2A to 2Y 3A to 3Y 1A to 1Y 2A to 2Y 3A to 3Y 1A to 1Y 2A to 2Y 3A to 3Y Limits Min Max 3 23 " " " " 3 28 " " " " 3 29 " " " " 3 35 " " " " Unit ns " " ns " " ns " " ns " " MIL-M-38510/1F 21 TABLE III. Group A inspection for device type 07. Terminal conditions (pins not designated may be high 2.0 V, low 0.8 V or open) Symbol 22 7 6 2B 5.5 V 2.0 V 5.5 V " 5.5 V " 4.5 V 0.8 V 5.5 V " " " GND " " 2.4 V GND " " " GND " " 5.5 V GND " " " 5.5 V " " 0.4 V 5.5 V " " " 5.5 V GND 8 10 3Y 16 mA 5.5 V " 9 8 3A 5.5 V " 2.0 V 5.5 V 5.5 V " " " 0.8 V 4.5 V 5.5 V " GND " " " 2.4 V GND " " GND " " " 5.5 V GND " " 5.5 V " " " 0.4 V 5.5 V " " 5.5 V GND 10 9 3B 5.5 V " 2.0 V 5.5 V 5.5 V " " " 4.5 V 0.8 V 5.5 V " GND " " " " 2.4 V GND " GND " " " " 5.5 V GND " 5.5 V " " " " 0.4 V 5.5 V " 5.5 V GND -12mA -12mA -12mA 11 7 GND GND " " " GND " " " " " " " GND " " " " " " " GND " " " " " " " GND " " " " " " " GND GND GND " " " " " " " 12 11 4A 5.5 V " " 2.0 V 5.5 V " " " " " 0.8 V 4.5 V GND " " " " " 2.4 V GND GND " " " " " 5.5 V GND 5.5 V " " " " " 0.4 V 5.5 V 5.5 V GND 13 12 4B 5.5 V " " 2.0 V 5.5 V " " " " " 4.5 V 0.8 V GND " " " " " " 2.4 V GND " " " " " " 5.5 V 5.5 V " " " " " " 0.4 V 5.5 V GND -12mA -12mA 14 13 4Y 16 mA 5.5 V " Measured terminal 1Y 2Y 3Y 4Y 1Y 1Y 2Y 2Y 3Y 3Y 4Y 4Y 1A 1B 2A 2B 3A 3B 4A 4B 1A 1B 2A 2B 3A 3B 4A 4B 1A 1B 2A 2B 3A 3B 4A 4B VCC VCC 1A 1B 2A 2B 3A 3B 4A 4B Limits Min Max 0.4 " " " 250 " " " " " " " 40 " " " " " " " 100 " " " " " " " -0.7 -1.6 " " " " " " " " " " " " " " 20 6.6 -1.5 " " " " " " " Unit V " " " A " " " " " " " A " " " " " " " A " " " " " " " mA " " " " " " " mA mA V " " " " " " " MIL-M-38510/1F MIL-STD- Cases A, B, D 1 2 3 4 5 6 883 Case C 2 3 1 14 4 5 method Test no. 1A 1B 1Y VCC 2Y 2A 1 VOL 3007 1 2.0 V 2.0 V 16 mA 4.5 V 5.5 V 2 5.5 V 5.5 V " 16 mA 2.0 V Tc = 25C 3 " " " 5.5 V 4 " " " " ICEX 5 0.8 V 4.5 V 5.5 V 4.5 V 5.5 V 6 4.5 V 0.8 V " " " 7 5.5 V 5.5 V " 5.5 V 0.8 V 8 " " " " 4.5 V 9 " " " 5.5 V 10 " " " " 11 " " " " 12 " " " " IIH1 3010 13 2.4 V GND 5.5 V GND 14 GND 2.4 V " " 15 " GND " 2.4 V 16 " " " GND 17 " " " " 18 " " " " 19 " " " " 20 " " " " IIH2 3010 21 5.5 V GND 5.5 V GND 22 GND 5.5 V " " 23 " GND " 5.5 V 24 " " " GND 25 " " " " 26 " " " " 27 " " " " 28 " " " " II L 3009 29 0.4 V 5.5 V 5.5 V 5.5 V 30 5.5 V 0.4 V " " 31 " 5.5 V " 0.4 V 32 " " " 5.5 V 33 " " " " 34 " " " " 35 " " " " 36 " " " " ICCL 3005 37 5.5 V 5.5 V 5.5 V 5.5 V ICCH 3005 38 GND GND 5.5 V GND VI C 39 -12mA 4.5 V 40 -12mA " 41 " -12mA 42 " 43 " 44 " 45 " 46 " 2 Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125C and VI C tests are omitted. 3 Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55C and VI C tests are omitted. Subgroup TABLE III. Group A inspection for device type 07 - Continued. Terminal conditions (pins not designated may be high 2.0 V, low 0.8 V or open) MIL-STD- Cases A, B, D 1 2 3 4 883 Case C 2 3 1 14 method Test no. 1A 1B 1Y VCC 9 tPHL 3003 47 IN 2.4 V OUT 5.0 V (Fig. 3) 48 " Tc = 25C 49 " 50 tPLH 3003 51 IN 2.4 V OUT 5.0 V (Fig. 3) 52 " 53 " 54 10 tPHL 3003 55 IN 2.4 V OUT 5.0 V (Fig. 3) 56 " Tc = 125C 57 " 58 tPLH 3003 59 IN 2.4 V OUT 5.0 V (Fig. 3) 60 " 61 " 62 11 Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55C. Subgroup Symbol 