TLC3704, TLC3704M
QUAD MICROPOWER LinCMOSVOLTAGE COMPARATORS
SLCS117C − NOVEMBER 1986 − REVISED NOVEMBER 2009
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
DPush-Pull CMOS Output Drives Capacitive
Loads Without Pullup Resistor,
IO = ± 8 mA
DVery Low Power . . . 200 µW Typ at 5 V
DFast Response Time ...t
PLH = 2.7 µs Typ
With 5-mV Overdrive
DSingle Supply Operation...3 V to 16 V
TLC3704M ...4 V to 16 V
DOn-Chip ESD Protection
description
The TLC3704 consists of four independent
micropower voltage comparators designed to
operate from a single supply and be compatible
with modern HCMOS logic systems. They are
functionally similar to the LM339 but use 1/20th
the power for similar response times. The
push-pull CMOS output stage drives capacitive
loads directly without a power-consuming pullup
resistor to achieve the stated response time.
Eliminating the pullup resistor not only reduces
power dissipation, but also saves board space
and component cost. The output stage is also fully
compatible with TTL requirements.
Texas Instruments LinCMOS process offers
superior analog performance to standard CMOS
processes. Along with the standard CMOS
advantages of low power without sacrificing
speed, high input impedance, and low bias
currents, the LinCMOS process offers extremely
stable input offset voltages with large differential
input voltages. This characteristic makes it
possible to build reliable CMOS comparators.
The TLC3704C is characterized for operation
over the commercial temperature range of 0°C to
70°C. The TLC3704I is characterized for
operation over the extended industrial tempera-
ture range of − 40°C to 85°C. The TLC3704M is
characterized for operation over the full military
temperature range of − 55°C to 125°C. The
TLC3704Q is characterized for operation from −
40°C to 125°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
LinCMOS is a trademark of Texas Instruments Incorporated.
Copyright 2009, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
3 2 1 20 19
910111213
4
5
6
7
8
18
17
16
15
14
GND
NC
4IN+
NC
4IN−
VDD
NC
2IN−
NC
2IN+
FK PACKAGE
(TOP VIEW)
2OUT
1OUT
NC
3IN−
3IN+
3OUT
4OUT
1IN+
NC
1IN−
D, J, OR N PACKAGE
(TOP VIEW)
NC − No internal connection
OUT
symbol (each comparator)
IN +
IN −
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1OUT
2OUT
VDD
2IN−
2IN+
1IN−
1IN+
3OUT
4OUT
GND
4IN+
4IN−
3IN+
3IN−
1
2
3
4
5
6
7
14
13
12
11
10
9
8
PW PACKAGE
(TOP VIEW)
1OUT
2OUT
VDD
2IN−
2IN+
1IN−
1IN+
3OUT
4OUT
GND
4IN+
4IN−
3IN+
3IN−
TLC3704, TLC3704M
QUAD MICROPOWER LinCMOSVOLTAGE COMPARATORS
SLCS117C − NOVEMBER 1986 − REVISED NOVEMBER 2009
2POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
AVAILABLE OPTIONS
V max
PACKAGE
TAVIOmax
at 25°CSMALL OUTLINE
(D)
CERAMIC
(FK)
CERAMIC DIP
(J)
PLASTIC DIP
(N)
TSSOP
(PW)
0°C to 70°C5 mV TLC3704CD — — TLC3704CN TLC3704CPW
−40°C to 85°C5 mV TLC3704ID — — TLC3704IN TLC3704IPW
−55°C to 125°C5 mV TLC3704MD TLC3704MFK TLC3704MJ — —
−40°C to 125°C5 mV — — TLC3704QJ — —
The D and PW packages are available taped and reeled. Add R suffix to the device type (e.g., TLC3704CDR).
functional block diagram (each comparator)
VDD
GND
OUT
Differential
Input
Circuits
IN+
IN−
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)†
Supply voltage range, VDD (see Note 1) −0.3 V to 18 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Differential input voltage, VID (see Note 2) ±18 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage range, VI −0.3 to VDD
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output voltage range, VO −0.3 to VDD
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input current, II ±5 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output current, IO (each output) ±20 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Total supply current into VDD 40 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Total current out of GND 60 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous total power dissipation See Dissipation Rating Table. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, TA: TLC3704C 0 to 70°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
TLC3704I −40°C to 85°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
TLC3704M −55°C to 125°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
TLC3704Q −40°C to 125°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range −65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Case temperature for 60 seconds: FK package 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds: D or N package 260°C. . . . . . . . . . . . . . . .
Lead temperature 1,6 mm (1/16 inch) from case for 60 seconds: J package 300°C. . . . . . . . . . . . . . . . . . . . .
†Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. All voltage values, except differential voltages, are with respect to network ground.
2. Differential voltages are at IN+ with respect to IN−.
TLC3704, TLC3704M
QUAD MICROPOWER LinCMOSVOLTAGE COMPARATORS
SLCS117C − NOVEMBER 1986 − REVISED NOVEMBER 2009
3
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
DISSIPATION RATING TABLE
PACKAGE TA ≤ 25°C
POWER RATING
DERATING FACTOR
ABOVE TA = 25°C
TA = 70°C
POWER RATING
TA = 85°C
POWER RATING
TA = 125°C
POWER RATING
D
FK
J
N
PW
950 mW
1375 mW
1375 mW
1150 mW
675 mW
7.6 mW/°C
11.0 mW/°C
11.0 mW/°C
9.2 mW/°C
5.4 mW/°C
608 mW
880 mW
880 mW
736 mW
432 mW
494 mW
715 mW
715 mW
598 mW
351 mW
N/A
275 mW
275 mW
N/A
N/A
recommended operating conditions
TLC3704C
UNIT
MIN NOM MAX UNIT
Supply voltage, VDD 3 5 16 V
Common-mode input voltage, VIC − 0.2 VDD − 1.5 V
High-level output current, IOH − 20 mA
Low-level output current, IOL 20 mA
Operating free-air temperature, TA0 70 °C
electrical characteristics at specified operating free-air temperature, VDD = 5 V
(unless otherwise noted)
PARAMETER
TEST CONDITIONS†
T
TLC3704C
UNIT
PARAMETER TEST CONDITIONS†TAMIN TYP MAX UNIT
V
Input offset voltage
VDD = 5 V to 10 V, 25°C 1.2 5
mV
VIO Input offset voltage VIC = VICRmin, See Note 3 0°C to 70°C 6.5 mV
I
Input offset current
V25V
25°C 1 pA
IIO Input offset current VIC = 2.5 V 70°C 0.3 nA
I
Input bias current
V25V
25°C 5 pA
IIB Input bias current VIC = 2.5 V 70°C 0.6 nA
V
Common mode input voltage range
25°C0 to
VDD − 1
V
VICR Common-mode input voltage range
0°C to 70°C0 to
VDD − 1.5
V
25°C 84
CMRR Common-mode rejection ratio VIC = VICRmin 70°C 84 dB
CMRR
Common mode
rejection
ratio
VIC
VICRmin
0°C 84
dB
25°C 85
kSVR Supply-voltage rejection ratio VDD = 5 V to 10 V 70°C 85 dB
kSVR
Supply voltage
rejection
ratio
VDD
5
V
to
10
V
0°C 85
dB
V
High level output voltage
V1V
I4mA
25°C 4.5 4.7
V
VOH High-level output voltage VID = 1 V, IOH = − 4 mA 70°C4.3 V
V
Low level output voltage
V1V
I4mA
25°C 210 300
mV
VOL Low-level output voltage VID = −1 V, IOH = 4 mA 70°C375 mV
I
Supply current (all four comparators)
Outputs low
No load
25°C 35 80
µA
IDD Supply current (all four comparators) Outputs low, No load 0°C to 70°C 100 µA
†All characteristics are measured with zero common-mode voltage unless otherwise noted.
