SPICE Device Model SUD40N04-10A
Vishay Siliconix
www.vishay.com Document Number: 71751
219-Oct-01
SPECIFICATIONS (TJ = 25°C UNLESS OTHERWISE NOTED)
Parameter Symbol Test Conditions Simulated
Data
Measured
Data Unit
Static
Gate Threshold Voltage VGS(th) VDS = VGS, ID = 250µA2.1 V
VDS = 5 V, VGS = 10 V 568
VGS = 10 V, ID = 40A 0.0072 0.0075
VGS = 10 V, ID = 40 A, TJ = 125°C 0.011 0.012
On-State Drain CurrentaID(on)
VGS = 10 V, ID = 40 A, TJ = 175°C 0.013 0.015
A
VGS = 4.5 V, ID = 10 A 0.011 0.011
VGS = 4.5 V, ID = 10 A, TJ = 125°C 0.016 0.018Drain-Source On-State ResistancearDS(on)
VGS = 4.5 V, ID = 10 A, TJ = 175°C 0.018 0.022
Ω
Forward Transconductanceagfs VDS = 15 V, ID = 40 A 55 40 S
Forward Voltage a VSD IS = 40 A, VGS = 0 V 0.91 1 V
Dynamic b
Input Capacitance Ciss 1771 1700
Output Capacitance Coss 382 370
Reverse Transfer Capacitance Crss
VGS = 0 V, VDS = 25 V, f = 1 MHz
139 145
pF
Total Gate ChargecQg32 35
Gate-Source ChargecQgs 66
Gate-Drain ChargecQgd
VDS = 20 V, VGS = 10 V, ID = 40A
88
nC
Turn-On Delay Time c td(on) 10 14
Rise Time c tr14 7.5
Turn-Off Delay Time c td(off) 19 30
Fall Time c tf
VDD = 20 V, RL = 0.50 Ω
ID ≅ 40 A, VGEN = 10 V, RG = 2. Ω
25 14
Reverse Recovery Time trr IF = 40 A, di/dt = 100 A/µs21 30
ns
Notes
a. Pulse test; pulse width ≤ 300 µs, duty cycle ≤ 2%
b. Guaranteed by design, not subject to production testing
c. Independent of operating temperature.