5 4 2Y 6 5 2A 7 6 2B OUT IN 2.4 V 8 10 3Y 9 8 3A 10 9 3B OUT IN 2.4 V 11 7 GND GND " " 2.4 V GND " " 2.4 V GND " " 2.4 V GND " " 12 11 4A IN OUT IN 2.4 V OUT IN IN OUT IN 2.4 V OUT IN IN OUT IN 2.4 V OUT IN IN 13 12 4B 2.4 V 2.4 V 2.4 V 2.4 V 14 13 4Y OUT OUT OUT OUT Measured terminal 1A to 1Y 2A to 2Y 3A to 3Y 4A to 4Y 1A to 1Y 2A to 2Y 3A to 3Y 4A to 4Y 1A to 1Y 2A to 2Y 3A to 3Y 4A to 4Y 1A to 1Y 2A to 2Y 3A to 3Y 4A to 4Y Limits Min Max 3 23 " " " " Unit ns " " 3 " " 28 " " ns " " 3 " " 29 " " ns " " 3 " " 35 " " ns " " MIL-M-38510/1F 23 TABLE III. Group A inspection for device type 08. Terminal conditions (pins not designated may be high 2.0 V, low 0.8 V or open) Symbol 7 9 4A 5.5 V " " 2.0 V 5.5 V " 5.5 V " " 0.8 V 5.5 V " 8 8 4Y 16 mA 5.5 V 9 11 5A 5.5 V " " " 2.0 V 5.5 V 5.5 V " " " 0.8 V 5.5 V -12mA -12mA 24 GND " " 2.4 V GND " GND " " 5.5 V GND " 5.5 V " " 0.4 V 5.5 V " 5.5 V GND GND " " " 2.4 V GND GND " " " 5.5 V GND 5.5 V " " " 0.4 V 5.5 V 5.5 V GND 10 10 5Y 16 mA 5.5 V 11 7 GND GND " " " " " GND " " " " " GND " " " " " GND " " " " " GND " " " " " " " " " " " GND GND 12 12 6Y 16 mA 5.5 V 13 13 6A 5.5 V " " " " 2.0 V 5.5 V " " " " 0.8 V -12mA GND " " " " 2.4 V GND " " " " 5.5 V 5.5 V " " " " 0.4 V 5.5 V GND 14 2 1Y 16 mA 5.5 V Measured terminal 1Y 2Y 3Y 4Y 5Y 6Y 1Y 2Y 3Y 4Y 5Y 6Y 1A 2A 3A 4A 5A 6A 1A 2A 3A 4A 5A 6A 1A 2A 3A 4A 5A 6A 1A 2A 3A 4A 5A 6A VCC VCC Limits Min Max 0.4 " " " " " 250 " " " " " -1.5 " " " " " 40 " " " " " 100 " " " " " -0.7 -1.6 " " " " " " " " " " 30 9.9 Unit V " " " " " A " " " " " V " " " " " A " " " " " A " " " " " mA " " " " " mA mA MIL-M-38510/1F MIL-STD- Cases A, B, D 1 2 3 4 5 6 883 Case C 1 4 3 14 5 6 method Test no. 1A 2Y 2A VCC 3A 3Y 1 VOL 3007 1 2.0 V 5.5 V 4.5 V 5.5 V 2 5.5 V 16 mA 2.0 V " " Tc = 25C 3 " 5.5 V " 2.0 V 16 mA 4 " " " 5.5 V 5 " " " " 6 " " " " ICEX 7 0.8 V 5.5 V 4.5 V 5.5 V 8 5.5 V 5.5 V 0.8 V " " 9 " 5.5 V " 0.8 V 5.5 V 10 " " " 5.5 V 11 " " " " 12 " " " " VI C 13 -12mA 4.5 V 14 -12mA " 15 " -12mA 16 " 17 " 18 " IIH1 3010 19 2.4 V GND 5.5 V GND 20 GND 2.4 V " " 21 " GND " 2.4 V 22 " " " GND 23 " " " " 24 " " " " IIH2 3010 25 5.5 V GND 5.5 V GND 26 GND 5.5 V " " 27 " GND " 5.5 V 28 " " " GND 29 " " " " 30 " " " " IIL 3009 31 0.4 V 5.5 V 5.5 V 5.5 V 32 5.5 V 0.4 V " " 33 " 5.5 V " 0.4 V 34 " " " 5.5 V 35 " " " " 36 " " " " ICCL 3005 37 5.5 V 5.5 V 5.5 V 5.5 V ICCH 3005 38 GND GND 5.5 V GND 2 Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125C and VI C tests are omitted. 3 Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55C and VI C tests are omitted. Subgroup TABLE III. Group A inspection for device type 08 - Continued. Terminal conditions (pins not designated may be high 2.0 V, low 0.8 V or open) Symbol 5 5 3A 6 6 3Y IN OUT 7 9 4A IN 8 8 4Y 9 11 5A OUT IN IN OUT IN OUT OUT IN OUT IN IN OUT OUT IN IN 10 10 5Y OUT OUT IN OUT IN OUT 11 7 GND GND " " " " " GND " " " " " GND " " " " " GND " " " " " 12 12 6Y OUT 13 13 6A 14 2 1Y OUT IN OUT OUT IN OUT OUT IN OUT OUT IN Measured terminal 1A to 1Y 2A to 2Y 3A to 3Y 4A to 4Y 5A to 5Y 6A to 6Y 1A to 1Y 2A to 2Y 3A to 3Y 4A to 4Y 5A to 5Y 6A to 6Y 1A to 1Y 2A to 2Y 3A to 3Y 4A to 4Y 5A to 5Y 6A to 6Y 1A to 1Y 2A to 2Y 3A to 3Y 4A to 4Y 5A to 5Y 6A to 6Y