NOTE 3: The offset voltage limits given are the maximum values required to drive the output up to 4.5 V or down to 0.3 V.
TLC3704, TLC3704M
QUAD MICROPOWER LinCMOSVOLTAGE COMPARATORS
SLCS117C − NOVEMBER 1986 − REVISED NOVEMBER 2009
4POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
recommended operating conditions
TLC3704I
UNIT
MIN NOM MAX UNIT
Supply voltage, VDD 3 5 16 V
Common-mode input voltage, VIC − 0.2 VDD − 1.5 V
High-level output current, IOH − 20 mA
Low-level output current, IOL 20 mA
Operating free-air temperature, TA− 40 85 °C
electrical characteristics at specified operating free-air temperature, VDD = 5 V, VIC = 0 (unless
otherwise noted)
TEST CONDITIONS
T
TLC3704I
UNIT
PARAMETER TEST CONDITIONS TAMIN TYP MAX UNIT
V
Input offset voltage
VDD = 5 V to 10 V, 25°C 1.2 5
mV
VIO Input offset voltage VIC = VICRmin, See Note 3 −40°C to 85°C 7 mV
I
Input offset current
V25V
25°C 1 pA
IIO Input offset current VIC = 2.5 V 85°C 1 nA
I
Input bias current
V25V
25°C 5 pA
IIB Input bias current VIC = 2.5 V 85°C 2 nA
V
Common mode input voltage range
25°C0 to
VDD − 1
V
VICR Common-mode input voltage range
−40°C to 85°C0 to
VDD − 1.5
V
25°C 84
CMRR Common-mode rejection ratio VIC = VICRmin 85°C 84 dB
CMRR
Common mode
rejection
ratio
VIC
VICRmin
−40°C 83
dB
25°C 85
kSVR Supply-voltage rejection ratio VDD = 5 V to 10 V 85°C 85 dB
kSVR
Supply voltage
rejection
ratio
VDD
5
V
to
10
V
−40°C 83
dB
V
High level output voltage
V1V
I4mA
25°C 4.5 4.7
V
VOH High-level output voltage VID = 1 V, IOH = − 4 mA 85°C4.3 V
V
Low level output voltage
V1V
I4mA
25°C 210 300
mV
VOL Low-level output voltage VID = −1 V, IOH = 4 mA 85°C400 mV
I
Supply current (all four comparators)
Outputs low
No load
25°C 35 80
µA
IDD Supply current (all four comparators) Outputs low, No load −40°C to 85°C 125 µA
NOTE 3: The offset voltage limits given are the maximum values required to drive the output up to 4.5 V or down to 0.3 V.
TLC3704, TLC3704M
QUAD MICROPOWER LinCMOSVOLTAGE COMPARATORS
SLCS117C − NOVEMBER 1986 − REVISED NOVEMBER 2009
5
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
recommended operating conditions
TLC3704M
UNIT
MIN NOM MAX UNIT
Supply voltage, VDD 4 5 16 V
Common-mode input voltage, VIC 0 VDD − 1.5 V
High-level output current, IOH − 20 mA
Low-level output current, IOL 20 mA
Operating free-air temperature, TA− 55 125 °C
electrical characteristics at specified operating free-air temperature, VDD = 5 V, VIC = 0 (unless
otherwise noted)
TEST CONDITIONS
T
TLC3704M
UNIT
PARAMETER TEST CONDITIONS TAMIN TYP MAX UNIT
V
Input offset voltage
VDD = 5 V to 10 V, 25°C 1.2 5
mV
VIO Input offset voltage VIC = VICRmin, See Note 3 −55°C to 125°C 10 mV
I
Input offset current
V25V
25°C 1 pA
IIO Input offset current VIC = 2.5 V 125°C 15 nA
I
Input bias current
V25V
25°C 5 pA
IIB Input bias current VIC = 2.5 V 125°C 30 nA
V
Common mode input voltage range
25°C0 to
VDD − 1
V
VICR Common-mode input voltage range
−55°C to 125°C0 to
VDD − 1.5
V
25°C 84
CMRR Common-mode rejection ratio VIC = VICRmin 125°C 83 dB
CMRR
Common mode
rejection
ratio
VIC
VICRmin
−55°C 82
dB
25°C 85
kSVR Supply-voltage rejection ratio VDD = 5 V to 10 V 125°C 85 dB
kSVR
Supply voltage
rejection
ratio
VDD
5
V
to
10
V
−55°C 82
dB
V
High level output voltage
V1V
I4mA
25°C 4.5 4.7
V
VOH High-level output voltage VID = 1 V, IOH = − 4 mA 125°C4.2 V
V
Low level output voltage
V1V
I4mA
25°C 210 300
mV
VOL Low-level output voltage VID = −1 V, IOH = 4 mA 125°C500 mV
I
Supply current (all four comparators)
Outputs low
No load
25°C 35 80
µA
IDD Supply current (all four comparators) Outputs low, No load −55°C to 125°C 175 µA
NOTE 3: The offset voltage limits given are the maximum values required to drive the output up to 4.5 V or down to 0.3 V.