Limits Min Max 3 23 " " " " " " " " " " 3 28 " " " " " " " " " " 3 29 " " " " " " " " " " 3 35 " " " " " " " " " " Unit ns " " " " " ns " " " " " ns " " " " " ns " " " " " 25 MIL-M-38510/1F MIL-STD- Cases A, B, D 1 2 3 4 883 Case C 1 4 3 14 method Test no. 1A 2Y 2A VCC 9 tPHL 3003 39 IN 5.0 V (Fig. 3) 40 OUT IN " Tc = 25C 41 " 42 " 43 " 44 " tPLH 3003 45 IN 5.0 V (Fig. 3) 46 OUT IN " 47 " 48 " 49 " 50 " 10 tPHL 3003 51 IN 5.0 V (Fig. 3) 52 OUT IN " Tc = 125C 53 " 54 " 55 " 56 " tPLH 3003 57 IN 5.0 V (Fig. 3) 58 OUT IN " 59 " 60 " 61 " 62 " 11 Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55C. Subgroup TABLE III. Group A inspection for device type 09. Terminal conditions (pins not designated may be high 2.0 V, low 0.8 V or open) Subgroup Symbol MIL-STD883 method 3007 Case C 1 2 3 4 5 6 26 8 9 10 11 12 13 14 GND GND " " " GND " " " " " " " GND " " " " " " " GND " " " " " " " GND " " " " " " " GND " " " " " " " GND GND 3Y 3A 5.5 V " 2.0 V 5.5 V 5.5 V " " " 0.8 V 4.5 V 5.5 V " 3B 5.5 V " 2.0 V 5.5 V 5.5 V " " " 4.5 V 0.8 V 5.5 V " 4Y 4A 5.5 V " " 2.0 V 5.5 V " " " " " 0.8 V 4.5 V 4B 5.5 V " " 2.0 V 5.5 V " " " " " 4.5 V 0.8 V VCC 4.5 V " " " 4.5 V " " " " " " " 4.5 V " " " " " " " 5.5 V " " " " " " " 5.5 V " " " " " " " 5.5 V " " " " " " " 5.5 V 5.5 V 16 mA 5.5 V " 16 mA 5.5 V " -12mA -12mA -12mA GND " " " 2.4 V GND " " GND " " " 5.5 V GND " " 5.5 V " " " 0.4 V 5.5 V " " 5.5 V GND GND " " " " 2.4 V GND " GND " " " " 5.5 V GND " 5.5 V " " " " 0.4 V 5.5 V " 5.5 V GND GND " " " " " 2.4 V GND GND " " " " " 5.5 V GND 5.5 V " " " " " 0.4 V 5.5 V 5.5 V GND -12mA GND " " " " " " 2.4 V GND " " " " " " 5.5 V 5.5 V " " " " " " 0.4 V 5.5 V GND Measured terminal 1Y 2Y 3Y 4Y 1Y 1Y 2Y 2Y 3Y 3Y 4Y 4Y 1A 1B 2A 2B 3A 3B 4A 4B 1A 1B 2A 2B 3A 3B 4A 4B 1A 1B 2A 2B 3A 3B 4A 4B 1A 1B 2A 2B 3A 3B 4A 4B VCC VCC Limits Min Max 0.4 " " " 250 " " " " " " " -1.5 " " " " " " " 40 " " " " " " " 100 " " " " " " " -0.7 -1.6 " " " " " " " " " " " " " " 20 6.6 Unit V " " " A " " " " " " " V " " " " " " " A " " " " " " " A " " " " " " " mA " " " " " " " mA mA MIL-M-38510/1F Test no. 1A 1B 1Y 2A 2B 2Y 1 VOL 1 2.0 V 2.0 V 16 mA 5.5 V 5.5 V 2 5.5 V 5.5 V 2.0 V 2.0 V 16 mA Tc = 25C 3 " " 5.5 V 5.5 V 4 " " " " ICEX 5 0.8 V 4.5 V 5.5 V 5.5 V 5.5 V 6 4.5 V 0.8 V " " " 7 5.5 V 5.5 V 0.8 V 4.5 V 5.5 V 8 " " 4.5 V 0.8 V " 9 " " 5.5 V 5.5 V 10 " " " " 11 " " " " 12 " " " " VI C 13 -12mA 14 -12mA 15 -12mA 16 -12mA 17 18 19 20 IIH1 3010 21 2.4 V GND GND GND 22 GND 2.4 V " " 23 " GND 2.4 V " 24 " " GND 2.4 V 25 " " " GND 26 " " " " 27 " " " " 28 " " " " IIH2 3010 29 5.5 V GND GND GND 30 GND 5.5 V " " 31 " GND 5.5 V " 32 " " GND 5.5 V 33 " " " GND 34 " " " " 35 " " " " 36 " " " " II L 3009 37 0.4 V 5.5 V 5.5 V 5.5 V 38 5.5 V 0.4 V " " 39 " 5.5 V 0.4 V " 40 " " 5.5 V 0.4 V 41 " " " 5.5 V 42 " " " " 43 " " " " 44 " " " " ICCL 3005 45 5.5 V 5.5 V 5.5 V 5.5 V ICCH 3005 46 GND GND GND GND 2 Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125C and VI C tests are omitted. 3 Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55C and VI C tests are omitted. 