TLC3704, TLC3704M
QUAD MICROPOWER LinCMOSVOLTAGE COMPARATORS
SLCS117C − NOVEMBER 1986 − REVISED NOVEMBER 2009
6POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
recommended operating conditions
TLC3704Q
UNIT
MIN NOM MAX UNIT
Supply voltage, VDD 3 5 16 V
Common-mode input voltage, VIC −0.2 VDD − 1.5 V
High-level output current, IOH − 20 mA
Low-level output current, IOL 20 mA
Operating free-air temperature, TA− 40 125 °C
electrical characteristics at specified operating free-air temperature, VDD = 5 V, VIC = 0 (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
T
TLC3704Q
UNIT
PARAMETER TEST CONDITIONS TAMIN TYP MAX UNIT
V
Input offset voltage
VDD = 5 V to 10 V, 25°C 1.2 5
mV
VIO Input offset voltage VIC = VICRmin, See Note 3 −40°C to 125°C 7 mV
I
Input offset current
V25V
25°C 1 pA
IIO Input offset current VIC = 2.5 V 125°C 15 nA
I
Input bias current
V25V
25°C 5 pA
IIB Input bias current VIC = 2.5 V 125°C 30 nA
V
Common-mode input volta
g
e25°C0 to VDD − 1
V
VICR
Common mode
input
voltage
range −40°C to 125°C0 to VDD − 1.5 V
25°C 84
CMRR Common-mode rejection ratio VIC = VICRmin 125°C 83 dB
CMRR
Common mode
rejection
ratio
VIC
VICRmin
−40°C 83
dB
25°C 85
kSVR Supply-voltage rejection ratio VDD = 5 V to 10 V 125°C 85 dB
kSVR
Supply voltage
rejection
ratio
VDD
5
V
to
10
V
−40°C 83
dB
V
High level output voltage
V1V
I4mA
25°C 4.5 4.7
V
VOH High-level output voltage VID = 1 V, IOH = − 4 mA 125°C4.2 V
V
Low level output voltage
V1V
I4mA
25°C 210 300
mV
VOL Low-level output voltage VID = −1 V, IOH = 4 mA 125°C500 mV
I
Suppl
y
current (all four
Outputs low
No load
25°C 35 80
µA
IDD
Supply
current
(all
four
comparators) Outputs low, No load −40°C to 125°C 175 µA
NOTE 3: The offset voltage limits given are the maximum values required to drive the output up to 4.5 V or down to 0.3 V.
TLC3704, TLC3704M
QUAD MICROPOWER LinCMOSVOLTAGE COMPARATORS
SLCS117C − NOVEMBER 1986 − REVISED NOVEMBER 2009
7
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
switching characteristics, VDD = 5 V, TA = 25°C
PARAMETER TEST CONDITIONS
TLC3704C, TLC3704I
TLC3704M, TLC3704Q UNIT
PARAMETER
TEST
CONDITIONS
MIN TYP MAX
UNIT
Overdrive = 2 mV 4.5
f10kH
Overdrive = 5 mV 2.7
t
Propagation delay time low to high level output†
f = 10 kHz,
CL=50pF
Overdrive = 10 mV 1.9
s
tPLH Propagation delay time, low-to-high-level output†
C
L =
50
p
F
Overdrive = 20 mV 1.4 µs
Overdrive = 40 mV 1.1
VI = 1.4-V step at IN + 1.1
Overdrive = 2 mV 4
f10kH
Overdrive = 5 mV 2.3
t
Propagation delay time high to low level output†
f = 10 kHz,
CL=50pF
Overdrive = 10 mV 1.5
s
tPHL Propagation delay time, high-to-low-level output†
C
L =
50
p
F
Overdrive = 20 mV 0.95 µs
Overdrive = 40 mV 0.65
VI = 1.4-V step at IN + 0.15
tfFall time f = 10 kHz,
CL = 50 pF Overdrive = 50 mV 50 ns
trRise time f = 10 kHz,
CL = 50 pF Overdrive = 50 mV 125 ns
†Simultaneous switching of inputs causes degradation in output response.
TLC3704, TLC3704M
QUAD MICROPOWER LinCMOSVOLTAGE COMPARATORS
SLCS117C − NOVEMBER 1986 − REVISED NOVEMBER 2009
8POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PRINCIPLES OF OPERATION
LinCMOS process
The LinCMOS process is a linear polysilicon-gate CMOS process. Primarily designed for single-supply
applications, LinCMOS products facilitate the design of a wide range of high-performance analog functions from
operational amplifiers to complex mixed-mode converters.
This short guide is intended to answer the most frequently asked questions related to the quality and reliability
of LinCMOS products. Direct further questions to the nearest TI field sales office.
electrostatic discharge
CMOS circuits are prone to gate oxide breakdown when exposed to high voltages even if the exposure is only
for very short periods of time. Electrostatic discharge (ESD) is one of the most common causes of damage to
CMOS devices. It can occur when a device is handled without proper consideration for environmental
electrostatic charges, e.g., during board assembly. If a circuit in which one amplifier from a dual op amp is being
used and the unused pins are left open, high voltages tends to develop. If there is no provision for ESD
protection, these voltages may eventually punch through the gate oxide and cause the device to fail. To prevent
voltage buildup, each pin is protected by internal circuitry.
Standard ESD-protection circuits safely shunt the ESD current by providing a mechanism whereby one or more
transistors break down at voltages higher than the normal operating voltages but lower than the breakdown
voltage of the input gate. This type of protection scheme is limited by leakage currents which flow through the
shunting transistors during normal operation after an ESD voltage has occurred. Although these currents are
small, on the order of tens of nanoamps, CMOS amplifiers are often specified to draw input currents as low as
tens of picoamps.
To overcome this limitation, TI design engineers developed the patented ESD-protection circuit shown in
Figure 1. This circuit can withstand several successive 2-kV ESD pulses, while reducing or eliminating leakage
currents that may be drawn through the input pins. A more detailed discussion of the operation of the TI
ESD-protection circuit is presented on the next page.
All input and output pins on LinCMOS and Advanced LinCMOS products have associated ESD-protection
circuitry that undergoes qualification testing to withstand 2000 V discharged from a 100-pF capacitor through
a 1500-Ω resistor (human body model) and 200 V from a 100-pF capacitor with no current-limiting resistor
(charged device model). These tests simulate both operator and machine handling of devices during normal
test and assembly operations.
To Protected Circuit
D3
R2
Q2
D2D1
Q1
Input
GND
R1
VDD
Figure 1. LinCMOS ESD-Protection Schematic
TLC3704, TLC3704M
QUAD MICROPOWER LinCMOSVOLTAGE COMPARATORS
SLCS117C − NOVEMBER 1986 − REVISED NOVEMBER 2009
9
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PRINCIPLES OF OPERATION
input protection circuit operation
Texas Instruments patented protection circuitry allows for both positive- and negative-going ESD transients.
These transients are characterized by extremely fast rise times and usually low energies, and can occur both
when the device has all pins open and when it is installed in a circuit.
positive ESD transients
Initial positive charged energy is shunted through Q1 to VSS. Q1 turns on when the voltage at the input rises
above the voltage on the VDD pin by a value equal to the VBE of Q1. The base current increases through R2
with input current as Q1 saturates. The base current through R2 forces the voltage at the drain and gate of Q2
to exceed its threshold level (VT ∼ 22 to 26 V) and turn Q2 on. The shunted input current through Q1 to VSS is
now shunted through the n-channel enhancement-type MOSFET Q2 to VSS. If the voltage on the input pin
continues to rise, the breakdown voltage of the zener diode D3 is exceeded, and all remaining energy is
dissipated in R1 and D3. The breakdown voltage of D3 is designed to be 24 to 27 V, which is well below the gate-
oxide voltage of the circuit to be protected.
negative ESD transients
The negative charged ESD transients are shunted directly through D1. Additional energy is dissipated in R1
and D2 as D2 becomes forward biased. The voltage seen by the protected circuit is − 0.3 V to −1 V (the forward
voltage of D1 and D2).
circuit-design considerations
LinCMOS products are being used in actual circuit environments that have input voltages that exceed the
recommended common-mode input voltage range and activate the input protection circuit. Even under normal
operation, these conditions occur during circuit power up or power down, and in many cases, when the device
is being used for a signal conditioning function. The input voltages can exceed VICR and not damage the device
only if the inputs are current limited. The recommended current limit shown on most product data sheets is
±5 mA. Figures 2 and 3 show typical characteristics for input voltage versus input current.
Normal operation and correct output state can be expected even when the input voltage exceeds the positive
supply voltage. Again, the input current should be externally limited even though internal positive current limiting
is achieved in the input protection circuit by the action of Q1. When Q1 is on, it saturates and limits the current
to approximately 5-mA collector current by design. When saturated, Q1 base current increases with input
current. This base current is forced into the VDD pin and into the device IDD or the VDD supply through R2
producing the current limiting effects shown in Figure 2. This internal limiting lasts only as long as the input
voltage is below the VT of Q2.
When the input voltage exceeds the negative supply voltage, normal operation is affected and output voltage
states may not be correct. Also, the isolation between channels of multiple devices (duals and quads) can be
severely affected. External current limiting must be used since this current is directly shunted by D1 and D2 and
no internal limiting is achieved. If normal output voltage states are required, an external input voltage clamp is
required (see Figure 4).
TLC3704, TLC3704M
QUAD MICROPOWER LinCMOSVOLTAGE COMPARATORS
SLCS117C − NOVEMBER 1986 − REVISED NOVEMBER 2009
10 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PRINCIPLES OF OPERATION
circuit-design considerations (continued)
Figure 2
− Input Current − mA
VDD VDD + 4 VDD + 8 VDD + 12
VI − Input Voltage − V
INPUT CURRENT
vs
INPUT VOLTAGE
TA = 25° C
8
7
6
5
4
3
2
1
0
II
Figure 3
VDD − 0.3
VI − Input Voltage − V
INPUT CURRENT
vs
INPUT VOLTAGE
TA = 25° C
VDD − 0.5 VDD − 0.7 VDD − 0.9
10
9
8
7
6
5
4
3
2
1
0
− Input Current − mAII
+
−
1/2
TLC3704
Vref
VI
VDD
See Note A
RI
NOTE A: If the correct input state is required when the negative input exceeds GND, a Schottky clamp is required.
Negative Voltage Input Current Limit :
RI+
*VI*VDD *(*0.3 V)
5mA
RI+VI*VDD *0.3 V
5mA
Positive Voltage Input Current Limit :
Figure 4. Typical Input Current-Limiting Configuration for a LinCMOS Comparator
TLC3704, TLC3704M
QUAD MICROPOWER LinCMOSVOLTAGE COMPARATORS
SLCS117C − NOVEMBER 1986 − REVISED NOVEMBER 2009
11
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
The TLC3704 contains a digital output stage which, if held in the linear region of the transfer curve, can cause
damage to the device. Conventional operational amplifier/comparator testing incorporates the use of a servo
loop which is designed to force the device output to a level within this linear region. Since the servo-loop method
of testing cannot be used, we offer the following alternatives for measuring parameters such as input offset
voltage, common-mode rejection, etc.
To verify that the input offset voltage falls within the limits specified, the limit value is applied to the input as shown
in Figure 5(a). With the noninverting input positive with respect to the inverting input, the output should be high.
With the input polarity reversed, the output should be low.
A similar test can be made to verify the input offset voltage at the common-mode extremes. The supply voltages
can be slewed as shown in Figure 5(b) for the VICR test, rather than changing the input voltages, to provide
greater accuracy.
+
−
5 V
Applied VIO
Limit VO
+
−
1 V
Applied VIO
Limit VO
− 4 V
(a) VIO WITH VIC = 0 V (b) VIO WITH VIC = 4 V
Figure 5. Method for Verifying That Input Offset Voltage Is Within Specified Limits
A close approximation of the input offset voltage can be obtained by using a binary search method to vary the
differential input voltage while monitoring the output state. When the applied input voltage differential is equal,
but opposite in polarity, to the input offset voltage, the output changes states.
Figure 6 illustrates a practical circuit for direct dc measurement of input offset voltage that does not bias the
comparator in the linear region. The circuit consists of a switching mode servo loop in which IC1a generates
a triangular waveform of approximately 20-mV amplitude. IC1b acts as a buffer, with C2 and R4 removing any
residual d.c. offset. The signal is then applied to the inverting input of the comparator under test, while the
noninverting input is driven by the output of the integrator formed by IC1c through the voltage divider formed
by R8 and R9. The loop reaches a stable operating point when the output of the comparator under test has a
duty cycle of exactly 50%, which can only occur when the incoming triangle wave is sliced symmetrically or when
the voltage at the noninverting input exactly equals the input offset voltage.