7 TABLE III. Group A inspection for device type 09 - Continued. Terminal conditions (pins not designated may be high 2.0 V, low 0.8 V or open) Subgroup Symbol MIL-STD883 method 3003 (Fig. 3) Case C 1 2 3 4 Test no. 1A 1B 1Y 2A 9 tPHL 47 IN 2.4 V OUT 48 IN Tc = 25C 49 50 tPLH 3003 51 IN 2.4 V OUT (Fig. 3) 52 IN 53 54 10 tPHL 3003 55 IN 2.4 V OUT (Fig. 3) 56 IN Tc = 125C 57 58 tPLH 3003 59 IN 2.4 V OUT (Fig. 3) 60 IN 61 62 11 Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55C. 5 6 7 8 9 10 11 12 13 14 2B 2Y 3Y 3A 3B 4Y 4A 4B 2.4 V OUT GND GND " " " GND " " " GND " " " GND " " " OUT IN 2.4 V VCC 5.0 V " " " 5.0 V " " " 5.0 V " " " 5.0 V " " " 2.4 V 2.4 V 2.4 V OUT OUT OUT OUT OUT IN IN IN IN 2.4 V 2.4 V OUT OUT 2.4 V 2.4 V OUT OUT IN IN 2.4 V 2.4 V OUT IN 2.4 V Measured terminal 1A to 1Y 2A to 2Y 3A to 3Y 4A to 4Y 1A to 1Y 2A to 2Y 3A to 3Y 4A to 4Y 1A to 1Y 2A to 2Y 3A to 3Y 4A to 4Y 1A to 1Y 2A to 2Y 3A to 3Y 4A to 4Y Limits Min Max 3 23 " " " " Unit ns " " 3 " " 28 " " ns " " 3 " " 29 " " ns " " 3 " " 35 " " ns " " MIL-M-38510/1F 27 MIL-M-38510/1F 5. PACKAGING 5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the contract or order (see 6.2). When actual packaging of materiel is to be performed by DoD or in-house contractor personnel, these personnel need to contact the responsible packaging activity to ascertain packaging requirements. Packaging requirements are maintained by the Inventory Control Point's packaging activity within the Military Service or Defense Agency, or within the military service's system command. Packaging data retrieval is available from the managing Military Department's or Defense Agency's automated packaging files, CD-ROM products, or by contacting the responsible packaging activity. 6. NOTES (This section contains information of a general or explanatory nature that may be helpful, but is not mandatory.) 6.1 Intended use. Microcircuits conforming to this specification are intended for original equipment design applications and logistic support of existing equipment. 6.2 Acquisition requirements. Acquisition documents should specify the following: a. Title, number, and date of the specification. b. PIN and compliance identifier, if applicable (see 1.2). c. Requirements for delivery of one copy of the conformance inspection data pertinent to the device inspection lot to be supplied with each shipment by the device manufacturer, if applicable. d. Requirements for certificate of compliance, if applicable. e. Requirements for notification of change of product or process to contracting activity in addition to notification to the qualifying activity, if applicable. f. Requirements for failure analysis (including required test condition of method 5003 of MIL-STD-883), corrective action, and reporting of results, if applicable. g. Requirements for product assurance options. h. Requirements for special carriers, lead lengths, or lead forming, if applicable. These requirements should not affect the part number. Unless otherwise specified, these requirements will not apply to direct purchase by or direct shipment to the Government. i. Requirements for "JAN" marking. J. Packaging requirements (see 5.1). 