Voltage divider R8 and R9 provides an increase in the input offset voltage by a factor of 100 to make
measurement easier. The values of R5, R7, R8, and R9 can significantly influence the accuracy of the reading;
therefore, it is suggested that their tolerance level be one percent or lower.
Measuring the extremely low values of input current requires isolation from all other sources of leakage current
and compensation for the leakage of the test socket and board. With a good picoammeter, the socket and board
leakage can be measured with no device in the socket. Subsequently, this open socket leakage value can be
subtracted from the measurement obtained with a device in the socket to obtain the actual input current of the
device.
TLC3704, TLC3704M
QUAD MICROPOWER LinCMOSVOLTAGE COMPARATORS
SLCS117C − NOVEMBER 1986 − REVISED NOVEMBER 2009
12 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
−
+
DUT
VDD
+
−
−
+
−
+
C2
1 µF
R4
47 kΩ
R5
1.8 kΩ 1%
C3
0.68 µF
IC1c
1/4 TLC274CN
IC1a
1/4 TLC274CN
IC1b
1/4 TLC274CN
R6
1 MΩ
R7
1.8 kΩ 1%
R8
10 kΩ 1%
R1
240 kΩ
R2
10 kΩ
C1
0.1 µF
R3
100 Ω
C4
0.1 µF
Integrator
R9
100 Ω 1%
Buffer
Triangle
Generator
VIO
(X100)
Figure 6. Circuit for Input Offset Voltage Measurement
Response time is defined as the interval between the application of an input step function and the instant when
the output reaches 50% of its maximum value. Response time for the low-to-high-level output is measured from
the leading edge of the input pulse, while response time for the high-to-low-level output is measured from the
trailing edge of the input pulse. Response time measurement at low input signal levels can be greatly affected
by the input offset voltage. The offset voltage should be balanced by the adjustment at the inverting input as
shown in Figure 7, so that the circuit is just at the transition point. A low signal, for example 105-mV or 5-mV
overdrive, causes the output to change state.
TLC3704, TLC3704M
QUAD MICROPOWER LinCMOSVOLTAGE COMPARATORS
SLCS117C − NOVEMBER 1986 − REVISED NOVEMBER 2009
13
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
+
−
DUT
VDD
CL
(see Note A)
Pulse
Generator
10 Ω
10-Turn
Potentiometer
1 V
− 1 V
1 kΩ
50 Ω
1 µF
0.1 µF
TEST CIRCUIT
100 mVInput
Overdrive
90%
50%
10%
tr
tPLH
100 mVInput
Overdrive
90%
50%
10%
tf
tPHL
Low-to-High
Level Output
High-to-Low
Level Output
VOLTAGE WAVEFORMS
NOTE A: CL includes probe and jig capacitance.
Figure 7. Response, Rise, and Fall Times Circuit and Voltage Waveforms
TLC3704, TLC3704M
QUAD MICROPOWER LinCMOSVOLTAGE COMPARATORS
SLCS117C − NOVEMBER 1986 − REVISED NOVEMBER 2009
14 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TYPICAL CHARACTERISTICS
Table of Graphs
FIGURE
VIO Input offset voltage Distribution 8
IIB Input bias current vs Free-air temperature 9
CMRR Common-mode rejection ratio vs Free-air temperature 10
kSVR Supply-voltage rejection ratio vs Free-air temperature 11
V
High level output current
vs Free-air temperature 12
VOH High-level output current
vs
Free air
temperature
vs High-level output current
12
13
V
Low level output voltage
vs Low-level output current 14
VOL Low-level output voltage
vs
Low level
output
current
vs Free-air temperature
14
15
ttOutput transition time vs Load capacitance 16
Supply current response to an output voltage transition 17
Low-to-high-level output response for various input overdrives 18
High-to-low-level output response for various input overdrives 19
tPLH Low-to-high-level output response time vs Supply voltage 20
tPHL High-to-low-level output response time vs Supply voltage 21
vs Frequenc
y
22
IDD Supply current
vs
Frequency
vs Supply voltage
22
23
IDD
Supply
current
vs
Supply
voltage
vs Free-air temperature
23
24
Figure 8
Number of Units
VDD = 5 V
VIC = 2.5 V
TA = 25° C
−5 −4 −3 −2 −1 0 1 2 3 4 5
VIO − Input Offset Voltage − mV
DISTRIBUTION OF INPUT
OFFSET VOLTAGE†
200
180
160
140
120
100
80
60
40
20
0
698 Units Tested
From 4 Wafer Lots
ÉÉ
Ç
Ç
Ç
Ç
Ç
Ç
ÉÉ
ÉÉ
É
É
É
É
É
É
É
É
É
É
É
É
ÇÇ
ÇÇ
ÇÇ
ÇÇ
ÇÇ
ÇÇ
ÇÇ
ÇÇ
ÇÇ
ÇÇ
ÇÇ
ÇÇ
ÇÇ
ÇÇ
ÇÇ
ÇÇ
É
É
É
É
Ç
Ç
ÉÉ
É
Ç
Ç
Ç
Ç
ÉÉ
ÉÉ
ÉÉ
É
É
É
É
Ç
Figure 9
I
TA − Free-Air Temperature − °C
IB
− Input Bias Current − nA
25 50 75 100 125
10
1
0.1
0.01
0.001
INPUT BIAS CURRENT
vs
FREE-AIR TEMPERATURE†
VDD = 5 V
VIC = 2.5 V
†Data at high and low temperatures are applicable only within the rated operating free-air temperature ranges of the various devices.
TLC3704, TLC3704M
QUAD MICROPOWER LinCMOSVOLTAGE COMPARATORS
SLCS117C − NOVEMBER 1986 − REVISED NOVEMBER 2009
15
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TYPICAL CHARACTERISTICS†
Figure 10
CMRR − Common-Mode Rejection Ratio − dB
TA − Free-Air Temperature − °C
COMMON-MODE REJECTION RATIO
vs
FREE-AIR TEMPERATURE
−75 −50 −25 0 25 50 75 100 125
90
88
86
84
82
80
78
76
74
72
70
VDD = 5 V
Figure 11
−75 −50 −25 0 25 50 75 100 125
kSVR
− Supply Voltage Rejection Ratio − dB
TA − Free-Air Temperature − °C
SUPPLY VOLTAGE REJECTION RATIO
vs
FREE-AIR TEMPERATURE
VDD = 5 V to 10 V
90
88
86
84
82
80
78
76
74
72
70
Figure 12
5
TA − Free-Air Temperature − °C
HIGH-LEVEL OUTPUT VOLTAGE
vs
FREE-AIR TEMPERATURE
VOH − High-Level Outout Voltage − V
VDD = 5 V
IOH = − 4 mA
−75 −50 −25 0 25 50 75 100 125
4.9
4.8
4.7
4.6
4.5
4.55
4.65
4.75
4.85
4.95
Figure 13
VDD = 16 V
IOH − High-Level Output Current − mA
HIGH-LEVEL OUTPUT VOLTAGE
vs
HIGH-LEVEL OUTPUT CURRENT
VOH
TA = 25°C3 V
4 V
5 V
10 V
0 −2.5 −5 −7.5 −10 −12.5 −15 −17.5 −20
− High-Input Level Output Voltage −V
VDD
−0.25
−0.5
−0.75
−1
−1.25
−1.5
−1.75
−2
†Data at high and low temperatures are applicable only within the rated operating free-air temperature ranges of the various devices.
TLC3704, TLC3704M
QUAD MICROPOWER LinCMOSVOLTAGE COMPARATORS
SLCS117C − NOVEMBER 1986 − REVISED NOVEMBER 2009
16 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TYPICAL CHARACTERISTICS†
Figure 14
5 V
IOL − Low-Level Output Current − mA
0 2 4 6 8 1012141618 20
VOL − Low-Level Output Voltage − V
LOW-LEVEL OUTPUT VOLTAGE
vs
LOW-LEVEL OUTPUT CURRENT
3 V
10 V
1.5
1.25
1
0.75
0.5
0.25
0
VDD = 16 V
4 V
TA = 25°C
Figure 15
−75 −50 −25 0 25 50 75 100 125
TA − Free-Air Temperature − °C
LOW-LEVEL OUTPUT VOLTAGE
vs
FREE-AIR TEMPERATURE
VOL − Low-Level Output Voltage − mV
400
350
300
250
200
150
100
50
0
VDD = 5 V
IOL = 4 mA
Figure 16
0 200 400 600 800 1000
CL − Load Capacitance − pF
tt − Transition Time − ns
OUTPUT TRANSITION TIME
vs
LOAD CAPACITANCE
250
225
200
175
150
125
100
75
50
25
0
VDD = 5 V
TA = 25°C
Rise Time
Fall Time
Figure 17
IDD − Supply
SUPPLY CURRENT RESPONSE
TO AN OUTPUT VOLTAGE TRANSITION
Current − mA
t − Time
Output
Voltage − V
10
5
0
5
0
VDD = 5 V
CL = 50 pF
f = 10 kHz
†Data at high and low temperatures are applicable only within the rated operating free-air temperature ranges of the various devices.
TLC3704, TLC3704M
QUAD MICROPOWER LinCMOSVOLTAGE COMPARATORS
SLCS117C − NOVEMBER 1986 − REVISED NOVEMBER 2009
17
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TYPICAL CHARACTERISTICS
Figure 18
012345
40 mV
20 mV
10 mV
5 mV
2 mV
VO − Output
Voltage − V
Input
Voltage − mV
Differential
LOW-TO-HIGH-LEVEL OUTPUT RESPONSE
FOR VARIOUS INPUT OVERDRIVES
tPLH − Low-to-High-Level Output
Response Time − µs
5
0
100
0VDD = 5 V
TA = 25° C
CL = 50 pF
Figure 19
40 mV
20 mV
10 mV
5 mV
2 mV
HIGH-TO-LOW-LEVEL OUTPUT RESPONSE
FOR VARIOUS INPUT OVERDRIVES
tPHL − High-to-Low-Level Output
Response Time − µs
VO − Output
Voltage − V
Input
Voltage − mV
Differential
5
0
100
0
01 2 3 4 5
VDD = 5 V
TA = 25° C
CL = 50 pF
Figure 20
LOW-TO-HIGH-LEVEL
OUTPUT RESPONSE TIME
vs
SUPPLY VOLTAGE
6
5
4
3
2
1
00 2 4 6 810121416
VDD − Supply Voltage − V
tPLH − Low-to-High-Level
Output Response − µs
Overdrive = 2 mV
CL = 50 pF
TA = 25°C
5 mV
10 mV
20 mV
40 mV
Figure 21
HIGH-TO-LOW-LEVEL
OUTPUT RESPONSE TIME
vs
SUPPLY VOLTAGE
6
5
4
3
2
1
00 2 4 6 8 10121416
VDD − Supply Voltage − V
tPHL − High-to-Low-Level
Output Response − µs
CL = 50 pF
TA = 25°C
5 mV
10 mV
20 mV
40 mV
Overdrive = 2 mV
TLC3704, TLC3704M
QUAD MICROPOWER LinCMOSVOLTAGE COMPARATORS
SLCS117C − NOVEMBER 1986 − REVISED NOVEMBER 2009
18 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TYPICAL CHARACTERISTICS†
Figure 22
AVERAGE SUPPLY CURRENT
(PER COMPARATOR)
vs
FREQUENCY
10000
1000
100
10
V − Average Supply Current − µ
DD A
0.01 0.1 1 10 100
f − Frequency − kHz
TA = 25°C
CL = 50 pF
VDD = 16 V
10 V
5 V
4 V
3 V
Figure 23
SUPPLY CURRENT
vs
SUPPLY VOLTAGE
VDD − Supply Voltage − V
80
70
60
50
40
30
20
10
00246 810121416
TA = 25°C
TA = 125°C
V − Supply Current − µ
DD A
TA = − 55°C
TA = 85°C
TA = − 40°C
Outputs Low
No Loads
SUPPLY CURRENT
vs
FREE-AIR TEMPERATURE
30
25
20
15
10
5
0
−75 −50 −25 0 25 50 75 100 125
TA − Free-Air Temperature − °C
IDD − Supply Current −µA
VDD = 5 V
No Load
Outputs Low
Outputs High
Figure 24
†Data at high and low temperatures are applicable only within the rated operating free-air temperature ranges of the various devices.