6.3 Superseding information. The requirements of MIL-M-38510 have been superseded to take advantage of the available Qualified Manufacturer Listing (QML) system provided by MIL-PRF-38535. Previous references to MIL-M38510 in this document have been replaced by appropriate references to MIL-PRF-38535. All technical requirements now consist of this specification and MIL-PRF-38535. The MIL-M-38510 specification sheet number and PIN have been retained to avoid adversely impacting existing government logistics systems and contractor's parts lists. 6.4 Qualification. With respect to products requiring qualification, awards will be made only for products which are, at the time of award of contract, qualified for inclusion in Qualified Manufacturers List QML-38535 whether or not such products have actually been so listed by that date. The attention of the contractors is called to these requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the Federal Government tested for qualification in order that they may be eligible to be awarded contracts or purchase orders for the products covered by this specification. Information pertaining to qualification of products may be obtained from DSCC-VQ, P.O. Box 3990, Columbus, Ohio 43218-3990. 28 MIL-M-38510/1F 6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in MIL-PRF-38535, MIL-HDBK-1331, and as follows: GND ............................................ VIN ............................................... VI C .............................................. IIN ................................................ Ground zero voltage potential Voltage level at an input terminal Input clamp voltage Current flowing into an input terminal 6.6 Logistic support. Lead materials and finishes (see 3.3) are interchangeable. Unless otherwise specified, microcircuits acquired for Government logistic support will be acquired to device class B (see 1.2.2), lead material and finish A (see 3.3). Longer length leads and lead forming should not affect the part number. 6.7 Substitutability. The cross-reference information below is presented for the convenience of users. Microcircuits covered by this specification will functionally replace the listed generic-industry type. Generic-industry microcircuit types may not have equivalent operational performance characteristics across military temperature ranges or reliability factors equivalent to MIL-M-35810 device types and may have slight physical variations in relation to case size. The presence of this information should not be deemed as permitting substitution of generic-industry types for MIL-M-38510 types or as a waiver of any of the provisions of MIL-PRF-38535. Military device type Generic-industry type 01 02 03 04 05 06 07 08 09 5430 5420 5410 5400 5404 5412 5401 5405 5403 6.8 Changes from previous issue. Marginal notations are not used in this revision to identify changes with respect to the previous issue due to the extensiveness of the changes. Custodians: Army - CR Navy - EC Air Force - 11 DLA - CC Preparing activity: DLA - CC (Project 5962-2072) Review activities: Army - MI, SM Navy - AS, CG, MC, SH, TD Air Force - 03, 19, 99 NOTE: The activities listed above were interested in this document as of the date of this document. Since organizations and responsibilities can change, you should verify the currency of the information above using the ASSIST Online database at http://assist.daps.dla.mil. 29