TLC3704, TLC3704M
QUAD MICROPOWER LinCMOSVOLTAGE COMPARATORS
SLCS117C − NOVEMBER 1986 − REVISED NOVEMBER 2009
19
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
APPLICATION INFORMATION
The inputs should always remain within the supply rails in order to avoid forward biasing the diodes in the electrostatic
discharge (ESD) protection structure. If either input exceeds this range, the device is not damaged as long as the
input is limited to less than 5 mA. To maintain the expected output state, the inputs must remain within the
common-mode range. For example, at 25°C with VDD = 5 V, both inputs must remain between − 0.2 V and 4 V to
ensure proper device operation. To ensure reliable operation, the supply should be decoupled with a capacitor
(0.1 µF) that is positioned as close to the device as possible.
Output and supply current limitations should be watched carefully since the TLC3704 does not provide current
protection. For example, each output can source or sink a maximum of 20 mA; however, the total current to ground
can only be an absolute maximum of 60 mA. This prohibits sinking 20 mA from each of the four outputs simultaneously
since the total current to ground would be 80 mA.
The TLC3704 has internal ESD-protection circuits that prevents functional failures at voltages up to 2000 V as tested
under MIL-STD-883C, Method 3015.2; however, care should be exercised in handling these devices as exposure
to ESD may result in the degradation of the device parametric performance.
Table of Applications
FIGURE
Pulse-width-modulated motor speed controller 25
Enhanced supply supervisor 26
Two-phase nonoverlapping clock generator 27
Micropower switching regulator 28
TLC3704, TLC3704M
QUAD MICROPOWER LinCMOSVOLTAGE COMPARATORS
SLCS117C − NOVEMBER 1986 − REVISED NOVEMBER 2009
20 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
APPLICATION INFORMATION
C1
0.01 µF
(see Note B)
5 V
1/2 TLC3704
Motor Speed Control
Potentiometer
+
−
+
−
10 kΩ
100 kΩ
10 kΩ
10 kΩ
See
Note A
1/2 TLC3704
10 kΩ
5 V
DIR
EN
SN75603
Half-H Driver
12 V
Motor
DIR
EN
12 V
Direction
Control S1
SPDT
5 V
5 V
SN75604
Half-H Driver
NOTES: A. The recommended minimum capacitance is 10 µF to eliminate common ground switching noise.
B. Adjust C1 for change in oscillator frequency
Figure 25. Pulse-Width-Modulated Motor Speed Controller
TLC3704, TLC3704M
QUAD MICROPOWER LinCMOSVOLTAGE COMPARATORS
SLCS117C − NOVEMBER 1986 − REVISED NOVEMBER 2009
21
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
APPLICATION INFORMATION
1/2 TLC3704
To µP Interrupt
Early Power Fail
+
−
+
−
1 kΩ
3.3 kΩ
CT
(see Note B)
1/2 TLC3704 10 kΩ
5 V
5 V
12-V
Sense
R2
R1
V(UNREG)
(see Note A)
1 µF
12 V
RESIN
REF CTGND
RESET
SENSEVCC
To µP
Reset
Monitors 5 VDC Rail
Monitors 12 VDC Rail
Early Power Fail Warning
TL7705A
2.5 V
NOTES: A. V(UNREG) +2.5 (R1 +R2)
R2
B. The value of CT determines the time delay of reset.
Figure 26. Enhanced Supply Supervisor
TLC3704, TLC3704M
QUAD MICROPOWER LinCMOSVOLTAGE COMPARATORS
SLCS117C − NOVEMBER 1986 − REVISED NOVEMBER 2009
22 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
APPLICATION INFORMATION
−
+
22 kΩC1
0.01 µF
(see Note A)
1/2 TLC3704
R1
100 kΩ
(see Note B)
12 V
100 kΩ
1/2 TLC3704
OUT2
−
+
−
+
1/2 TLC3704
100 kΩ100 kΩ
12 V
OUT1
12 V
R2
5 kΩ
(see Note C)
R3
100 kΩ
(see Note B)
OUT2
OUT1
12 V
NOTES: A. Adjust C1 for a change in oscillator frequency where:
1/f = 1.85(100 kΩ)C1
B. Adjust R1 and R3 to change duty cycle
C. Adjust R2 to change deadtime
Figure 27. Two-Phase Nonoverlapping Clock Generator
TLC3704, TLC3704M
QUAD MICROPOWER LinCMOSVOLTAGE COMPARATORS
SLCS117C − NOVEMBER 1986 − REVISED NOVEMBER 2009
23
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
APPLICATION INFORMATION
+
−
100 kΩC1
180 µF
(see Note A)
1/2 TLC3704
100 kΩ
R2
100 kΩ
100 kΩ
100 kΩ
VI
VI
−
+
1/2 TLC3704
VI
+
−
TLC271
(see Note B)
270 kΩ
VI
100 kΩ
C2
100 pF
100 kΩ
R = 6 Ω
L = 1 mH
(see Note D)
RL
470 µF
VO
R1
VI+6 V to 16 V
IL+0.01 mA to 0.25 mA
VO+2.5 (R1 )R2)
R2
LM385
2.5 V
47 µF
Tantalum
IN5818
VI
GS
SK9504
(see Note C)
D
+
NOTES: A. Adjust C1 for a change in oscillator frequency
B. TLC271 − Tie pin 8 to pin 7 for low bias operation
C. SK9504 − VDS = 40 V
IDS = 1 Awill
D. To achieve microampere current drive, the inductance of the circuit must be increased.
Figure 28. Micropower Switching Regulator
PACKAGE OPTION ADDENDUM
www.ti.com 25-Sep-2013
Addendum-Page 1
PACKAGING INFORMATION
Orderable Device Status
(1)
Package Type Package
Drawing Pins Package
Qty Eco Plan
(2)
Lead/Ball Finish MSL Peak Temp
(3)
Op Temp (°C) Device Marking
(4/5)
Samples
5962-9096901M2A ACTIVE LCCC FK 20 1 TBD POST-PLATE N / A for Pkg Type -55 to 125 5962-
9096901M2A
TLC3704
MFKB
5962-9096901MCA ACTIVE CDIP J 14 1 TBD A42 N / A for Pkg Type -55 to 125 5962-9096901MC
A
TLC3704MJB
TLC3704CD ACTIVE SOIC D 14 50 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM 0 to 70 TLC3704C
TLC3704CDG4 ACTIVE SOIC D 14 50 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM 0 to 70 TLC3704C
TLC3704CDR ACTIVE SOIC D 14 2500 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM 0 to 70 TLC3704C
TLC3704CDRG4 ACTIVE SOIC D 14 2500 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM 0 to 70 TLC3704C
TLC3704CN ACTIVE PDIP N 14 25 Pb-Free
(RoHS) CU NIPDAU N / A for Pkg Type 0 to 70 TLC3704CN
TLC3704CNE4 ACTIVE PDIP N 14 25 Pb-Free
(RoHS) CU NIPDAU N / A for Pkg Type 0 to 70 TLC3704CN
TLC3704CNSR ACTIVE SO NS 14 2000 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM 0 to 70 TLC3704
TLC3704CNSRG4 ACTIVE SO NS 14 2000 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM 0 to 70 TLC3704
TLC3704CPW ACTIVE TSSOP PW 14 90 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM 0 to 70 P3704
TLC3704CPWG4 ACTIVE TSSOP PW 14 90 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM 0 to 70 P3704
TLC3704CPWLE OBSOLETE TSSOP PW 14 TBD Call TI Call TI 0 to 70
TLC3704CPWR ACTIVE TSSOP PW 14 2000 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM 0 to 70 P3704
TLC3704CPWRG4 ACTIVE TSSOP PW 14 2000 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM 0 to 70 P3704
TLC3704ID ACTIVE SOIC D 14 50 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -40 to 85 TLC3704I
PACKAGE OPTION ADDENDUM
www.ti.com 25-Sep-2013
Addendum-Page 2
Orderable Device Status
(1)
Package Type Package
Drawing Pins Package
Qty Eco Plan
(2)
Lead/Ball Finish MSL Peak Temp
(3)
Op Temp (°C) Device Marking
(4/5)
Samples
TLC3704IDG4 ACTIVE SOIC D 14 50 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -40 to 85 TLC3704I
TLC3704IDR ACTIVE SOIC D 14 2500 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -40 to 85 TLC3704I
TLC3704IDRG4 ACTIVE SOIC D 14 2500 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -40 to 85 TLC3704I
TLC3704IN ACTIVE PDIP N 14 25 Pb-Free
(RoHS) CU NIPDAU N / A for Pkg Type -40 to 85 TLC3704IN
TLC3704INE4 ACTIVE PDIP N 14 25 Pb-Free
(RoHS) CU NIPDAU N / A for Pkg Type -40 to 85 TLC3704IN
TLC3704IPW ACTIVE TSSOP PW 14 90 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -40 to 85 P3704I
TLC3704IPWG4 ACTIVE TSSOP PW 14 90 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -40 to 85 P3704I
TLC3704IPWR ACTIVE TSSOP PW 14 2000 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -40 to 85 P3704I
TLC3704IPWRG4 ACTIVE TSSOP PW 14 2000 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -40 to 85 P3704I
TLC3704MD ACTIVE SOIC D 14 50 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -55 to 125 TLC3704MD
TLC3704MDG4 ACTIVE SOIC D 14 50 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -55 to 125 PJ3704M
TLC3704MDR ACTIVE SOIC D 14 2500 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -55 to 125 TLC3704MD
TLC3704MDRG4 ACTIVE SOIC D 14 2500 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -55 to 125 PJ3704M
TLC3704MFKB ACTIVE LCCC FK 20 1 TBD POST-PLATE N / A for Pkg Type -55 to 125 5962-
9096901M2A
TLC3704
MFKB
TLC3704MJ ACTIVE CDIP J 14 1 TBD A42 N / A for Pkg Type -55 to 125 TLC3704MJ
TLC3704MJB ACTIVE CDIP J 14 1 TBD A42 N / A for Pkg Type -55 to 125 5962-9096901MC
A
TLC3704MJB
(1) The marketing status values are defined as follows:
PACKAGE OPTION ADDENDUM
www.ti.com 25-Sep-2013
Addendum-Page 3
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
OTHER QUALIFIED VERSIONS OF TLC3704, TLC3704M :
•Catalog: TLC3704
•Automotive: TLC3704-Q1, TLC3704-Q1
•Military: TLC3704M
NOTE: Qualified Version Definitions:
PACKAGE OPTION ADDENDUM
www.ti.com 25-Sep-2013
Addendum-Page 4
•Catalog - TI's standard catalog product
•Automotive - Q100 devices qualified for high-reliability automotive applications targeting zero defects
•Military - QML certified for Military and Defense Applications
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device Package
Type Package
Drawing Pins SPQ Reel
Diameter
(mm)
Reel
Width
W1 (mm)
A0
(mm) B0
(mm) K0
(mm) P1
(mm) W
(mm) Pin1
Quadrant
TLC3704CDR SOIC D 14 2500 330.0 16.4 6.5 9.0 2.1 8.0 16.0 Q1
TLC3704CNSR SO NS 14 2000 330.0 16.4 8.2 10.5 2.5 12.0 16.0 Q1
TLC3704CPWR TSSOP PW 14 2000 330.0 12.4 6.9 5.6 1.6 8.0 12.0 Q1
TLC3704IDR SOIC D 14 2500 330.0 16.4 6.5 9.0 2.1 8.0 16.0 Q1
TLC3704IPWR TSSOP PW 14 2000 330.0 12.4 6.9 5.6 1.6 8.0 12.0 Q1
TLC3704MDR SOIC D 14 2500 330.0 16.4 6.5 9.0 2.1 8.0 16.0 Q1
TLC3704MDRG4 SOIC D 14 2500 330.0 16.4 6.5 9.0 2.1 8.0 16.0 Q1
PACKAGE MATERIALS INFORMATION
www.ti.com 14-Mar-2013
Pack Materials-Page 1
*All dimensions are nominal
Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
TLC3704CDR SOIC D 14 2500 367.0 367.0 38.0
TLC3704CNSR SO NS 14 2000 367.0 367.0 38.0
TLC3704CPWR TSSOP PW 14 2000 367.0 367.0 35.0
TLC3704IDR SOIC D 14 2500 367.0 367.0 38.0
TLC3704IPWR TSSOP PW 14 2000 367.0 367.0 35.0
TLC3704MDR SOIC D 14 2500 367.0 367.0 38.0
TLC3704MDRG4 SOIC D 14 2500 367.0 367.0 38.0
PACKAGE MATERIALS INFORMATION
www.ti.com 14-Mar-2013
Pack Materials-Page 2
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